Class information for:
Level 1: POROUS POLYSILICON//BALLISTIC EMISSION//SENSOR ACTUATOR SYST ISAS

Basic class information
ID Publications Average number
of references		 Avg. shr. active
ref. in WoS
29536 151 13.6 64%


Bar chart of Publication_year

Last years might be incomplete

Classes in level above (level 2)


ID, lev.
above		 Publications Label for level above
2523 3344 FIELD EMISSION//VACUUM MICROELECTRONICS//FIELD EMITTER ARRAY

Terms with highest relevance score


Rank Term Type of term Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ.
in class
1 POROUS POLYSILICON Author keyword 4 47% 5% 7
2 BALLISTIC EMISSION Author keyword 2 67% 1% 2
3 SENSOR ACTUATOR SYST ISAS Address 2 67% 1% 2
4 BALLISTIC ELECTRON Author keyword 1 31% 3% 4
5 TUNNELING CATHODE Author keyword 1 100% 1% 2
6 ACTIVE MATRIX DRIVE Author keyword 1 50% 1% 1
7 BALLISTIC HOT ELECTRON Author keyword 1 50% 1% 1
8 DIRECT WRITE SYSTEM Author keyword 1 50% 1% 1
9 ELECT RUMENTAT S Address 1 50% 1% 1
10 ELECTROCHEMICAL OXIDATION ECO Author keyword 1 50% 1% 1

Web of Science journal categories

Author Key Words


Rank Web of Science journal category Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ.
in class		 LCSH search Wikipedia search
1 POROUS POLYSILICON 4 47% 5% 7 Search POROUS+POLYSILICON Search POROUS+POLYSILICON
2 BALLISTIC EMISSION 2 67% 1% 2 Search BALLISTIC+EMISSION Search BALLISTIC+EMISSION
3 BALLISTIC ELECTRON 1 31% 3% 4 Search BALLISTIC+ELECTRON Search BALLISTIC+ELECTRON
4 TUNNELING CATHODE 1 100% 1% 2 Search TUNNELING+CATHODE Search TUNNELING+CATHODE
5 ACTIVE MATRIX DRIVE 1 50% 1% 1 Search ACTIVE+MATRIX+DRIVE Search ACTIVE+MATRIX+DRIVE
6 BALLISTIC HOT ELECTRON 1 50% 1% 1 Search BALLISTIC+HOT+ELECTRON Search BALLISTIC+HOT+ELECTRON
7 DIRECT WRITE SYSTEM 1 50% 1% 1 Search DIRECT+WRITE+SYSTEM Search DIRECT+WRITE+SYSTEM
8 ELECTROCHEMICAL OXIDATION ECO 1 50% 1% 1 Search ELECTROCHEMICAL+OXIDATION+ECO Search ELECTROCHEMICAL+OXIDATION+ECO
9 MASK LESS PARALLEL EXPOSURE 1 50% 1% 1 Search MASK+LESS+PARALLEL+EXPOSURE Search MASK+LESS+PARALLEL+EXPOSURE
10 NANOPARTICLE FILLERS 1 50% 1% 1 Search NANOPARTICLE+FILLERS Search NANOPARTICLE+FILLERS

Key Words Plus


Rank Web of Science journal category Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class
1 MIM CATHODES 12 86% 4% 6
2 POROUS SILICON DIODES 8 70% 5% 7
3 ELECTRON TUNNELING CATHODE 6 80% 3% 4
4 COLD ELECTRON EMISSION 2 67% 1% 2
5 TUNNELING CATHODE 2 50% 2% 3
6 COLD CATHODE 2 12% 8% 12
7 AMORPHOUS PHOTOCONDUCTOR TARGET 1 50% 1% 2
8 HARP TARGET 1 50% 1% 2
9 EMISSION CURRENT 1 30% 2% 3
10 SIXGE1 X 1 40% 1% 2

Journals

Reviews


Title Publ. year Cit. Active
references		 % act. ref.
to same field
Ballistic electron emission from quantum-sized nanosilicon diode and its applications 2011 13 33 55%
Functionalization of Artificial Freestanding Composite Nanomembranes 2010 6 42 2%

Address terms


Rank Address term Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ.
in class
1 SENSOR ACTUATOR SYST ISAS 2 67% 1.3% 2
2 ELECT RUMENTAT S 1 50% 0.7% 1
3 CHEM TECHNOL MET IHTM 0 33% 0.7% 1
4 DISPLAY NANODEVICES 0 33% 0.7% 1
5 ECON TECHNOL DEV AREA POSTDOCTORAL WORKING STN 0 33% 0.7% 1
6 MICROELECT TECHNOL SINGLE CRYSTALS CMTM 0 33% 0.7% 1
7 IN IDUAL NANOPARTICLE FUNCT CINF 0 17% 0.7% 1
8 SEE TEAM 0 17% 0.7% 1
9 ELECT TUBE 0 14% 0.7% 1
10 BROADCAST ENGN 0 13% 0.7% 1

Related classes at same level (level 1)


Rank Relatedness score Related classes
1 0.0000281737 AG CLUSTER FILM//METAL ISLANDS FILMS//ILLUMINATION SENSORS
2 0.0000218316 FIELD EMISSION//VACUUM MICROELECTRONICS//FIELD EMITTER ARRAY
3 0.0000172125 SOLID STATE CATHODOLUMINESCENCE//FIELD INDUCED ELECTROLUMINESCENCE//CATHODOLUMINESCENCE LIKE EMISSION
4 0.0000153786 AMORPHOUS SELENIUM//ADV IMAGING DEVICES//AMORPHOUS SELENIUM A SE
5 0.0000141660 SURFACE CONDUCTION ELECTRON EMITTER DISPLAY SED//SURFACE CONDUCTION ELECTRON EMISSION//SURFACE CONDUCTION ELECTRON EMITTER DISPLAY
6 0.0000089974 BALLISTIC ELECTRON EMISSION MICROSCOPY//BALLISTIC ELECTRON EMISSION MICROSCOPY BEEM//BEEM
7 0.0000085278 POROUS SILICON//POROUS SI//STAIN ETCHING
8 0.0000055652 FIELD EMISSION//MOL SCALE ENGN NANOSCALE TECHNOL GRP//ELECTRON FIELD EMISSION
9 0.0000055227 MICROCOLUMN//SCHOTTKY EMITTER//PROD DESIGN TECHNOL
10 0.0000048306 TITANIUM DEUTERIDE//INTERLAYER REACTION//CENT MAT ANAL