Class information for:
Level 1: PROBE CARD//POROUS SILICON MICROMACHINING//VERTICAL ACTIVE DEVICES

Basic class information
ID Publications Average number
of references		 Avg. shr. active
ref. in WoS
29145 157 14.8 48%


Bar chart of Publication_year

Last years might be incomplete

Classes in level above (level 2)


ID, lev.
above		 Publications Label for level above
1859 5530 NANOIMPRINT//NANOIMPRINT LITHOGRAPHY//UV NANOIMPRINT

Terms with highest relevance score


Rank Term Type of term Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class
1 PROBE CARD Author keyword 7 39% 8% 13
2 POROUS SILICON MICROMACHINING Author keyword 3 50% 3% 5
3 VERTICAL ACTIVE DEVICES Author keyword 3 100% 2% 3
4 WAFER LEVEL PROBING TEST Author keyword 3 100% 2% 3
5 WAFER PROBING TEST Author keyword 3 100% 2% 3
6 MEMS PROBE CARD Author keyword 3 45% 3% 5
7 VERTICAL PROBE Author keyword 2 67% 1% 2
8 VAPOR LIQUID SOLID VLS GROWTH Author keyword 2 33% 3% 4
9 EPOXY RING PROBE CARD Author keyword 1 100% 1% 2
10 MULTILAYER NEEDLE CARD Author keyword 1 100% 1% 2

Web of Science journal categories

Author Key Words


Rank Web of Science journal category Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class		 LCSH search Wikipedia search
1 PROBE CARD 7 39% 8% 13 Search PROBE+CARD Search PROBE+CARD
2 POROUS SILICON MICROMACHINING 3 50% 3% 5 Search POROUS+SILICON+MICROMACHINING Search POROUS+SILICON+MICROMACHINING
3 VERTICAL ACTIVE DEVICES 3 100% 2% 3 Search VERTICAL+ACTIVE+DEVICES Search VERTICAL+ACTIVE+DEVICES
4 WAFER LEVEL PROBING TEST 3 100% 2% 3 Search WAFER+LEVEL+PROBING+TEST Search WAFER+LEVEL+PROBING+TEST
5 WAFER PROBING TEST 3 100% 2% 3 Search WAFER+PROBING+TEST Search WAFER+PROBING+TEST
6 MEMS PROBE CARD 3 45% 3% 5 Search MEMS+PROBE+CARD Search MEMS+PROBE+CARD
7 VERTICAL PROBE 2 67% 1% 2 Search VERTICAL+PROBE Search VERTICAL+PROBE
8 VAPOR LIQUID SOLID VLS GROWTH 2 33% 3% 4 Search VAPOR+LIQUID+SOLID+VLS+GROWTH Search VAPOR+LIQUID+SOLID+VLS+GROWTH
9 EPOXY RING PROBE CARD 1 100% 1% 2 Search EPOXY+RING+PROBE+CARD Search EPOXY+RING+PROBE+CARD
10 MULTILAYER NEEDLE CARD 1 100% 1% 2 Search MULTILAYER+NEEDLE+CARD Search MULTILAYER+NEEDLE+CARD

Key Words Plus


Rank Web of Science journal category Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class
1 PROBE CARD 2 44% 3% 4
2 CARD 2 11% 11% 17
3 FINE PITCH 1 27% 3% 4
4 MICRO SPRINGS 1 50% 1% 1
5 PROBE CARDS 1 50% 1% 1
6 CANTILEVER PROBE 0 33% 1% 1
7 3 DIMENSIONAL SOCS 0 18% 1% 2
8 IN PACKAGE 0 20% 1% 1
9 SILICON TIP 0 20% 1% 1
10 LOW FORCE 0 13% 1% 1

Journals

Reviews

Address terms


Rank Address term Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ.
in class
1 KOREA BIO IT FOUNDRY SEOUL 1 50% 0.6% 1
2 NANOMECH TEAM 1 50% 0.6% 1
3 NEW BUSINESS GRP 1 50% 0.6% 1
4 THIN FILM MICROTECHNOL 1 50% 0.6% 1
5 THIN FILM MICROTECHNOLMINIST EDUC 1 50% 0.6% 1
6 TSG 0 33% 0.6% 1
7 UCBN ENSICAEN CNRS UMR 6508 0 33% 0.6% 1
8 LAMIPS 0 11% 1.3% 2
9 STRUCT TEAM 0 20% 0.6% 1
10 MECH ENGN CONTROL 0 17% 0.6% 1

Related classes at same level (level 1)


Rank Relatedness score Related classes
1 0.0000244711 LASER SCAN LITHOGRAPHY//ADV SCI TECHNOL IND//WORM INJECTION MOLDING
2 0.0000174505 FUNCT TERMINAL CIRCUITS GRP//ITO AU ITO//COMPLEMENTARY METAL OXIDE SEMICONDUCTOR CMOS DEVICES
3 0.0000106240 DIRECT EXECUTION//IBM CELL BROADBAND ENGINE//LONGLEY RICE MODEL
4 0.0000100410 STRIP BENDING TEST//MEMS PROD//HIGH CYCLE FATIGUE TEST
5 0.0000094663 RF MEMS//RF MICROELECTROMECHANICAL SYSTEMS MEMS//DIELECTRIC CHARGING
6 0.0000091714 NEURONANO//INTRACELLULAR PROTEIN DETECTION//NANONEEDLE
7 0.0000069584 HITACHI ADM//SOLAR CELL METALLIZATION//
8 0.0000068038 THROUGH SILICON VIA TSV//3 D INTEGRATION//KEEP OUT ZONE KOZ
9 0.0000066716 TIP CHARACTERIZATION//TIP CHARACTERIZER//SIDEWALL MEASUREMENT
10 0.0000064121 WIRE BONDING//ULTRASONIC WEDGE BONDING//MICROJOINING