Class information for:
Level 1: ELECT XRAY RUMENTS//DNA SEQUENCING INSTRUMENTS//FAST PEAK DETECTOR

Basic class information

ID Publications Average number
of references
Avg. shr. active
ref. in WoS
28379 169 10.3 31%



Bar chart of Publication_year

Last years might be incomplete

Classes in level above (level 2)



ID, lev.
above
Publications Label for level above
2802 2551 GAMMA RAY TRACKING//COMPTON CAMERA//COMPTON IMAGING

Terms with highest relevance score



Rank Term Type of term Relevance score
(tfidf)
Class's shr.
of term's tot.
occurrences
Shr. of publ.
in class containing
term
Num. of
publ.
in class
1 ELECT XRAY RUMENTS Address 1 100% 1% 2
2 DNA SEQUENCING INSTRUMENTS Author keyword 1 50% 1% 1
3 FAST PEAK DETECTOR Author keyword 1 50% 1% 1
4 GEIGER DISCHARGE Author keyword 1 50% 1% 1
5 JACK MADDOX Address 1 50% 1% 1
6 METROL RADIAC LONIZANTES Address 1 50% 1% 1
7 ROOM TEMPERATURE RADIATION DETECTOR Author keyword 1 50% 1% 1
8 INSB DETECTOR Author keyword 1 22% 1% 2
9 DEPLETION LAYER THICKNESS Author keyword 0 33% 1% 1
10 MIN INFORMAT ENGN Address 0 33% 1% 1

Web of Science journal categories

Author Key Words



Rank Web of Science journal category Relevance score
(tfidf)
Class's shr.
of term's tot.
occurrences
Shr. of publ.
in class containing
term
Num. of
publ.
in class
LCSH search Wikipedia search
1 DNA SEQUENCING INSTRUMENTS 1 50% 1% 1 Search DNA+SEQUENCING+INSTRUMENTS Search DNA+SEQUENCING+INSTRUMENTS
2 FAST PEAK DETECTOR 1 50% 1% 1 Search FAST+PEAK+DETECTOR Search FAST+PEAK+DETECTOR
3 GEIGER DISCHARGE 1 50% 1% 1 Search GEIGER+DISCHARGE Search GEIGER+DISCHARGE
4 ROOM TEMPERATURE RADIATION DETECTOR 1 50% 1% 1 Search ROOM+TEMPERATURE+RADIATION+DETECTOR Search ROOM+TEMPERATURE+RADIATION+DETECTOR
5 INSB DETECTOR 1 22% 1% 2 Search INSB+DETECTOR Search INSB+DETECTOR
6 DEPLETION LAYER THICKNESS 0 33% 1% 1 Search DEPLETION+LAYER+THICKNESS Search DEPLETION+LAYER+THICKNESS
7 PHOTOELECTRON STATISTICS 0 33% 1% 1 Search PHOTOELECTRON+STATISTICS Search PHOTOELECTRON+STATISTICS
8 OPTOELECTRONIC MEASUREMENT SYSTEM 0 25% 1% 1 Search OPTOELECTRONIC+MEASUREMENT+SYSTEM Search OPTOELECTRONIC+MEASUREMENT+SYSTEM
9 ALPHA PARTICLE MEASUREMENT 0 20% 1% 1 Search ALPHA+PARTICLE+MEASUREMENT Search ALPHA+PARTICLE+MEASUREMENT
10 HIGH COUNTING RATES 0 17% 1% 1 Search HIGH+COUNTING+RATES Search HIGH+COUNTING+RATES

Key Words Plus



Rank Web of Science journal category Relevance score
(tfidf)
Class's shr.
of term's tot.
occurrences
Shr. of publ.
in class containing
term
Num. of
publ.
in class
1 SCHOTTKY DETECTOR 0 12% 1% 2
2 ANTHRAX SMOKE DETECTOR 0 14% 1% 1
3 INSB DETECTOR 0 14% 1% 1
4 FAST COINCIDENCE 0 100% 1% 1
5 HE 3 GAS CONVERTER 0 100% 1% 1

Journals

Reviews



Title Publ. year Cit. Active
references
% act. ref.
to same field
PHOTOMULTIPLIER CHARACTERISTICS AND PRACTICE RELEVANT TO PHOTON-COUNTING 1985 36 24 38%

Address terms



Rank Address term Relevance score
(tfidf)
Class's shr.
of term's tot.
occurrences
Shr. of publ.
in class containing
term
Num. of
publ.
in class
1 ELECT XRAY RUMENTS 1 100% 1.2% 2
2 JACK MADDOX 1 50% 0.6% 1
3 METROL RADIAC LONIZANTES 1 50% 0.6% 1
4 MIN INFORMAT ENGN 0 33% 0.6% 1
5 SEODAEMUM KU 0 25% 0.6% 1
6 WM KECK FDN MAT CHEM 0 17% 0.6% 1
7 DEV ULTRASON RUMENTS GRP 0 100% 0.6% 1
8 MOS LST DEV GRP 0 100% 0.6% 1

Related classes at same level (level 1)



Rank Relatedness score Related classes
1 0.0000180167 OPTOELECT PACKAGING MAT//GAIN MONITORING//SUBSTRATE COMPLEXES
2 0.0000163865 DIGITAL SPECTROSCOPY//NUCLEAR COUNTING//CDZNTE SEMICONDUCTOR DETECTOR
3 0.0000102196 RADIORUTHENIUM//STABLE TRACERS//SEZ FIS MED
4 0.0000080299 COUNTING MEASUREMENTS//LIGHT STATISTICS//POLARIZED THERMAL LIGHT
5 0.0000073641 WEDGE AND STRIP ANODE//MICROCHANNEL PLATE//POSITION SENSITIVE ANODE
6 0.0000068588 MICROFOCUS X RAY RADIOGRAPHY//BEAM SUM//HARDENING CORRECTION MODEL
7 0.0000060536 GYROTROPY//ANTISYMMETRICAL//SUBMICRON FABRICATION TECHNIQUE
8 0.0000059164 HALF BRIGHTNESS DOSE//UNIDAD RADIAC IONIZANTES//ASOCIAC EUROTOM
9 0.0000056253 NON TANGENTIAL QUADRILATERAL//GEODETSKI FAK//DIGITAL CADASTRAL MAP
10 0.0000052929 CLEMSON ENVIRONM TECHNOL//NANOSECOND PULSED LIGHT SOURCE//FLUORESCENCE LIFETIME MEASUREMENT