Class information for:
Level 1: SYST LEVEL INTEGRAT GRP//DYNAMIC PARTIAL RECONFIGURATION DPR//DYNAMICALLY PROGRAMMABLE GATE ARRAY

Basic class information

ID Publications Average number
of references
Avg. shr. active
ref. in WoS
27561 186 21.7 26%



Bar chart of Publication_year

Last years might be incomplete

Classes in level above (level 2)



ID, lev.
above
Publications Label for level above
1040 9640 JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS//IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS//SINGLE EVENT UPSET SEU

Terms with highest relevance score



Rank Term Type of term Relevance score
(tfidf)
Class's shr.
of term's tot.
occurrences
Shr. of publ.
in class containing
term
Num. of
publ.
in class
1 SYST LEVEL INTEGRAT GRP Address 3 60% 2% 3
2 DYNAMIC PARTIAL RECONFIGURATION DPR Author keyword 2 50% 2% 3
3 DYNAMICALLY PROGRAMMABLE GATE ARRAY Author keyword 1 100% 1% 2
4 DYNAMICALLY RECONFIGURABLE ARCHITECTURE Author keyword 1 50% 1% 2
5 EMBEDDED SYST ON CHIP GRP Address 1 100% 1% 2
6 MULTI CONTEXT SWITCH Author keyword 1 100% 1% 2
7 MULTIPLE VALUED THRESHOLD LOGIC Author keyword 1 100% 1% 2
8 NON DESTRUCTIVE OPERATION Author keyword 1 100% 1% 2
9 INCREMENTAL ROUTING Author keyword 1 40% 1% 2
10 FPGA SOFTWARE CORE GRP Address 1 33% 1% 2

Web of Science journal categories

Author Key Words



Rank Web of Science journal category Relevance score
(tfidf)
Class's shr.
of term's tot.
occurrences
Shr. of publ.
in class containing
term
Num. of
publ.
in class
LCSH search Wikipedia search
1 DYNAMIC PARTIAL RECONFIGURATION DPR 2 50% 2% 3 Search DYNAMIC+PARTIAL+RECONFIGURATION+DPR Search DYNAMIC+PARTIAL+RECONFIGURATION+DPR
2 DYNAMICALLY PROGRAMMABLE GATE ARRAY 1 100% 1% 2 Search DYNAMICALLY+PROGRAMMABLE+GATE+ARRAY Search DYNAMICALLY+PROGRAMMABLE+GATE+ARRAY
3 DYNAMICALLY RECONFIGURABLE ARCHITECTURE 1 50% 1% 2 Search DYNAMICALLY+RECONFIGURABLE+ARCHITECTURE Search DYNAMICALLY+RECONFIGURABLE+ARCHITECTURE
4 MULTI CONTEXT SWITCH 1 100% 1% 2 Search MULTI+CONTEXT+SWITCH Search MULTI+CONTEXT+SWITCH
5 MULTIPLE VALUED THRESHOLD LOGIC 1 100% 1% 2 Search MULTIPLE+VALUED+THRESHOLD+LOGIC Search MULTIPLE+VALUED+THRESHOLD+LOGIC
6 NON DESTRUCTIVE OPERATION 1 100% 1% 2 Search NON+DESTRUCTIVE+OPERATION Search NON+DESTRUCTIVE+OPERATION
7 INCREMENTAL ROUTING 1 40% 1% 2 Search INCREMENTAL+ROUTING Search INCREMENTAL+ROUTING
8 NONVOLATILE STORAGE 1 33% 1% 2 Search NONVOLATILE+STORAGE Search NONVOLATILE+STORAGE
9 3 D FPGA 1 50% 1% 1 Search 3+D+FPGA Search 3+D+FPGA
10 APPLICATION DEPENDENT TESTING 1 50% 1% 1 Search APPLICATION+DEPENDENT+TESTING Search APPLICATION+DEPENDENT+TESTING

Key Words Plus



Rank Web of Science journal category Relevance score
(tfidf)
Class's shr.
of term's tot.
occurrences
Shr. of publ.
in class containing
term
Num. of
publ.
in class
1 LOGIC BLOCKS 4 50% 3% 6
2 FPGA LOGIC BLOCKS 3 57% 2% 4
3 INTERCONNECT FAULTS 1 50% 1% 2
4 BIST ARCHITECTURE 1 33% 2% 3
5 LUT BASED FPGAS 1 50% 1% 1
6 VIRTEX 5 FPGAS 1 50% 1% 1
7 LOGIC ARRAYS 0 33% 1% 1
8 TOLERANT PROCESSOR ARRAYS 0 33% 1% 1
9 VLSI ARRAYS 0 17% 1% 2
10 OXIDE DEGRADATION 0 25% 1% 1

Journals

Reviews

Address terms



Rank Address term Relevance score
(tfidf)
Class's shr.
of term's tot.
occurrences
Shr. of publ.
in class containing
term
Num. of
publ.
in class
1 SYST LEVEL INTEGRAT GRP 3 60% 1.6% 3
2 EMBEDDED SYST ON CHIP GRP 1 100% 1.1% 2
3 FPGA SOFTWARE CORE GRP 1 33% 1.1% 2
4 DESIGN AUTOMAT TEST 1 50% 0.5% 1
5 ELECT COMP SCI IMAGE 1 50% 0.5% 1
6 RELIABIL COMP 1 50% 0.5% 1
7 FAK ELEKTROTEHNIKO RACUNALNISTVO INFORMAT 0 33% 0.5% 1
8 FO T POST PROGRAMME 0 33% 0.5% 1
9 MED RUMENTAT ENGN 0 33% 0.5% 1
10 COMP SCI ENGN ITEC 0 25% 0.5% 1

Related classes at same level (level 1)



Rank Relatedness score Related classes
1 0.0000210097 UNIDIRECTIONAL ERRORS//SELF CHECKING CIRCUITS//BALANCED CODES
2 0.0000187877 RECONFIGURABLE COMPUTING//INSTRUCTION SET EXTENSION ISE//ACM TRANSACTIONS ON RECONFIGURABLE TECHNOLOGY AND SYSTEMS
3 0.0000158585 LOG SYST//EVOLVABLE HARDWARE//SELF REPLICATION
4 0.0000138924 COUNCILS OF GOVERNMENTS//LILLIAN WALD//SLUM CLEARANCE
5 0.0000127053 XRAY PHYS IMAGING//DISCRETE IMAGE PROCESSING//POSITIVITY PROBLEM
6 0.0000121065 FLOORPLANNING//PHYSICAL DESIGN//PLACEMENT
7 0.0000115660 NEUROMORPHIC NETWORKS//ELECTRONIC NANOTECHNOLOGY//CMOL
8 0.0000098757 BUILT IN REDUNDANCY ANALYSIS BIRA//CATASTROPHIC FAULT PATTERNS//CRITICAL AREA
9 0.0000098198 CREPING//CORE CENTRIC//SPECIAL PURPOSE PROCESSOR
10 0.0000088906 LABEL EQUIVALENCE//LABELING ALGORITHM//FIRST SCAN