Class information for: |
Basic class information |
ID | Publications | Average number of references |
Avg. shr. active ref. in WoS |
---|---|---|---|
26911 | 199 | 11.7 | 31% |
Classes in level above (level 2) |
ID, lev. above |
Publications | Label for level above |
---|---|---|
967 | 10249 | OPTICS AND LASERS IN ENGINEERING//DIGITAL IMAGE CORRELATION//FRINGE ANALYSIS |
Terms with highest relevance score |
Rank | Term | Type of term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|---|
1 | AMPLITUDE PHASE CHARACTERISTICS | Author keyword | 1 | 50% | 1% | 1 |
2 | BLOCKING OF REFRACTED RAYS | Author keyword | 1 | 50% | 1% | 1 |
3 | DUAL HOLOGRAM SHEARING INTERFEROMETRY | Author keyword | 1 | 50% | 1% | 1 |
4 | MULTIMODE LASING | Author keyword | 1 | 50% | 1% | 1 |
5 | OPTICAL SCHEME OF THE LASER SYSTEM | Author keyword | 1 | 50% | 1% | 1 |
6 | STRONG REFRACTION EFFECT | Author keyword | 1 | 50% | 1% | 1 |
7 | WAVE FRONT DISTORTIONS | Author keyword | 1 | 50% | 1% | 1 |
8 | FIZEAU FRINGES | Author keyword | 1 | 25% | 1% | 2 |
9 | LATERAL SHEAR | Author keyword | 1 | 25% | 1% | 2 |
10 | WEDGE ANGLE | Author keyword | 1 | 13% | 2% | 4 |
Web of Science journal categories |
Author Key Words |
Key Words Plus |
Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | WEDGE ANGLE | 2 | 67% | 1% | 2 |
2 | MEASUREMENT SENSITIVITY | 2 | 50% | 2% | 3 |
3 | TRANSPARENT PARALLEL PLATE | 1 | 38% | 2% | 3 |
4 | SCALE PERIODIC INHOMOGENEITIES | 1 | 100% | 1% | 2 |
5 | DEFOCUSED GRATINGS | 1 | 50% | 1% | 1 |
6 | REVERSAL SHEAR INTERFEROMETER | 1 | 50% | 1% | 1 |
7 | PHASE DIFFERENCE AMPLIFICATION | 0 | 33% | 1% | 1 |
8 | PHOTOREFRACTIVE SILLENITE CRYSTALS | 0 | 20% | 1% | 1 |
9 | MACROSCOPIC SURFACE DEFECTS | 0 | 100% | 1% | 1 |
10 | RESIDUAL WEDGE ANGLE | 0 | 100% | 1% | 1 |
Journals |
Reviews |
Title | Publ. year | Cit. | Active references |
% act. ref. to same field |
---|---|---|---|---|
HOLOGRAPHIC METHODS OF THE SENSITIVITY REGULATING OF INTERFERENCE MEASUREMENTS UNDER THE TRANSPARENT MEDIA DIAGNOSTICS | 1991 | 5 | 17 | 59% |
Address terms |
Rank | Address term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | FCQEI | 0 | 20% | 0.5% | 1 |
2 | OPEN JOINT STOCK CO | 0 | 14% | 0.5% | 1 |
3 | ZAVOISKII KAZAN PHYSICOTECH | 0 | 11% | 0.5% | 1 |
4 | WHOLE IMAGING | 0 | 10% | 0.5% | 1 |
5 | ELE OOPT RD UNIT | 0 | 100% | 0.5% | 1 |
6 | VP GLUSHKO ENERGOMASH PROD ASSOC | 0 | 100% | 0.5% | 1 |
Related classes at same level (level 1) |
Rank | Relatedness score | Related classes |
---|---|---|
1 | 0.0000208653 | MODE APPROACH//RAY OPTICS APPROACH//SUBMILLIMETRE LASER |
2 | 0.0000138959 | COLLIMATION TESTING//OPTICAL TESTING INSTRUMENTS//OPT LICADA |
3 | 0.0000109823 | SPACE OPT//RADIAL SHEARING//SURFACE PROFILOMETER |
4 | 0.0000065478 | THERMOGRADIENT EFFECT//HETERO EPITAXIAL STRUCTURE//LASER INDUCED ATOMIC DEFECTS |
5 | 0.0000064908 | ABSOLUTE LENGTH MEASUREMENT//GAUGE BLOCK//ULTRAFAST OPT ULTR RECIS GRP |
6 | 0.0000062089 | MOIRE INTERFEROMETRY//ELECTRON BEAM MOIRE//NANO MOIRE |
7 | 0.0000053020 | TALBOT EFFECT//PL OPT COMPLUTENSE GRP//ARRAY ILLUMINATORS |
8 | 0.0000052141 | PEAK RADIATION POWER//FRANTZ NODVIK EQUATION//ZABABAKHIN ALL RUSSIAN SCI TECH PHYS |
9 | 0.0000046082 | VISUALIZATION OF PHASE OBJECTS//COLOR INTERFEROMETRY//FOCUSING SCHLIEREN |
10 | 0.0000037389 | WE ONS ARBB//FAST FLOW LASER//IR PHOTOGRAPHY |