Class information for:
Level 1: AMPLITUDE PHASE CHARACTERISTICS//BLOCKING OF REFRACTED RAYS//DUAL HOLOGRAM SHEARING INTERFEROMETRY

Basic class information

ID Publications Average number
of references
Avg. shr. active
ref. in WoS
26911 199 11.7 31%



Bar chart of Publication_year

Last years might be incomplete

Classes in level above (level 2)



ID, lev.
above
Publications Label for level above
967 10249 OPTICS AND LASERS IN ENGINEERING//DIGITAL IMAGE CORRELATION//FRINGE ANALYSIS

Terms with highest relevance score



Rank Term Type of term Relevance score
(tfidf)
Class's shr.
of term's tot.
occurrences
Shr. of publ.
in class containing
term
Num. of
publ.
in class
1 AMPLITUDE PHASE CHARACTERISTICS Author keyword 1 50% 1% 1
2 BLOCKING OF REFRACTED RAYS Author keyword 1 50% 1% 1
3 DUAL HOLOGRAM SHEARING INTERFEROMETRY Author keyword 1 50% 1% 1
4 MULTIMODE LASING Author keyword 1 50% 1% 1
5 OPTICAL SCHEME OF THE LASER SYSTEM Author keyword 1 50% 1% 1
6 STRONG REFRACTION EFFECT Author keyword 1 50% 1% 1
7 WAVE FRONT DISTORTIONS Author keyword 1 50% 1% 1
8 FIZEAU FRINGES Author keyword 1 25% 1% 2
9 LATERAL SHEAR Author keyword 1 25% 1% 2
10 WEDGE ANGLE Author keyword 1 13% 2% 4

Web of Science journal categories

Author Key Words



Rank Web of Science journal category Relevance score
(tfidf)
Class's shr.
of term's tot.
occurrences
Shr. of publ.
in class containing
term
Num. of
publ.
in class
LCSH search Wikipedia search
1 AMPLITUDE PHASE CHARACTERISTICS 1 50% 1% 1 Search AMPLITUDE+PHASE+CHARACTERISTICS Search AMPLITUDE+PHASE+CHARACTERISTICS
2 BLOCKING OF REFRACTED RAYS 1 50% 1% 1 Search BLOCKING+OF+REFRACTED+RAYS Search BLOCKING+OF+REFRACTED+RAYS
3 DUAL HOLOGRAM SHEARING INTERFEROMETRY 1 50% 1% 1 Search DUAL+HOLOGRAM+SHEARING+INTERFEROMETRY Search DUAL+HOLOGRAM+SHEARING+INTERFEROMETRY
4 MULTIMODE LASING 1 50% 1% 1 Search MULTIMODE+LASING Search MULTIMODE+LASING
5 OPTICAL SCHEME OF THE LASER SYSTEM 1 50% 1% 1 Search OPTICAL+SCHEME+OF+THE+LASER+SYSTEM Search OPTICAL+SCHEME+OF+THE+LASER+SYSTEM
6 STRONG REFRACTION EFFECT 1 50% 1% 1 Search STRONG+REFRACTION+EFFECT Search STRONG+REFRACTION+EFFECT
7 WAVE FRONT DISTORTIONS 1 50% 1% 1 Search WAVE+FRONT+DISTORTIONS Search WAVE+FRONT+DISTORTIONS
8 FIZEAU FRINGES 1 25% 1% 2 Search FIZEAU+FRINGES Search FIZEAU+FRINGES
9 LATERAL SHEAR 1 25% 1% 2 Search LATERAL+SHEAR Search LATERAL+SHEAR
10 WEDGE ANGLE 1 13% 2% 4 Search WEDGE+ANGLE Search WEDGE+ANGLE

Key Words Plus



Rank Web of Science journal category Relevance score
(tfidf)
Class's shr.
of term's tot.
occurrences
Shr. of publ.
in class containing
term
Num. of
publ.
in class
1 WEDGE ANGLE 2 67% 1% 2
2 MEASUREMENT SENSITIVITY 2 50% 2% 3
3 TRANSPARENT PARALLEL PLATE 1 38% 2% 3
4 SCALE PERIODIC INHOMOGENEITIES 1 100% 1% 2
5 DEFOCUSED GRATINGS 1 50% 1% 1
6 REVERSAL SHEAR INTERFEROMETER 1 50% 1% 1
7 PHASE DIFFERENCE AMPLIFICATION 0 33% 1% 1
8 PHOTOREFRACTIVE SILLENITE CRYSTALS 0 20% 1% 1
9 MACROSCOPIC SURFACE DEFECTS 0 100% 1% 1
10 RESIDUAL WEDGE ANGLE 0 100% 1% 1

Journals

Reviews



Title Publ. year Cit. Active
references
% act. ref.
to same field
HOLOGRAPHIC METHODS OF THE SENSITIVITY REGULATING OF INTERFERENCE MEASUREMENTS UNDER THE TRANSPARENT MEDIA DIAGNOSTICS 1991 5 17 59%

Address terms



Rank Address term Relevance score
(tfidf)
Class's shr.
of term's tot.
occurrences
Shr. of publ.
in class containing
term
Num. of
publ.
in class
1 FCQEI 0 20% 0.5% 1
2 OPEN JOINT STOCK CO 0 14% 0.5% 1
3 ZAVOISKII KAZAN PHYSICOTECH 0 11% 0.5% 1
4 WHOLE IMAGING 0 10% 0.5% 1
5 ELE OOPT RD UNIT 0 100% 0.5% 1
6 VP GLUSHKO ENERGOMASH PROD ASSOC 0 100% 0.5% 1

Related classes at same level (level 1)



Rank Relatedness score Related classes
1 0.0000208653 MODE APPROACH//RAY OPTICS APPROACH//SUBMILLIMETRE LASER
2 0.0000138959 COLLIMATION TESTING//OPTICAL TESTING INSTRUMENTS//OPT LICADA
3 0.0000109823 SPACE OPT//RADIAL SHEARING//SURFACE PROFILOMETER
4 0.0000065478 THERMOGRADIENT EFFECT//HETERO EPITAXIAL STRUCTURE//LASER INDUCED ATOMIC DEFECTS
5 0.0000064908 ABSOLUTE LENGTH MEASUREMENT//GAUGE BLOCK//ULTRAFAST OPT ULTR RECIS GRP
6 0.0000062089 MOIRE INTERFEROMETRY//ELECTRON BEAM MOIRE//NANO MOIRE
7 0.0000053020 TALBOT EFFECT//PL OPT COMPLUTENSE GRP//ARRAY ILLUMINATORS
8 0.0000052141 PEAK RADIATION POWER//FRANTZ NODVIK EQUATION//ZABABAKHIN ALL RUSSIAN SCI TECH PHYS
9 0.0000046082 VISUALIZATION OF PHASE OBJECTS//COLOR INTERFEROMETRY//FOCUSING SCHLIEREN
10 0.0000037389 WE ONS ARBB//FAST FLOW LASER//IR PHOTOGRAPHY