Class information for: |
Basic class information |
ID | Publications | Average number of references |
Avg. shr. active ref. in WoS |
---|---|---|---|
26833 | 201 | 14.9 | 21% |
Classes in level above (level 2) |
ID, lev. above |
Publications | Label for level above |
---|---|---|
803 | 11388 | ULTRAMICROSCOPY//MICROSCOPY//ELECTRON HOLOGRAPHY |
Terms with highest relevance score |
Rank | Term | Type of term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|---|
1 | REG PHYSICOCHEM ANAL | Address | 0 | 25% | 0% | 1 |
2 | DOUBLE DIFFRACTION | Author keyword | 0 | 11% | 0% | 1 |
3 | TRANSMISSION REFLECTION AND SCANNING ELECTRON MICROSCOPY INCLUDING EBIC MECHANICAL PROPERTIES OF SOLIDS | Author keyword | 0 | 100% | 0% | 1 |
Web of Science journal categories |
Author Key Words |
Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
LCSH search | Wikipedia search |
---|---|---|---|---|---|---|---|
1 | DOUBLE DIFFRACTION | 0 | 11% | 0% | 1 | Search DOUBLE+DIFFRACTION | Search DOUBLE+DIFFRACTION |
2 | TRANSMISSION REFLECTION AND SCANNING ELECTRON MICROSCOPY INCLUDING EBIC MECHANICAL PROPERTIES OF SOLIDS | 0 | 100% | 0% | 1 | Search TRANSMISSION++REFLECTION+AND+SCANNING+ELECTRON+MICROSCOPY+INCLUDING+EBIC+MECHANICAL+PROPERTIES+OF+SOLIDS | Search TRANSMISSION++REFLECTION+AND+SCANNING+ELECTRON+MICROSCOPY+INCLUDING+EBIC+MECHANICAL+PROPERTIES+OF+SOLIDS |
Key Words Plus |
Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | KIKUCHI LINES | 0 | 100% | 0% | 1 |
Journals |
Reviews |
Title | Publ. year | Cit. | Active references |
% act. ref. to same field |
---|---|---|---|---|
Electron diffraction structure analysis - from Vainshtein to our days | 2001 | 8 | 17 | 18% |
ATOMIC RESOLUTION ELECTRON-MICROSCOPY | 1987 | 8 | 24 | 21% |
Address terms |
Rank | Address term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | REG PHYSICOCHEM ANAL | 0 | 25% | 0.5% | 1 |
Related classes at same level (level 1) |
Rank | Relatedness score | Related classes |
---|---|---|
1 | 0.0000168978 | APPLICATION SPECIFIC PROCESSOR ARRAYS//BEAM CONVERGENCE//INDEX TRANSFORMATIONS |
2 | 0.0000139473 | REFINED BEAM UNIT//SI111ROOT 3 X ROOT 3 AL//REFLECTION ELECTRON MICROSCOPY REM |
3 | 0.0000106677 | ULTRAMICROSCOPY//ABERRATION CORRECTION//DEPTH SECTIONING |
4 | 0.0000103639 | EMCD//ELECTRON MAGNETIC CIRCULAR DICHROISM//INELASTIC ELECTRON SCATTERING THEORY |
5 | 0.0000102766 | COBALT FREE MAGNETS//DISORDERED AND ORDERED SYSTEMS//UDMURT SCI |
6 | 0.0000099070 | AQUEOUS PERCHLORIC ACID//NEAT LIQUIDS//STRUCTURAL DIFFUSION |
7 | 0.0000097772 | CONVERGENT BEAM ELECTRON DIFFRACTION//PRECESSION ELECTRON DIFFRACTION//CBED |
8 | 0.0000093822 | MIGRATION VOLUME//SIMPLE CUBIC CRYSTAL//CONCENTRATION DIFFUSION EQUATION |
9 | 0.0000083204 | PHOTOELECTRON HOLOGRAPHY//X RAY FLUORESCENCE HOLOGRAPHY//PHOTOELECTRON DIFFRACTION |
10 | 0.0000079261 | MOGILEV BRANCH//ALLGEMEINE ELEKTROTECH ELEKTR//LAYERED PEROVSKITE FERROELECTRIC |