Class information for: |
Basic class information |
ID | Publications | Average number of references |
Avg. shr. active ref. in WoS |
---|---|---|---|
26616 | 205 | 15.4 | 47% |
Classes in level above (level 2) |
ID, lev. above |
Publications | Label for level above |
---|---|---|
1490 | 7092 | EUV LITHOG//UNDULATORS//SPECTROMICROSCOPY |
Terms with highest relevance score |
Rank | Term | Type of term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|---|
1 | SPACE NANOTECHNOL | Address | 3 | 35% | 3% | 7 |
2 | FREESTANDING TRANSMISSION GRATING | Author keyword | 2 | 67% | 1% | 2 |
3 | SINGLE ORDER DIFFRACTION | Author keyword | 2 | 67% | 1% | 2 |
4 | TRANSMISSION GRATING SPECTROMETER | Author keyword | 2 | 67% | 1% | 2 |
5 | NANOFABRICAT NOVEL DEVICES INTEGRATED T | Address | 2 | 21% | 4% | 9 |
6 | TRANSMISSION GRATING | Author keyword | 2 | 15% | 5% | 10 |
7 | STATE LASER FUS | Address | 1 | 38% | 1% | 3 |
8 | HIGH TEMP HIGH DENS PLASMA PHYS | Address | 1 | 100% | 1% | 2 |
9 | DIFFRACTION FILTERS | Author keyword | 1 | 40% | 1% | 2 |
10 | PLANAR MIRROR | Author keyword | 1 | 40% | 1% | 2 |
Web of Science journal categories |
Author Key Words |
Key Words Plus |
Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | ON INSULATOR WAFERS | 1 | 22% | 2% | 5 |
2 | FREESTANDING TRANSMISSION GRATINGS | 1 | 33% | 1% | 2 |
3 | LINE PHASE CONTRAST | 1 | 50% | 0% | 1 |
4 | PERIOD GRATINGS | 1 | 50% | 0% | 1 |
5 | AXAF HETGS | 0 | 33% | 0% | 1 |
6 | HETGS EFFECTIVE AREA | 0 | 33% | 0% | 1 |
7 | PLANSPIEGELANORDNUNGEN | 0 | 33% | 0% | 1 |
8 | TRANSPORT BARRIER PLASMAS | 0 | 33% | 0% | 1 |
9 | ZWEISTRAHLINTERFERENZ | 0 | 33% | 0% | 1 |
10 | COSMIC X RAY | 0 | 18% | 1% | 2 |
Journals |
Reviews |
Title | Publ. year | Cit. | Active references |
% act. ref. to same field |
---|---|---|---|---|
X-ray Diffraction Gratings for Astrophysics | 2010 | 3 | 6 | 17% |
Address terms |
Rank | Address term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | SPACE NANOTECHNOL | 3 | 35% | 3.4% | 7 |
2 | NANOFABRICAT NOVEL DEVICES INTEGRATED T | 2 | 21% | 4.4% | 9 |
3 | STATE LASER FUS | 1 | 38% | 1.5% | 3 |
4 | HIGH TEMP HIGH DENS PLASMA PHYS | 1 | 100% | 1.0% | 2 |
5 | MACHINE BLDG TECHNOL | 1 | 50% | 0.5% | 1 |
6 | MICRONANOTECHNOL CMI | 1 | 50% | 0.5% | 1 |
7 | NANOELECT DEVICE NANO | 1 | 50% | 0.5% | 1 |
8 | FINE MECH ENGN | 1 | 25% | 1.0% | 2 |
9 | QUANTUM OPT ELECT | 0 | 33% | 0.5% | 1 |
10 | SW NUCL PHYS CHEM | 0 | 33% | 0.5% | 1 |
Related classes at same level (level 1) |
Rank | Relatedness score | Related classes |
---|---|---|
1 | 0.0000205428 | GASSENDI//FRONT ENDS//VARIED LINE SPACING GRATINGS |
2 | 0.0000147407 | LASER INTERFERENCE METALLURGY//DIRECT DIGITAL MFG//JR3CN |
3 | 0.0000134595 | COLLECTOR OPTICS//ADV INTERDISCIPLINARY SCI//MAT EXTREME ENVIRONM |
4 | 0.0000132138 | CONTACT MICROSCOPY//LEAF DETAILS//SOFT X RAY CONTACT MICROSCOPY |
5 | 0.0000119909 | HALF BRIGHTNESS DOSE//UNIDAD RADIAC IONIZANTES//ASOCIAC EUROTOM |
6 | 0.0000106693 | PHOTON SIEVE//PHOTON SIEVES//COMPLEX MEDIA |
7 | 0.0000103557 | BOLOMETRY CAMERA//HIGH TEMP PLASMA PHYS//ECRH TEAM |
8 | 0.0000102642 | HIGH ENERGY DENSITY PHYSICS//SCREENED HYDROGENIC MODEL//RADIATIVE OPACITY |
9 | 0.0000094465 | INFRAROUGE LOINTAIN//LONGITUDINAL OPTIC PHONONS//METAL WIRE GRATING |
10 | 0.0000086972 | SPECT ATOM ION//LSAI//SOFT X RAY LASER |