Class information for: |
Basic class information |
ID | Publications | Average number of references |
Avg. shr. active ref. in WoS |
---|---|---|---|
26011 | 219 | 23.4 | 68% |
Classes in level above (level 2) |
ID, lev. above |
Publications | Label for level above |
---|---|---|
687 | 12408 | JOURNAL OF SYNCHROTRON RADIATION//DIFFRACTION ENHANCED IMAGING//PHASE RETRIEVAL |
Terms with highest relevance score |
Rank | Term | Type of term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|---|
1 | X RAY SURFACE DIFFRACTION | Author keyword | 2 | 67% | 1% | 2 |
2 | MHATT | Address | 1 | 50% | 1% | 2 |
3 | BM25 SPLINE | Address | 1 | 50% | 0% | 1 |
4 | ELECTRICAL DOUBLE LAYER STRUCTURE | Author keyword | 1 | 50% | 0% | 1 |
5 | PURE PHASE OBJECT | Author keyword | 1 | 50% | 0% | 1 |
6 | QUARTZ WATER INTERFACE | Author keyword | 1 | 50% | 0% | 1 |
7 | SPANISH CRG BEAMLINE ESRF | Address | 1 | 50% | 0% | 1 |
8 | DIFFRACTOMETERS | Author keyword | 1 | 17% | 1% | 3 |
9 | PNC | Address | 1 | 22% | 1% | 2 |
10 | RECONSTRUCTED SURFACE | Author keyword | 0 | 20% | 1% | 2 |
Web of Science journal categories |
Author Key Words |
Key Words Plus |
Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | ANGLE CALCULATIONS | 20 | 67% | 8% | 18 |
2 | 001 WATER | 4 | 75% | 1% | 3 |
3 | TRANSMISSION SCATTERING | 4 | 75% | 1% | 3 |
4 | Z AXIS | 2 | 28% | 3% | 7 |
5 | X RAY DIFFRACTOMETER | 2 | 18% | 5% | 11 |
6 | 001 SOLUTION INTERFACE | 2 | 43% | 1% | 3 |
7 | BRAGG CONDITION | 1 | 33% | 1% | 2 |
8 | STRUCTURE COMPLETION | 1 | 33% | 1% | 2 |
9 | CRYSTAL TRUNCATION ROD | 1 | 50% | 0% | 1 |
10 | MUSCOVITE 001 SOLUTION INTERFACE | 1 | 50% | 0% | 1 |
Journals |
Reviews |
Title | Publ. year | Cit. | Active references |
% act. ref. to same field |
---|---|---|---|---|
X-ray reflectivity as a probe of mineral-fluid interfaces: A user guide | 2002 | 78 | 55 | 24% |
Direct methods for surface crystallography | 2008 | 11 | 43 | 28% |
SURFACE-STRUCTURE DETERMINATION BY X-RAY-DIFFRACTION | 1989 | 562 | 73 | 11% |
SURFACE SENSITIVE X-RAY-SCATTERING | 1990 | 36 | 31 | 16% |
Address terms |
Rank | Address term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | MHATT | 1 | 50% | 0.9% | 2 |
2 | BM25 SPLINE | 1 | 50% | 0.5% | 1 |
3 | SPANISH CRG BEAMLINE ESRF | 1 | 50% | 0.5% | 1 |
4 | PNC | 1 | 22% | 0.9% | 2 |
5 | INAC NRS SP2M | 0 | 33% | 0.5% | 1 |
6 | CRYSTALLOG PL MINERAL | 0 | 15% | 0.9% | 2 |
7 | M CEA | 0 | 17% | 0.5% | 1 |
8 | MHATT CAT | 0 | 17% | 0.5% | 1 |
9 | FDN MOL MOVIES | 0 | 100% | 0.5% | 1 |
10 | FIS QUIM FIS ANALIT | 0 | 100% | 0.5% | 1 |
Related classes at same level (level 1) |
Rank | Relatedness score | Related classes |
---|---|---|
1 | 0.0000186489 | X RAY CTR//GLANCING ANGLE INCIDENCE//X RAY CRYSTAL TRUNCATION ROD |
2 | 0.0000115935 | SINGLE CRYSTAL AU100 ELECTRODE//ZAKLAD CHEM FIZYCZNEJ//CNRS UP A 70 45 |
3 | 0.0000113167 | TOTAL EXTERNAL REFLECTION//X RAY STANDING WAVES//LAYERED SYNTHETIC MICROSTRUCTURES |
4 | 0.0000108480 | DAS STRUCTURE//SN GE111//SI111 7 X 7 |
5 | 0.0000097426 | SURFACE X RAY DIFFRACTION SXRD//PT3SN//COPPER 100 |
6 | 0.0000097050 | X RAY PHOTON CORRELATION SPECTROSCOPY//XPCS//X RAY PHOTON CORRELATION SPECTROSCOPY XPCS |
7 | 0.0000094650 | X RAY MULTIPLE DIFFRACTION//THREE BEAM X RAY DIFFRACTION//RENNINGER SCAN |
8 | 0.0000093358 | BIASED DC PLASMA SPUTTERING//CIRCUIT PATTERN//AL2O3 ABRASIVE |
9 | 0.0000086680 | HISOR//SPANISH CRG BEAMLINE SPLINE BM25//HAXPES |
10 | 0.0000084874 | LEHRSTUHL FUNKT MAT//BK MOL SCI//LS E13 |