Class information for:
Level 1: ULTRAMICROSCOPY//ABERRATION CORRECTION//DEPTH SECTIONING

Basic class information
ID Publications Average number
of references		 Avg. shr. active
ref. in WoS
2574 2132 26.5 60%


Bar chart of Publication_year

Last years might be incomplete

Classes in level above (level 2)


ID, lev.
above		 Publications Label for level above
803 11388 ULTRAMICROSCOPY//MICROSCOPY//ELECTRON HOLOGRAPHY

Terms with highest relevance score


Rank Term Type of term Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class
1 ULTRAMICROSCOPY Journal 76 12% 29% 617
2 ABERRATION CORRECTION Author keyword 42 32% 5% 109
3 DEPTH SECTIONING Author keyword 30 84% 1% 16
4 EXIT WAVE RECONSTRUCTION Author keyword 21 57% 1% 25
5 INFORMATION LIMIT Author keyword 21 90% 0% 9
6 ANNULAR DARK FIELD IMAGING Author keyword 21 85% 1% 11
7 HAADF IMAGING Author keyword 20 100% 0% 9
8 HAADF Author keyword 18 39% 2% 37
9 SPHERICAL ABERRATION CORRECTION Author keyword 16 56% 1% 20
10 ANNULAR BRIGHT FIELD ABF Author keyword 15 88% 0% 7

Web of Science journal categories

Author Key Words


Rank Web of Science journal category Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class		 LCSH search Wikipedia search
1 ABERRATION CORRECTION 42 32% 5% 109 Search ABERRATION+CORRECTION Search ABERRATION+CORRECTION
2 DEPTH SECTIONING 30 84% 1% 16 Search DEPTH+SECTIONING Search DEPTH+SECTIONING
3 EXIT WAVE RECONSTRUCTION 21 57% 1% 25 Search EXIT+WAVE+RECONSTRUCTION Search EXIT+WAVE+RECONSTRUCTION
4 INFORMATION LIMIT 21 90% 0% 9 Search INFORMATION+LIMIT Search INFORMATION+LIMIT
5 ANNULAR DARK FIELD IMAGING 21 85% 1% 11 Search ANNULAR+DARK+FIELD+IMAGING Search ANNULAR+DARK+FIELD+IMAGING
6 HAADF IMAGING 20 100% 0% 9 Search HAADF+IMAGING Search HAADF+IMAGING
7 HAADF 18 39% 2% 37 Search HAADF Search HAADF
8 SPHERICAL ABERRATION CORRECTION 16 56% 1% 20 Search SPHERICAL+ABERRATION+CORRECTION Search SPHERICAL+ABERRATION+CORRECTION
9 ANNULAR BRIGHT FIELD ABF 15 88% 0% 7 Search ANNULAR+BRIGHT+FIELD+ABF Search ANNULAR+BRIGHT+FIELD+ABF
10 RONCHIGRAM 15 73% 1% 11 Search RONCHIGRAM Search RONCHIGRAM

Key Words Plus


Rank Web of Science journal category Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class
1 LATTICE RESOLUTION CONTRAST 72 93% 1% 27
2 ADF STEM 68 79% 2% 44
3 DARK FIELD STEM 64 86% 2% 32
4 FOCUS VARIATION 63 71% 2% 50
5 MULTISLICE METHOD 55 78% 2% 36
6 DARK FIELD IMAGES 44 72% 2% 34
7 THERMAL DIFFUSE SCATTERING 35 52% 2% 48
8 3 FOLD ASTIGMATISM 34 79% 1% 22
9 PLANE WAVE FUNCTION 31 92% 1% 12
10 HREM 31 25% 5% 104

Journals


Rank Web of Science journal category Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class
1 ULTRAMICROSCOPY 76 12% 29% 617

Reviews


Title Publ. year Cit. Active references % act. ref.
to same field
The principles and interpretation of annular dark-field Z-contrast imaging 2000 94 52 87%
Monochromated STEM with a 30 meV-wide, atom-sized electron probe 2013 26 31 58%
Studying atomic structures by aberration-corrected transmission electron microscopy 2008 132 48 73%
Experimental study of annular bright field (ABF) imaging using aberration-corrected scanning transmission electron microscopy (STEM) 2012 15 7 100%
Structure and bonding at the atomic scale by scanning transmission electron microscopy 2009 124 80 40%
Phase-contrast imaging in aberration-corrected scanning transmission electron microscopy 2013 11 48 58%
Extracting quantitative information from high resolution electron microscopy 2001 74 93 56%
Advanced Electron Microscopy for Advanced Materials 2012 25 179 37%
Nanostructural and chemical characterization of supported metal oxide catalysts by aberration corrected analytical electron microscopy 2012 18 65 46%
Compositional characterization of GaAs/GaAsSb nanowires by quantitative HAADF-STEM 2013 5 20 70%

Address terms


Rank Address term Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class
1 MONASH ELE ON MICROSCOPY 4 16% 1.0% 22
2 EPSRC SUPERSTEM IL 3 100% 0.1% 3
3 UK SUPERSTEM 3 33% 0.3% 7
4 SUPERSTEM 3 15% 0.7% 15
5 ERNST RUSKA MICROSCOPY SPECT ELE ONS 3 14% 0.8% 17
6 ELE ON MICROSCOPY STN 2 67% 0.1% 2
7 ER C 2 67% 0.1% 2
8 KYOTO KU 2 67% 0.1% 2
9 MAT MAT ENGN S 2 50% 0.1% 3
10 ELE ON MICROSCOPY MAT SCI EMAT 2 16% 0.6% 12

Related classes at same level (level 1)


Rank Relatedness score Related classes
1 0.0000256892 EMCD//ELECTRON MAGNETIC CIRCULAR DICHROISM//INELASTIC ELECTRON SCATTERING THEORY
2 0.0000181493 CONVERGENT BEAM ELECTRON DIFFRACTION//PRECESSION ELECTRON DIFFRACTION//CBED
3 0.0000160827 ELECTRON TOMOGRAPHY//TILT SERIES//MISSING WEDGE
4 0.0000157011 ELECTRON HOLOGRAPHY//OFF AXIS ELECTRON HOLOGRAPHY//TRIEBENBERG
5 0.0000113205 EFTEM//ENERGY FILTERING TRANSMISSION ELECTRON MICROSCOPY EFTEM//SPECTRUM IMAGING
6 0.0000106677 REG PHYSICOCHEM ANAL//DOUBLE DIFFRACTION//TRANSMISSION REFLECTION AND SCANNING ELECTRON MICROSCOPY INCLUDING EBIC MECHANICAL PROPERTIES OF SOLIDS
7 0.0000099272 VEELS//ELECTRON ENERGY FILTER//LOW VOLTAGE EELS
8 0.0000093410 APPLICATION SPECIFIC PROCESSOR ARRAYS//BEAM CONVERGENCE//INDEX TRANSFORMATIONS
9 0.0000085857 PODOLSK BRANCH//TUNGSTEN ATOMS//PENTAGONAL CRYSTALS
10 0.0000077159 ENVIRONMENTAL TEM//ATMOSPHER SCI GLOBAL CLIMATE CHANGE//LIQUID CELL TEM