Class information for: |
Basic class information |
ID | Publications | Average number of references |
Avg. shr. active ref. in WoS |
---|---|---|---|
25719 | 226 | 18.1 | 48% |
Classes in level above (level 2) |
ID, lev. above |
Publications | Label for level above |
---|---|---|
1036 | 9668 | SKUTTERUDITE//FILLED SKUTTERUDITE//THERMOELECTRIC |
Terms with highest relevance score |
Rank | Term | Type of term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|---|
1 | C AS | Address | 9 | 67% | 4% | 8 |
2 | ELECTROSTATICS BOUNDARY VALUE PROBLEM | Author keyword | 6 | 100% | 2% | 4 |
3 | SCION DTU | Address | 5 | 55% | 3% | 6 |
4 | GCP RS L511 | Address | 2 | 67% | 1% | 2 |
5 | ELECTRIC RESISTANCE MEASUREMENT | Author keyword | 2 | 36% | 2% | 4 |
6 | VAN DER PAUW TECHNIQUE | Author keyword | 2 | 36% | 2% | 4 |
7 | VAN DER PAUW METHOD | Author keyword | 2 | 20% | 4% | 8 |
8 | MICRO FOUR POINT PROBE | Author keyword | 1 | 38% | 1% | 3 |
9 | BTS OSS PPS SE | Address | 1 | 100% | 1% | 2 |
10 | FOUR POINT PROBES | Author keyword | 1 | 40% | 1% | 2 |
Web of Science journal categories |
Author Key Words |
Key Words Plus |
Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | CIRCULAR SEMICONDUCTORS | 15 | 88% | 3% | 7 |
2 | CONTACT SIZE | 8 | 75% | 3% | 6 |
3 | 4 POINT PROBE | 6 | 36% | 6% | 13 |
4 | 4 PROBE METHOD | 5 | 60% | 3% | 6 |
5 | SHEET RESISTANCE MEASUREMENT | 5 | 55% | 3% | 6 |
6 | 4 POINT PROBE METHOD | 3 | 100% | 1% | 3 |
7 | GEOMETRICAL CORRECTION FACTOR | 3 | 100% | 1% | 3 |
8 | 2 CANDIDATE MATERIALS | 2 | 50% | 1% | 3 |
9 | THERMOPOWER MEASUREMENTS | 2 | 43% | 1% | 3 |
10 | CONTACT PLACEMENT ERRORS | 1 | 100% | 1% | 2 |
Journals |
Reviews |
Title | Publ. year | Cit. | Active references |
% act. ref. to same field |
---|---|---|---|---|
Measuring thermoelectric transport properties of materials | 2015 | 5 | 65 | 25% |
High temperature Seebeck coefficient metrology | 2010 | 53 | 38 | 34% |
The 100th anniversary of the four-point probe technique: the role of probe geometries in isotropic and anisotropic systems | 2015 | 0 | 46 | 24% |
Address terms |
Rank | Address term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | C AS | 9 | 67% | 3.5% | 8 |
2 | SCION DTU | 5 | 55% | 2.7% | 6 |
3 | GCP RS L511 | 2 | 67% | 0.9% | 2 |
4 | BTS OSS PPS SE | 1 | 100% | 0.9% | 2 |
5 | THERMAL MECH | 1 | 50% | 0.4% | 1 |
6 | SYST DIAG | 0 | 33% | 0.4% | 1 |
7 | ELECT TRANSPORT | 0 | 20% | 0.4% | 1 |
8 | DTU DANCHIP | 0 | 14% | 0.4% | 1 |
9 | POLIMI | 0 | 11% | 0.4% | 1 |
10 | AMPS MCA GRP | 0 | 100% | 0.4% | 1 |
Related classes at same level (level 1) |
Rank | Relatedness score | Related classes |
---|---|---|
1 | 0.0000202421 | SOUND SOLUT TEAM//DEVICE MODULE//DC POTENTIAL DROP METHOD |
2 | 0.0000185526 | POTENTIAL DROP TECHNIQUE//STATE NEW NON FERROUS MET MAT//EXTRA LOW CYCLE |
3 | 0.0000121614 | THERMOELECTRIC GENERATOR//THERMOELECTRIC COOLER//THERMOELECTRIC GENERATOR TEG |
4 | 0.0000119178 | BISMUTH TELLURIDE//BI2TE3//THERMOELECTRIC MATERIALS |
5 | 0.0000111433 | CONICAL MULTILAYERED//FREE SPANS//API 5LD |
6 | 0.0000098961 | MAGNETIC FIELD EFFECT TRANSISTOR MAGFET//MAGFET//BIPOLAR MAGNETOTRANSISTORS |
7 | 0.0000086984 | ERSB//INP111A//DYAS |
8 | 0.0000084161 | BETA ZN4SB3//ZINC ANTIMONIDE//ZN4SB3 |
9 | 0.0000078564 | UNITE CHIM PHYS HAUTS POLYME POLY//ABORAT INNOVAT LOW DIMENS NANOMAT OPTOE//PHONON ASSISTED TUNNELING |
10 | 0.0000077731 | LIQUID SOLID MET PROC//LIQUID LIQUID STRUCTURE TRANSITION//LIQUID STRUCT HERED MAT |