Class information for: |
Basic class information |
ID | Publications | Average number of references |
Avg. shr. active ref. in WoS |
---|---|---|---|
25555 | 230 | 21.8 | 22% |
Classes in level above (level 2) |
ID, lev. above |
Publications | Label for level above |
---|---|---|
3544 | 966 | ELECTROCHEMICAL MIGRATION//SECT PROD PROC QUAL//MECHANICAL RELIABILITY PREDICTION |
Terms with highest relevance score |
Rank | Term | Type of term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|---|
1 | COMMERCIAL RELIABILITY PROGRAM | Author keyword | 2 | 67% | 1% | 2 |
2 | ELECTRONIC COMPONENT RELIABILITY | Author keyword | 2 | 67% | 1% | 2 |
3 | INTERNET CALIBRATION | Author keyword | 2 | 67% | 1% | 2 |
4 | BOUWDIENST RIJKSWATERSTAAT | Address | 1 | 100% | 1% | 2 |
5 | MIL HDBK 217 | Author keyword | 1 | 22% | 2% | 5 |
6 | ADV EDRAM | Address | 1 | 50% | 0% | 1 |
7 | AIR MOBIL COMMAND | Address | 1 | 50% | 0% | 1 |
8 | CORP QUAL RELIABIL | Address | 1 | 50% | 0% | 1 |
9 | DESIGN INTEGRITY | Author keyword | 1 | 50% | 0% | 1 |
10 | ELECTRONIC SYSTEM RELIABILITY | Author keyword | 1 | 50% | 0% | 1 |
Web of Science journal categories |
Author Key Words |
Key Words Plus |
Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | PLASTIC ENCAPSULATED MICROCIRCUITS | 1 | 40% | 1% | 2 |
2 | CALIBRATION INTERVALS | 0 | 33% | 0% | 1 |
3 | NUBBINS | 0 | 25% | 0% | 1 |
4 | RELIABILITY SIMULATION | 0 | 14% | 0% | 1 |
5 | SIMULATION BASED DESIGN | 0 | 11% | 0% | 1 |
6 | FIDES | 0 | 100% | 0% | 1 |
7 | SPARE PARTS REQUIREMENTS | 0 | 100% | 0% | 1 |
Journals |
Reviews |
Title | Publ. year | Cit. | Active references |
% act. ref. to same field |
---|---|---|---|---|
FAILURE PHYSICS OF INTEGRATED-CIRCUITS - A REVIEW | 1983 | 24 | 18 | 61% |
FAILURE PHYSICS OF INTEGRATED-CIRCUITS AND RELATIONSHIP TO RELIABILITY | 1983 | 4 | 12 | 75% |
CMOS INTEGRATED-CIRCUIT RELIABILITY | 1981 | 4 | 16 | 63% |
TECHNIQUES FOR TESTING MICROPROCESSOR BOARDS | 1981 | 0 | 7 | 43% |
Address terms |
Rank | Address term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | BOUWDIENST RIJKSWATERSTAAT | 1 | 100% | 0.9% | 2 |
2 | ADV EDRAM | 1 | 50% | 0.4% | 1 |
3 | AIR MOBIL COMMAND | 1 | 50% | 0.4% | 1 |
4 | CORP QUAL RELIABIL | 1 | 50% | 0.4% | 1 |
5 | GRP MICROELE ON | 1 | 50% | 0.4% | 1 |
6 | ROCK SOIL ENVIRONM ENGN | 1 | 50% | 0.4% | 1 |
7 | ELECT LICADA PEDRO BARRIE MAZA | 0 | 33% | 0.4% | 1 |
8 | CHAIR MECH TECHNOL METROL | 0 | 25% | 0.4% | 1 |
9 | PROD SYST LIFECYCLE MANAGEMENT | 0 | 25% | 0.4% | 1 |
10 | WATER OURCES MANAGEMENT ENVIRONM ENGN | 0 | 25% | 0.4% | 1 |
Related classes at same level (level 1) |
Rank | Relatedness score | Related classes |
---|---|---|
1 | 0.0000232533 | SECT PROD PROC QUAL//MATURITY INDEX ON RELIABILITY MIR//FAST FIELD FEEDBACK |
2 | 0.0000167466 | BAYESIAN SEQUENTIAL TEST//INGENIOUS MICROMFG SYST GRP//PROJECTION PURSUIT TYPE STATISTIC |
3 | 0.0000157876 | PLASTIC ENCAPSULATED MICROCIRCUIT//NONHERMETIC//DORMANT STORAGE |
4 | 0.0000140877 | ELECTROCHEMICAL MIGRATION//MECHANICAL RELIABILITY PREDICTION//CONDUCTIVE ANODIC FILAMENT |
5 | 0.0000135511 | POWER LAW PROCESS//RELIABILITY GROWTH//STAT RELIABIL |
6 | 0.0000123518 | MEDICATION ORDER ENTRY SYSTEM//UP EA 2127//MESSAGE PASSING MPI |
7 | 0.0000075251 | LECTOTYPE OPTIMIZATION//LOAD AND RESISTANCE FACTOR//STEEL JACKET OFFSHORE PLATFORM |
8 | 0.0000070354 | LAMBDA TAU METHODOLOGY//STANDARDIZAT TRANSPORTAT PROD LOGIST//RISK PRIORITY NUMBER |
9 | 0.0000069267 | INTERMODULATIONS//ACTIVE ELECTRONICALLY SCANNING ARRAY//ANNULAR MICROSTRIP ANTENNA |
10 | 0.0000065291 | CLOSED ENVIRONMENT//HEALTH SCORECARD//MULTI STATE FAILURE |