Class information for: |
Basic class information |
| ID | Publications | Average number of references |
Avg. shr. active ref. in WoS |
|---|---|---|---|
| 25353 | 236 | 21.2 | 27% |
Classes in level above (level 2) |
| ID, lev. above |
Publications | Label for level above |
|---|---|---|
| 1040 | 9640 | JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS//IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS//SINGLE EVENT UPSET SEU |
Terms with highest relevance score |
| Rank | Term | Type of term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
|---|---|---|---|---|---|---|
| 1 | DESIGN ERROR DIAGNOSIS | Author keyword | 3 | 100% | 1% | 3 |
| 2 | PASS FAIL INFORMATION | Author keyword | 3 | 100% | 1% | 3 |
| 3 | WITT POLYNOMIAL | Author keyword | 3 | 100% | 1% | 3 |
| 4 | MULTIPLE STUCK AT FAULTS | Author keyword | 3 | 60% | 1% | 3 |
| 5 | DESIGN DEBUGGING | Author keyword | 2 | 50% | 1% | 3 |
| 6 | ENGINEERING CHANGE ORDER ECO | Author keyword | 1 | 38% | 1% | 3 |
| 7 | CANDIDATE ISOLATION | Author keyword | 1 | 100% | 1% | 2 |
| 8 | FINITE INTEGER RINGS | Author keyword | 1 | 50% | 1% | 2 |
| 9 | FINITE RING ALGEBRA | Author keyword | 1 | 100% | 1% | 2 |
| 10 | MULTIPLE DEFECT | Author keyword | 1 | 100% | 1% | 2 |
Web of Science journal categories |
Author Key Words |
| Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
LCSH search | Wikipedia search |
|---|---|---|---|---|---|---|---|
| 1 | DESIGN ERROR DIAGNOSIS | 3 | 100% | 1% | 3 | Search DESIGN+ERROR+DIAGNOSIS | Search DESIGN+ERROR+DIAGNOSIS |
| 2 | PASS FAIL INFORMATION | 3 | 100% | 1% | 3 | Search PASS+FAIL+INFORMATION | Search PASS+FAIL+INFORMATION |
| 3 | WITT POLYNOMIAL | 3 | 100% | 1% | 3 | Search WITT+POLYNOMIAL | Search WITT+POLYNOMIAL |
| 4 | MULTIPLE STUCK AT FAULTS | 3 | 60% | 1% | 3 | Search MULTIPLE+STUCK+AT+FAULTS | Search MULTIPLE+STUCK+AT+FAULTS |
| 5 | DESIGN DEBUGGING | 2 | 50% | 1% | 3 | Search DESIGN+DEBUGGING | Search DESIGN+DEBUGGING |
| 6 | ENGINEERING CHANGE ORDER ECO | 1 | 38% | 1% | 3 | Search ENGINEERING+CHANGE+ORDER+ECO | Search ENGINEERING+CHANGE+ORDER+ECO |
| 7 | CANDIDATE ISOLATION | 1 | 100% | 1% | 2 | Search CANDIDATE+ISOLATION | Search CANDIDATE+ISOLATION |
| 8 | FINITE INTEGER RINGS | 1 | 50% | 1% | 2 | Search FINITE+INTEGER+RINGS | Search FINITE+INTEGER+RINGS |
| 9 | FINITE RING ALGEBRA | 1 | 100% | 1% | 2 | Search FINITE+RING+ALGEBRA | Search FINITE+RING+ALGEBRA |
| 10 | MULTIPLE DEFECT | 1 | 100% | 1% | 2 | Search MULTIPLE+DEFECT | Search MULTIPLE+DEFECT |
Key Words Plus |
| Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
|---|---|---|---|---|---|
| 1 | MULTIPLE TIMING FAULTS | 3 | 60% | 1% | 3 |
| 2 | DESIGN ERRORS | 1 | 31% | 2% | 4 |
| 3 | SPARE CELLS | 1 | 38% | 1% | 3 |
| 4 | ZM | 1 | 18% | 3% | 6 |
| 5 | FINITE COMMUTATIVE RINGS | 1 | 40% | 1% | 2 |
| 6 | ERROR DIAGNOSIS | 1 | 22% | 2% | 4 |
| 7 | DESIGN ERROR DIAGNOSIS | 1 | 33% | 1% | 2 |
| 8 | CHAIN DIAGNOSIS | 1 | 50% | 0% | 1 |
| 9 | FACET OXIDATION | 1 | 50% | 0% | 1 |
| 10 | FAULT DICTIONARIES | 1 | 50% | 0% | 1 |
Journals |
Reviews |
| Title | Publ. year | Cit. | Active references |
% act. ref. to same field |
|---|---|---|---|---|
| CAD SYSTEMS FOR VLSI IN JAPAN | 1983 | 10 | 7 | 29% |
Address terms |
| Rank | Address term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
|---|---|---|---|---|---|
| 1 | ELECT ENGN GIEE | 1 | 50% | 0.4% | 1 |
| 2 | FLASH SOLUT DEV TEAM | 1 | 50% | 0.4% | 1 |
| 3 | ELECT ELECT COMP ENGN EECE | 0 | 33% | 0.4% | 1 |
| 4 | EMBEDDED SYST ES | 0 | 25% | 0.4% | 1 |
| 5 | YOKOSUKA ELECT COMMUN S NETWORK SYST DEV | 0 | 25% | 0.4% | 1 |
| 6 | DPTO ELECT COMPUTADO | 0 | 20% | 0.4% | 1 |
| 7 | VLSI DESIGN EDUC VDEC | 0 | 11% | 0.8% | 2 |
| 8 | QCT | 0 | 14% | 0.4% | 1 |
| 9 | ECE CS | 0 | 13% | 0.4% | 1 |
| 10 | SCI TECH INFORMAT COMMUN CONNAISSANCE | 0 | 13% | 0.4% | 1 |
Related classes at same level (level 1) |
| Rank | Relatedness score | Related classes |
|---|---|---|
| 1 | 0.0000216181 | TRANSITION FAULTS//FUNCTIONAL BROADSIDE TESTS//JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS |
| 2 | 0.0000199802 | TRACE SIGNAL SELECTION//SILICON DEBUG//REAL TIME TRACE |
| 3 | 0.0000150216 | STATE ASSIGNMENT//FSM SYNTHESIS//LOGIC SYNTHESIS |
| 4 | 0.0000141971 | QUICK EXPONENTIATION//CIENCIA COMP INTELLIGENCIA ARTIFICIAL//INFINITE MATRICES |
| 5 | 0.0000130746 | READ ONCE BRANCHING PROGRAMS//ORDERED BINARY DECISION DIAGRAMS//INFORMAT LS2 |
| 6 | 0.0000121738 | BITWIDTH//WORD LENGTH OPTIMIZATION//BIT WIDTH ALLOCATION |
| 7 | 0.0000082296 | ADDER CIRCUITS//CIRCUIT DESIGN FAULT TOLERANCE//UNDEFINEDNESS |
| 8 | 0.0000078769 | IBM SYST TECHNOL GRP//390//SERVER GRP |
| 9 | 0.0000075273 | ABSTRACT INTERPRETATION//PREDICATE ABSTRACTION//SATISFIABILITY MODULO THEORIES |
| 10 | 0.0000074754 | DIRECT EXECUTION//IBM CELL BROADBAND ENGINE//LONGLEY RICE MODEL |