Class information for: |
Basic class information |
ID | Publications | Average number of references |
Avg. shr. active ref. in WoS |
---|---|---|---|
25327 | 236 | 13.6 | 33% |
Classes in level above (level 2) |
ID, lev. above |
Publications | Label for level above |
---|---|---|
2534 | 3313 | ASTEC VACUUM SCI GRP//SPINNING ROTOR GAUGE//TURBOMOLECULAR PUMP |
Terms with highest relevance score |
Rank | Term | Type of term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|---|
1 | WATER DEW POINT | Author keyword | 4 | 75% | 1% | 3 |
2 | ATMOSPHERIC PRESSURE IONIZATION MASS SPECTROMETER | Author keyword | 3 | 57% | 2% | 4 |
3 | CAPACITOR SENSOR | Author keyword | 3 | 100% | 1% | 3 |
4 | HYDRIDE GASES | Author keyword | 2 | 67% | 1% | 2 |
5 | TRACE WATER | Author keyword | 1 | 21% | 1% | 3 |
6 | BARRIER ENERGY | Author keyword | 1 | 50% | 0% | 1 |
7 | BI COMPARTMENT ION SOURCE | Author keyword | 1 | 50% | 0% | 1 |
8 | CLOSED MANUFACTURING SYSTEM | Author keyword | 1 | 50% | 0% | 1 |
9 | DEGRADATION PREVENTION | Author keyword | 1 | 50% | 0% | 1 |
10 | ELECTRONIC SPECIALTY GASES | Author keyword | 1 | 50% | 0% | 1 |
Web of Science journal categories |
Author Key Words |
Key Words Plus |
Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | PURIFIED NITROGEN GAS | 2 | 67% | 1% | 2 |
2 | TRACE MOISTURE | 2 | 31% | 2% | 5 |
3 | TRACE HUMIDITY MEASUREMENTS | 1 | 50% | 1% | 2 |
4 | LINE DATABASE | 1 | 50% | 0% | 1 |
5 | ULTRA PURE AMMONIA | 1 | 50% | 0% | 1 |
6 | VAPOR SPECTRUM | 0 | 18% | 1% | 2 |
7 | K DIELECTRIC FILMS | 0 | 25% | 0% | 1 |
8 | LASER ABSORPTION SPECTROMETER | 0 | 13% | 1% | 2 |
9 | AMINOXY | 0 | 20% | 0% | 1 |
10 | FE AL2O3 INTERFACE | 0 | 20% | 0% | 1 |
Journals |
Reviews |
Title | Publ. year | Cit. | Active references | % act. ref. to same field |
---|---|---|---|---|
Techniques for the measurement of trace moisture in high-purity electronic specialty gases | 2003 | 35 | 61 | 49% |
DETERMINATION OF TRACE IMPURITIES IN HIGHLY PURIFIED NITROGEN GAS BY ATMOSPHERIC-PRESSURE IONIZATION MASS-SPECTROMETRY | 1983 | 23 | 1 | 100% |
Trace-moisture sensor based on the electrolytic technique | 1998 | 1 | 2 | 50% |
Highly sensitive method for trace gas analysis | 2008 | 2 | 109 | 17% |
Address terms |
Rank | Address term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | FISS | 1 | 50% | 0.4% | 1 |
2 | UNDERGROUND STORAGE TANK PROGRAM | 1 | 50% | 0.4% | 1 |
3 | WHARFSIDE BUSINESS | 1 | 50% | 0.4% | 1 |
4 | SEMICOND IND | 0 | 33% | 0.4% | 1 |
5 | SUBMICRON DEV | 0 | 25% | 0.4% | 1 |
6 | YAMANASHI | 0 | 25% | 0.4% | 1 |
7 | MFG TECHNOL TEAM 1 | 0 | 20% | 0.4% | 1 |
8 | ANALYT TECHNOL GRP | 0 | 14% | 0.4% | 1 |
9 | C ACS | 0 | 14% | 0.4% | 1 |
10 | FED OFF METROL | 0 | 14% | 0.4% | 1 |
Related classes at same level (level 1) |
Rank | Relatedness score | Related classes |
---|---|---|
1 | 0.0000253102 | SEALED DISCHARGE//CONTINUOUS EMISSION MONITORING//ENCLOSED INDUCTIVELY COUPLED PLASMA |
2 | 0.0000134679 | PULSED DISCHARGE DETECTOR//CHLORINE SELECTIVE DETECTOR//PULSED DISCHARGE EMISSION DETECTION |
3 | 0.0000109510 | INFORMAT PHYS ENGINEER//OPTICAL AEROSOL MEASUREMENT//CONDENSATION NUCLEI COUNTER |
4 | 0.0000098912 | ASTEC VACUUM SCI GRP//NEG//TIZRV |
5 | 0.0000093262 | ATMOSPHERIC PRESSURE PHOTOIONIZATION//APLI//ATMOSPHERIC PRESSURE LASER IONIZATION |
6 | 0.0000092024 | TURBOMOLECULAR PUMP//DRY SCROLL VACUUM PUMP//TURBOMOLECULAR PUMP TMP |
7 | 0.0000087658 | GASEOUS STANDARD MIXTURES//CRITICAL FLOW VENTURI NOZZLE//CRITICAL NOZZLE |
8 | 0.0000073305 | CAVITY RING DOWN CRD//INCOHERENT BROADBAND CAVITY ENHANCED ABSORPTION SPECTROSCOPY//CAVITY RINGDOWN |
9 | 0.0000070603 | HIGH TEMP GASDYNAM//WAVELENGTH MODULATION SPECTROSCOPY//WAVELENGTH MODULATION |
10 | 0.0000063079 | WAFER RINSING//MICRO NANO FABRICAT//CIRCULATION COOLING WATER |