Class information for: |
Basic class information |
ID | Publications | Average number of references |
Avg. shr. active ref. in WoS |
---|---|---|---|
25072 | 243 | 19.1 | 28% |
Classes in level above (level 2) |
Terms with highest relevance score |
Rank | Term | Type of term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|---|
1 | SPECIAL DESIGN TECHNOL BUR NAUKA | Address | 1 | 50% | 1% | 2 |
2 | PHYS CHEM PROBLEMS CERAM | Address | 1 | 50% | 0% | 1 |
3 | SORPTION ANALYSIS | Author keyword | 1 | 50% | 0% | 1 |
4 | ENERGY SOURCE POWER | Address | 0 | 33% | 0% | 1 |
5 | GENERAL CONTRACTION | Author keyword | 0 | 17% | 0% | 1 |
6 | SMALL ANGLE SCATTERING | Address | 0 | 13% | 0% | 1 |
7 | INT EXTREME CONDIT | Address | 0 | 100% | 0% | 1 |
8 | KRASNOYARSK SCI SIBERIAN REG | Address | 0 | 100% | 0% | 1 |
9 | SELF PROPAGATING CRYSTALLIZATION | Author keyword | 0 | 100% | 0% | 1 |
10 | TOPOLOGY SOLID SURFACE | Author keyword | 0 | 100% | 0% | 1 |
Web of Science journal categories |
Author Key Words |
Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
LCSH search | Wikipedia search |
---|---|---|---|---|---|---|---|
1 | SORPTION ANALYSIS | 1 | 50% | 0% | 1 | Search SORPTION+ANALYSIS | Search SORPTION+ANALYSIS |
2 | GENERAL CONTRACTION | 0 | 17% | 0% | 1 | Search GENERAL+CONTRACTION | Search GENERAL+CONTRACTION |
3 | SELF PROPAGATING CRYSTALLIZATION | 0 | 100% | 0% | 1 | Search SELF+PROPAGATING+CRYSTALLIZATION | Search SELF+PROPAGATING+CRYSTALLIZATION |
4 | TOPOLOGY SOLID SURFACE | 0 | 100% | 0% | 1 | Search TOPOLOGY+SOLID+SURFACE | Search TOPOLOGY+SOLID+SURFACE |
Key Words Plus |
Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | MATRIX A3 3 | 2 | 67% | 1% | 2 |
2 | BERYLLIUM FILMS | 1 | 50% | 0% | 1 |
3 | CU NI SYSTEM | 1 | 50% | 0% | 1 |
4 | FE NI PHASE | 1 | 50% | 0% | 1 |
5 | POCO GRAPHITE | 1 | 50% | 0% | 1 |
6 | YTTERBIUM FILMS | 0 | 33% | 0% | 1 |
7 | DEFECT CREATION MECHANISM | 0 | 20% | 0% | 1 |
8 | PTFE001 | 0 | 20% | 0% | 1 |
9 | BASAL PLANES | 0 | 13% | 0% | 1 |
10 | AVALANCHE CRYSTALLIZATION | 0 | 100% | 0% | 1 |
Journals |
Reviews |
Title | Publ. year | Cit. | Active references | % act. ref. to same field |
---|---|---|---|---|
EXPLOSIVE CRYSTALLIZATION OF AMORPHOUS SUBSTANCES | 1989 | 39 | 37 | 22% |
Small-angle scattering of neutrons and X-rays from carbons and graphites | 1997 | 21 | 102 | 19% |
Composition and structure of thin quartz films on metals (A review) | 2003 | 0 | 6 | 17% |
SUPERCONDUCTORS WITH UNUSUAL PROPERTIES AND POSSIBILITIES OF ENHANCING CRITICAL-TEMPERATURE | 1986 | 5 | 26 | 8% |
Address terms |
Rank | Address term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | SPECIAL DESIGN TECHNOL BUR NAUKA | 1 | 50% | 0.8% | 2 |
2 | PHYS CHEM PROBLEMS CERAM | 1 | 50% | 0.4% | 1 |
3 | ENERGY SOURCE POWER | 0 | 33% | 0.4% | 1 |
4 | SMALL ANGLE SCATTERING | 0 | 13% | 0.4% | 1 |
5 | INT EXTREME CONDIT | 0 | 100% | 0.4% | 1 |
6 | KRASNOYARSK SCI SIBERIAN REG | 0 | 100% | 0.4% | 1 |
Related classes at same level (level 1) |
Rank | Relatedness score | Related classes |
---|---|---|
2 | 0.0000094825 | PLASMOCHEMICAL TREATMENT//LEWIS ACIDIC CENTERS//PURIFICAT EQUIPMENT |
3 | 0.0000090097 | SPHERICAL SOLID MODEL POTENTIAL//INDUCED CHARGE DENSITY//KANZAKI METHOD |
4 | 0.0000086847 | VACUUM CONDENSATES//PULSED LASER EVAPORATION//SOLID STATE CHEM MINERAL SOURCE |
5 | 0.0000078582 | ACTIVE NONWOVENS//C N COVALENT BOND//CHS 139 STEEL |
6 | 0.0000076666 | EXCIMER LASER CRYSTALLIZATION//LASER CRYSTALLIZATION//EXCIMER LASER ANNEALING |
7 | 0.0000074982 | SCI DESIGN OFF//SEGMENTED POLYETHERURETHANES//SURFACE ADSORPTION SITES |
8 | 0.0000072870 | THERMAL EXPLOSION//DEGENERATION CONDITIONS//METALLOCHEMICAL REACTIONS |
9 | 0.0000065393 | ENGN DIELECT PLICAT//AVERAGE WALL THICKNESS//IL SYNCHROTRON RADIAT |
10 | 0.0000064963 | BULK AMORPHOUS SEMICONDUCTORS//PHASE TRANSITION WAVE//ALPHA A |