Class information for: |
Basic class information |
| ID | Publications | Average number of references |
Avg. shr. active ref. in WoS |
|---|---|---|---|
| 24944 | 247 | 17.5 | 40% |
Classes in level above (level 2) |
| ID, lev. above |
Publications | Label for level above |
|---|---|---|
| 2557 | 3267 | INTERFACIAL SILICON EMISSION//SILICON OXIDATION//GENIE URBAIN ENVIRONM |
Terms with highest relevance score |
| Rank | Term | Type of term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
|---|---|---|---|---|---|---|
| 1 | SIPOS | Author keyword | 1 | 38% | 1% | 3 |
| 2 | MSOS O P STRUCTURE | Author keyword | 1 | 100% | 1% | 2 |
| 3 | SEMI INSULATING POLYCRYSTALLINE SILICON | Author keyword | 1 | 50% | 1% | 2 |
| 4 | SILICON RICH OXIDE | Author keyword | 1 | 13% | 2% | 6 |
| 5 | CNRSURA 1648 | Address | 1 | 50% | 0% | 1 |
| 6 | CV CHARACTERIZATION | Author keyword | 1 | 50% | 0% | 1 |
| 7 | MODELING CONCEPT CIRCUITS ELECT | Address | 1 | 50% | 0% | 1 |
| 8 | MOSP | Author keyword | 1 | 50% | 0% | 1 |
| 9 | PERCOLATION PATHS | Author keyword | 1 | 50% | 0% | 1 |
| 10 | STACKED GATE MEMORY | Author keyword | 1 | 50% | 0% | 1 |
Web of Science journal categories |
Author Key Words |
| Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
LCSH search | Wikipedia search |
|---|---|---|---|---|---|---|---|
| 1 | SIPOS | 1 | 38% | 1% | 3 | Search SIPOS | Search SIPOS |
| 2 | MSOS O P STRUCTURE | 1 | 100% | 1% | 2 | Search MSOS+O+P+STRUCTURE | Search MSOS+O+P+STRUCTURE |
| 3 | SEMI INSULATING POLYCRYSTALLINE SILICON | 1 | 50% | 1% | 2 | Search SEMI+INSULATING+POLYCRYSTALLINE+SILICON | Search SEMI+INSULATING+POLYCRYSTALLINE+SILICON |
| 4 | SILICON RICH OXIDE | 1 | 13% | 2% | 6 | Search SILICON+RICH+OXIDE | Search SILICON+RICH+OXIDE |
| 5 | CV CHARACTERIZATION | 1 | 50% | 0% | 1 | Search CV+CHARACTERIZATION | Search CV+CHARACTERIZATION |
| 6 | MOSP | 1 | 50% | 0% | 1 | Search MOSP | Search MOSP |
| 7 | PERCOLATION PATHS | 1 | 50% | 0% | 1 | Search PERCOLATION+PATHS | Search PERCOLATION+PATHS |
| 8 | STACKED GATE MEMORY | 1 | 50% | 0% | 1 | Search STACKED+GATE+MEMORY | Search STACKED+GATE+MEMORY |
| 9 | XEROGRAPHIC METHOD | 1 | 50% | 0% | 1 | Search XEROGRAPHIC+METHOD | Search XEROGRAPHIC+METHOD |
| 10 | NON STOICHIOMETRIC SILICON OXIDE | 0 | 33% | 0% | 1 | Search NON+STOICHIOMETRIC+SILICON+OXIDE | Search NON+STOICHIOMETRIC+SILICON+OXIDE |
Key Words Plus |
| Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
|---|---|---|---|---|---|
| 1 | SIPOS | 17 | 68% | 6% | 15 |
| 2 | INSULATING POLYCRYSTALLINE SILICON | 3 | 50% | 2% | 4 |
| 3 | HIGH CURRENT INJECTION | 3 | 60% | 1% | 3 |
| 4 | SEMIINSULATING POLYCRYSTALLINE SILICON | 1 | 25% | 2% | 5 |
| 5 | ENERGY LOSS MICROSPECTROSCOPY | 1 | 50% | 0% | 1 |
| 6 | RICH OXIDE SRO | 1 | 50% | 0% | 1 |
| 7 | SIPOS DEPOSITION | 1 | 50% | 0% | 1 |
| 8 | SI RICH SIO2 | 1 | 29% | 1% | 2 |
| 9 | HETEROJUNCTION TRANSISTOR | 0 | 33% | 0% | 1 |
| 10 | XEROGRAPHIC DISCHARGE CHARACTERISTICS | 0 | 25% | 0% | 1 |
Journals |
Reviews |
| Title | Publ. year | Cit. | Active references |
% act. ref. to same field |
|---|---|---|---|---|
| Electrical and optical properties of semi-insulating polycrystalline silicon thin films: The role of microstructure and doping | 1996 | 21 | 55 | 44% |
| Study and modeling of the breakdown voltage in semi insulating GaAs P+N, PN+, P+N+ junctions diodes presenting deep centers traps | 2014 | 0 | 4 | 25% |
| CHALLENGES TO MANUFACTURING SUBMICRON, ULTRA-LARGE SCALE INTEGRATED-CIRCUITS | 1990 | 28 | 30 | 10% |
| LSI MEMORIES | 1985 | 1 | 9 | 56% |
| ELECTRICAL TRANSPORT IN RF-SPUTTERED SIO2-FILMS - A REVIEW | 1984 | 6 | 18 | 11% |
Address terms |
| Rank | Address term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
|---|---|---|---|---|---|
| 1 | CNRSURA 1648 | 1 | 50% | 0.4% | 1 |
| 2 | MODELING CONCEPT CIRCUITS ELECT | 1 | 50% | 0.4% | 1 |
| 3 | URA 1648 | 1 | 50% | 0.4% | 1 |
| 4 | ENSIGC GENIE CHIM | 0 | 33% | 0.4% | 1 |
| 5 | IPN FIS | 0 | 33% | 0.4% | 1 |
| 6 | SCI PHYS HIGASHI KU | 0 | 33% | 0.4% | 1 |
| 7 | MICROELE ON PL | 0 | 25% | 0.4% | 1 |
| 8 | CCMO | 0 | 20% | 0.4% | 1 |
| 9 | UPR CNRS 8521 | 0 | 13% | 0.4% | 1 |
| 10 | CCMOGRP MICROELECT VISUALISAT | 0 | 100% | 0.4% | 1 |
Related classes at same level (level 1) |
| Rank | Relatedness score | Related classes |
|---|---|---|
| 1 | 0.0000171057 | HITACHI ADM//SOLAR CELL METALLIZATION// |
| 2 | 0.0000159302 | GENIE URBAIN ENVIRONM//COMPUTERISING//OXYNITRIDE FILMS |
| 3 | 0.0000140673 | POLYOXIDE//INTERPOLY OXIDE//NONPLANAR POLYOXIDE |
| 4 | 0.0000116549 | SILICON TETRAACETATE//F 2 LASER//N2O GAS |
| 5 | 0.0000115861 | POLYSILICON RESISTORS//HEAVILY DOPED POLYSILICON RESISTOR//LPCVD SI LAYERS |
| 6 | 0.0000110585 | SILICON OXYNITRIDE//SILICON NITRIDE FILMS//CONDUCTANCE TRANSIENTS |
| 7 | 0.0000104441 | NEEDLE TYPE ELECTRODES//SI O SUPERLATTICE//CONTOUR VIBRATION |
| 8 | 0.0000095884 | SILICON NANOCRYSTALS//SI NANOCRYSTALS//NANOPHOTON PHYS |
| 9 | 0.0000093909 | STRESS INDUCED LEAKAGE CURRENT//SOFT BREAKDOWN//DIELECTRIC BREAKDOWN BD |
| 10 | 0.0000079874 | PARASITIC REACTION//CVD REACTOR//MOCVD REACTOR |