Class information for: |
Basic class information |
ID | Publications | Average number of references |
Avg. shr. active ref. in WoS |
---|---|---|---|
24791 | 251 | 20.3 | 28% |
Classes in level above (level 2) |
ID, lev. above |
Publications | Label for level above |
---|---|---|
1819 | 5697 | HGCDTE//CERDEC NIGHT VIS ELECT SENSORS DIRECTORATE//MICROPHYS |
Terms with highest relevance score |
Rank | Term | Type of term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|---|
1 | CNRS UP A 8008 | Address | 1 | 50% | 0% | 1 |
2 | TWO DIMENSION ELECTRON GAS | Author keyword | 1 | 50% | 0% | 1 |
3 | DETONATION DIAMOND | Author keyword | 0 | 33% | 0% | 1 |
4 | ELECTRON IMPURITY SCATTERING | Author keyword | 0 | 33% | 0% | 1 |
5 | HIGH MODULUS CARBON FIBERS | Author keyword | 0 | 33% | 0% | 1 |
6 | RADIOPHYS COMP TECHNOL | Address | 0 | 33% | 0% | 1 |
7 | UMS 3318 | Address | 0 | 33% | 0% | 1 |
8 | UNIV TEKNOL MALAYSIA | Address | 0 | 33% | 0% | 1 |
9 | CNRT MAT | Address | 0 | 25% | 0% | 1 |
10 | GEGI | Address | 0 | 25% | 0% | 1 |
Web of Science journal categories |
Author Key Words |
Key Words Plus |
Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | IONIZED IMPURITIES | 4 | 75% | 1% | 3 |
2 | UNDOPED SEMICONDUCTORS | 2 | 67% | 1% | 2 |
3 | PLASMON INTERACTION | 1 | 40% | 1% | 2 |
4 | IONIZED IMPURITY SCATTERING | 1 | 17% | 2% | 5 |
5 | SHALLOW DEEP INSTABILITIES | 1 | 50% | 0% | 1 |
6 | ENERGY LOSS METHOD | 0 | 33% | 0% | 1 |
7 | SCREENING LIMIT | 0 | 33% | 0% | 1 |
8 | QUANTUM WELL HETEROSTRUCTURE | 0 | 10% | 0% | 1 |
9 | LASER LIKE STRUCTURES | 0 | 100% | 0% | 1 |
Journals |
Reviews |
Title | Publ. year | Cit. | Active references |
% act. ref. to same field |
---|---|---|---|---|
CARRIER SCATTERING AND TRANSPORT IN SEMICONDUCTORS TREATED BY THE ENERGY-LOSS METHOD | 1986 | 51 | 14 | 64% |
ELECTRON-SCATTERING BY IONIZED IMPURITIES IN SEMICONDUCTORS | 1981 | 261 | 16 | 50% |
Address terms |
Rank | Address term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | CNRS UP A 8008 | 1 | 50% | 0.4% | 1 |
2 | RADIOPHYS COMP TECHNOL | 0 | 33% | 0.4% | 1 |
3 | UMS 3318 | 0 | 33% | 0.4% | 1 |
4 | UNIV TEKNOL MALAYSIA | 0 | 33% | 0.4% | 1 |
5 | CNRT MAT | 0 | 25% | 0.4% | 1 |
6 | GEGI | 0 | 25% | 0.4% | 1 |
7 | CNRS URA 234 | 0 | 100% | 0.4% | 1 |
8 | ELE OOPT GP | 0 | 100% | 0.4% | 1 |
9 | SCI I | 0 | 100% | 0.4% | 1 |
Related classes at same level (level 1) |
Rank | Relatedness score | Related classes |
---|---|---|
1 | 0.0000180867 | RADIOCRYSTALLOGRAPHY//SCI TECHNOL RUMENTAT ENGN//NANOSCALE DIFFUSION |
2 | 0.0000175924 | MOBILITY SPECTRUM ANALYSIS//QUANTITATIVE MOBILITY SPECTRUM ANALYSIS QMSA//MOBILITY SPECTRUM |
3 | 0.0000089183 | NODE COUNTING//DIRAC KRONIG PENNEY MODEL//LATTICE SCHRODINGER AND DIRAC OPERATORS |
4 | 0.0000087805 | MICRO PHOTONELECT//HOT ELECTRON SCATTERING//LO PHONON EMISSION |
5 | 0.0000084892 | OPEN CIRCUIT VOLTAGE DECAY OCVD//APPARENT BAND GAP NARROWING//EQUIVALENT DIAGRAM |
6 | 0.0000080333 | LR 0//DECOMMISSIONING WASTE//PIN POWER DENSITY |
7 | 0.0000076462 | MOSKOVSKOE SH 34//// |
8 | 0.0000073962 | REACT CHEM//CYCLOALKYLHYDROTETRAOXY RADICAL//CYCLOALKYTHYDROTETRAOXYL RADICAL |
9 | 0.0000071730 | D P MODEL//FUNDAMENTAL DISCIPLINES FTN//PROJECTION OPERATOR SERIES EXPANSION |
10 | 0.0000070870 | CONDENSED MATTER PHYS BRANCH//PHONONS LATTICE DYNAMICS//PHYS SEMICOND PHYS GRP |