Class information for:
Level 1: SERIES RESISTANCE//BARRIER INHOMOGENEITY//IDEALITY FACTOR

Basic class information
ID Publications Average number
of references		 Avg. shr. active
ref. in WoS
2434 2176 28.1 66%


Bar chart of Publication_year

Last years might be incomplete

Classes in level above (level 2)


ID, lev.
above		 Publications Label for level above
603 13298 BETA FESI2//SILICIDE//SILICIDES

Terms with highest relevance score


Rank Term Type of term Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class
1 SERIES RESISTANCE Author keyword 81 35% 9% 185
2 BARRIER INHOMOGENEITY Author keyword 72 91% 1% 30
3 IDEALITY FACTOR Author keyword 56 40% 5% 110
4 BARRIER HEIGHT Author keyword 51 31% 6% 136
5 BARRIER HEIGHT INHOMOGENEITY Author keyword 44 100% 1% 16
6 VOCAT MED SCI Address 31 82% 1% 18
7 BARRIER INHOMOGENEITIES Author keyword 29 72% 1% 23
8 ORGANIC INORGANIC SEMICONDUCTOR CONTACT Author keyword 27 92% 1% 11
9 SCHOTTKY DIODE Author keyword 27 17% 7% 144
10 MIS SCHOTTKY DIODES Author keyword 26 100% 1% 11

Web of Science journal categories

Author Key Words


Rank Web of Science journal category Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class		 LCSH search Wikipedia search
1 SERIES RESISTANCE 81 35% 9% 185 Search SERIES+RESISTANCE Search SERIES+RESISTANCE
2 BARRIER INHOMOGENEITY 72 91% 1% 30 Search BARRIER+INHOMOGENEITY Search BARRIER+INHOMOGENEITY
3 IDEALITY FACTOR 56 40% 5% 110 Search IDEALITY+FACTOR Search IDEALITY+FACTOR
4 BARRIER HEIGHT 51 31% 6% 136 Search BARRIER+HEIGHT Search BARRIER+HEIGHT
5 BARRIER HEIGHT INHOMOGENEITY 44 100% 1% 16 Search BARRIER+HEIGHT+INHOMOGENEITY Search BARRIER+HEIGHT+INHOMOGENEITY
6 BARRIER INHOMOGENEITIES 29 72% 1% 23 Search BARRIER+INHOMOGENEITIES Search BARRIER+INHOMOGENEITIES
7 ORGANIC INORGANIC SEMICONDUCTOR CONTACT 27 92% 1% 11 Search ORGANIC+INORGANIC+SEMICONDUCTOR+CONTACT Search ORGANIC+INORGANIC+SEMICONDUCTOR+CONTACT
8 SCHOTTKY DIODE 27 17% 7% 144 Search SCHOTTKY+DIODE Search SCHOTTKY+DIODE
9 MIS SCHOTTKY DIODES 26 100% 1% 11 Search MIS+SCHOTTKY+DIODES Search MIS+SCHOTTKY+DIODES
10 INSULATOR LAYER 23 74% 1% 17 Search INSULATOR+LAYER Search INSULATOR+LAYER

Key Words Plus


Rank Web of Science journal category Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class
1 I V 150 80% 4% 94
2 C V CHARACTERISTICS 141 81% 4% 85
3 SERIES RESISTANCE 137 42% 12% 251
4 SCHOTTKY BARRIER DIODES 121 52% 8% 164
5 IDEALITY FACTORS 118 95% 2% 39
6 CONDUCTANCE TECHNIQUE 107 93% 2% 40
7 EXCESS CAPACITANCE 90 88% 2% 43
8 CAPACITANCE VOLTAGE CHARACTERISTICS 89 62% 4% 91
9 CURRENT VOLTAGE CHARACTERISTICS 79 23% 14% 306
10 INTERSECTING BEHAVIOR 72 91% 1% 30

Journals

Reviews


Title Publ. year Cit. Active references % act. ref.
to same field
The physics and chemistry of the Schottky barrier height 2014 54 353 12%
Embedded Nanoparticles in Schottky and Ohmic Contacts: A Review 2015 1 72 32%
Recent advances in Schottky barrier concepts 2001 525 343 20%
The barrier height inhornogeneity in Al/p-Si Schottky barrier diodes with native insulator layer 2006 41 23 96%
Hydrostatic pressure dependence of interface state density of Cd/n-type GaAs Schottky barrier diodes 2010 13 19 84%
Electrical and photoconductivity properties of p-Si/P3HT/Al and p-Si/P3HT:MEH-PPV/Al organic devices: Comparison study 2012 12 153 38%
Evaluation of the hydrostatic pressure effect on Mn/p-Si Schottky barrier diode electrical parameters and interface states 2012 4 45 73%
Study and modeling of the transport mechanism in a semi insulating GaAs Schottky diode 2012 0 14 100%
Review and test of methods for determination of the Schottky diode parameters 2015 0 39 72%
Electrical properties of gallium arsenide surfaces and interfaces treated by Ru(3+) ions 2009 1 7 71%

Address terms


Rank Address term Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class
1 VOCAT MED SCI 31 82% 0.8% 18
2 OPTICIANRY 26 80% 0.7% 16
3 NUCL ELECT RUMENTAT 14 100% 0.3% 7
4 YSR ENGN 8 75% 0.3% 6
5 MADEN HIGHER VOCAT 6 53% 0.4% 8
6 SEMICOND DISPOSITIFS ELECT 3 57% 0.2% 4
7 GRP PESQUISA CIENCIA MAT 3 100% 0.1% 3
8 MICROELECT PL 3 25% 0.5% 11
9 SPRC 2 10% 0.9% 20
10 OPTOELECT COMPOSANTS 2 24% 0.4% 8

Related classes at same level (level 1)


Rank Relatedness score Related classes
1 0.0000159019 NANOMETER SIZED SCHOTTKY CONTACT//METAL DOT ARRAY//NANO DIODE
2 0.0000103366 INDIUM PHOSPHIDE100//INTERACTION IONS MATTER//SIMULATION METHOD TRIM
3 0.0000082031 DIFFUSION TEMPERATURE//DEVICE FUNCT SECT//TWO DIMENSIONAL DEVICE SIMULATION
4 0.0000077373 P GAN//OHMIC CONTACT//OHMIC CONTACTS
5 0.0000072288 OHMIC CONTACT//OHMIC CONTACTS//P TYPE SIC
6 0.0000070018 LASER MOL BEAM EPITAXY//PTSI//IRIDIUM SILICIDES
7 0.0000068744 BALLISTIC ELECTRON EMISSION MICROSCOPY//BALLISTIC ELECTRON EMISSION MICROSCOPY BEEM//BEEM
8 0.0000065088 AB INITIO CLUSTER CALCULATIONS//FINITE FIELD DFT CALCULATION//GAAS111A SURFACE
9 0.0000062185 EDUC SCANNING PROBE MICROSCOPY//LOBACHEVSKY PHYS TECH//PHOTOELECTRIC SPECTROSCOPY
10 0.0000057887 SEMICOND INTEGRATED CIRCUIT//SCI TECH FES SAIS//HIGFET