Class information for: |
Basic class information |
| ID | Publications | Average number of references |
Avg. shr. active ref. in WoS |
|---|---|---|---|
| 24258 | 266 | 15.2 | 29% |
Classes in level above (level 2) |
| ID, lev. above |
Publications | Label for level above |
|---|---|---|
| 2027 | 4924 | JOURNAL OF RADIOANALYTICAL AND NUCLEAR CHEMISTRY-ARTICLES//JOURNAL OF RADIOANALYTICAL CHEMISTRY//K0 METHOD |
Terms with highest relevance score |
| Rank | Term | Type of term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
|---|---|---|---|---|---|---|
| 1 | CZOCHRALSKI SILICON SUBSTRATES | Author keyword | 1 | 100% | 1% | 2 |
| 2 | BERYLLIUM BORIDES | Author keyword | 1 | 50% | 0% | 1 |
| 3 | OXYGEN PROFILING | Author keyword | 1 | 50% | 0% | 1 |
| 4 | RECOIL SEPARATION | Author keyword | 1 | 50% | 0% | 1 |
| 5 | ALPHA BEAM | Author keyword | 0 | 33% | 0% | 1 |
| 6 | URA 0358 | Address | 0 | 33% | 0% | 1 |
| 7 | RUTHERFORD BACK SCATTERING SPECTROSCOPY | Author keyword | 0 | 14% | 0% | 1 |
| 8 | ORGANOGALLIUM COMPOUNDS | Author keyword | 0 | 11% | 0% | 1 |
| 9 | C AND P CO IMPLANTATION | Author keyword | 0 | 100% | 0% | 1 |
| 10 | CHARGED PARTICLE ACTIVATION ANALYSIS CPAA | Author keyword | 0 | 100% | 0% | 1 |
Web of Science journal categories |
Author Key Words |
Key Words Plus |
| Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
|---|---|---|---|---|---|
| 1 | CHARGED PARTICLE ACTIVATION | 1 | 100% | 1% | 2 |
| 2 | ION ACTIVATION ANALYSIS | 1 | 50% | 0% | 1 |
| 3 | PARTICLE ACTIVATION ANALYSIS | 0 | 15% | 1% | 2 |
| 4 | SEMICONDUCTOR GRADE SILICON | 0 | 25% | 0% | 1 |
| 5 | MO VPE | 0 | 100% | 0% | 1 |
| 6 | O 16HE 3 PF 18 REACTION | 0 | 100% | 0% | 1 |
| 7 | OXYGEN ANALYSIS | 0 | 100% | 0% | 1 |
| 8 | RADIOACTIVATION ANALYSIS | 0 | 100% | 0% | 1 |
| 9 | SUBSTOICHIOMETRIC PRECIPITATION | 0 | 100% | 0% | 1 |
Journals |
Reviews |
| Title | Publ. year | Cit. | Active references |
% act. ref. to same field |
|---|---|---|---|---|
| TRACE AND ULTRATRACE ANALYSIS .2. ACCURACY IN ACTIVATION-ANALYSIS | 1984 | 6 | 19 | 47% |
| DETERMINATION OF IMPURITIES IN SILICON BY ACTIVATION-ANALYSES USING CHARGED-PARTICLE ACCELERATORS | 1984 | 0 | 2 | 100% |
| ANALYSIS OF ELECTRONIC AND SOLAR GRADE SILICON BY ATOMIC EMISSION-SPECTROSCOPY FROM INDUCTIVELY COUPLED PLASMA | 1984 | 0 | 2 | 100% |
| ANALYTICAL USE OF ELECTRON-ACCELERATORS | 1984 | 0 | 2 | 100% |
Address terms |
| Rank | Address term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
|---|---|---|---|---|---|
| 1 | URA 0358 | 0 | 33% | 0.4% | 1 |
| 2 | FOR UNGSZENTRUM ABT ZCH | 0 | 100% | 0.4% | 1 |
| 3 | NTT INDISCIPLINARY S | 0 | 100% | 0.4% | 1 |
| 4 | NUCL ENGN ANALYT | 0 | 100% | 0.4% | 1 |
Related classes at same level (level 1) |