Class information for: |
Basic class information |
| ID | Publications | Average number of references |
Avg. shr. active ref. in WoS |
|---|---|---|---|
| 24218 | 267 | 18.5 | 58% |
Classes in level above (level 2) |
| ID, lev. above |
Publications | Label for level above |
|---|---|---|
| 1856 | 5547 | JOURNAL OF SYNCHROTRON RADIATION//CONVERSION ELECTRON YIELD//ELNES |
Terms with highest relevance score |
| Rank | Term | Type of term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
|---|---|---|---|---|---|---|
| 1 | CONVERSION ELECTRON YIELD | Author keyword | 18 | 89% | 3% | 8 |
| 2 | SIK EDGE XANES | Author keyword | 4 | 75% | 1% | 3 |
| 3 | CRYSTAL TECHNOL DEV | Address | 3 | 100% | 1% | 3 |
| 4 | X RAY PHOTOACOUSTIC EFFECT | Author keyword | 3 | 100% | 1% | 3 |
| 5 | NANOCRYSTALLINE IRON THIN FILMS | Author keyword | 2 | 67% | 1% | 2 |
| 6 | PHOTOACOUSTIC SIGNAL INTENSITY | Author keyword | 2 | 67% | 1% | 2 |
| 7 | TOTAL REFLECTION X RAY | Author keyword | 2 | 67% | 1% | 2 |
| 8 | TRXPS | Author keyword | 2 | 67% | 1% | 2 |
| 9 | GAS AGGREGATION TECHNIQUE | Author keyword | 1 | 50% | 1% | 2 |
| 10 | GIXPS | Author keyword | 1 | 100% | 1% | 2 |
Web of Science journal categories |
Author Key Words |
Key Words Plus |
| Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
|---|---|---|---|---|---|
| 1 | OXIDIZED GAAS100 | 24 | 91% | 4% | 10 |
| 2 | ELECTRON YIELD XAS | 4 | 75% | 1% | 3 |
| 3 | CONCENTRATED SAMPLES | 2 | 50% | 1% | 3 |
| 4 | GAS MICROSTRIP DETECTORS | 1 | 50% | 1% | 2 |
| 5 | PHOTOACOUSTIC RESPONSE | 1 | 50% | 0% | 1 |
| 6 | CRYSTAL MONOCHROMATOR | 1 | 13% | 2% | 5 |
| 7 | FINE STRUCTURE MEASUREMENTS | 0 | 25% | 0% | 1 |
| 8 | CURVED WAVE | 0 | 13% | 1% | 2 |
| 9 | AMORPHOUS ARSENIC SULFIDE | 0 | 20% | 0% | 1 |
| 10 | PHOTOELECTRON SCATTERING | 0 | 20% | 0% | 1 |
Journals |
Reviews |
| Title | Publ. year | Cit. | Active references |
% act. ref. to same field |
|---|---|---|---|---|
| Total reflection X-ray photoelectron spectroscopy: A review | 2010 | 2 | 44 | 55% |
| PHOTOACOUSTIC X-RAY ABSORPTION-SPECTROSCOPY | 1988 | 2 | 1 | 100% |
Address terms |
| Rank | Address term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
|---|---|---|---|---|---|
| 1 | CRYSTAL TECHNOL DEV | 3 | 100% | 1.1% | 3 |
| 2 | FRITZ HABER ABT ANORGAN CHEM | 1 | 50% | 0.4% | 1 |
| 3 | SPLINE SPANISH CRG | 1 | 50% | 0.4% | 1 |
| 4 | THOMSON CSF | 1 | 50% | 0.4% | 1 |
| 5 | IND CHEM BUNKYO KU | 1 | 25% | 0.7% | 2 |
| 6 | SPLINE SPANISH CRG BEAMLINE | 0 | 11% | 1.5% | 4 |
| 7 | IPOE | 0 | 18% | 0.7% | 2 |
| 8 | KANTO TECH | 0 | 12% | 1.1% | 3 |
| 9 | DEV DISASTER PREVENT MANAGEMENT | 0 | 25% | 0.4% | 1 |
| 10 | SWISS LIGHT SOURCE PROJECT | 0 | 13% | 0.4% | 1 |
Related classes at same level (level 1) |
| Rank | Relatedness score | Related classes |
|---|---|---|
| 1 | 0.0000219184 | MEAN SQUARE RELATIVE DISPLACEMENT//BIOL PHYS CHEM SCI//SPHERICAL WAVE EFFECTS |
| 2 | 0.0000158015 | QEXAFS//ENERGY DISPERSIVE EXAFS//QUICK EXAFS |
| 3 | 0.0000149203 | AUAL2//PTAL2//KONSTANTINOV PETERBURG NUCL PHYS |
| 4 | 0.0000118412 | XEOL//CAPACITANCE XAFS//OD XAS |
| 5 | 0.0000106891 | EELFS//TUNGSTEN 100 SURFACE//ATOMIC PAIR CORRELATION FUNCTION |
| 6 | 0.0000098996 | AU NI50FE50//ECS ENGN//CIENCIAS FIS LCFIS |
| 7 | 0.0000087285 | IR RAMAN GRP//CATALYTIC COPPER DEPOSITION//ELECTROMENISCUS PHENOMENON |
| 8 | 0.0000067882 | TOTAL EXTERNAL REFLECTION//X RAY STANDING WAVES//LAYERED SYNTHETIC MICROSTRUCTURES |
| 9 | 0.0000065467 | ELECTRON BEAM ANNEALING//RAFTER//ION BEAM SYNTHESIS IBS |
| 10 | 0.0000064872 | LEEIXS//SOFT X RAY SPECTROMETRY//SIO2 NA2O BINARY SLAG |