Class information for: |
Basic class information |
ID | Publications | Average number of references |
Avg. shr. active ref. in WoS |
---|---|---|---|
24211 | 267 | 18.7 | 33% |
Classes in level above (level 2) |
ID, lev. above |
Publications | Label for level above |
---|---|---|
803 | 11388 | ULTRAMICROSCOPY//MICROSCOPY//ELECTRON HOLOGRAPHY |
Terms with highest relevance score |
Rank | Term | Type of term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|---|
1 | ENGN 36 | Address | 1 | 38% | 1% | 3 |
2 | MINIMUM MASS FRACTION | Author keyword | 1 | 50% | 1% | 2 |
3 | QUANTITATIVE X RAY MAPPING | Author keyword | 1 | 100% | 1% | 2 |
4 | THIN SPECIMENS | Author keyword | 1 | 50% | 1% | 2 |
5 | WHITAKER 5 | Address | 1 | 50% | 1% | 2 |
6 | ABSORPTION CORRECTION | Author keyword | 1 | 20% | 1% | 4 |
7 | HIGH VOLTAGE ELE ON MICROSCOPY | Address | 1 | 12% | 2% | 6 |
8 | 3D ATOM PROBE TOMOGRAPHY | Author keyword | 1 | 50% | 0% | 1 |
9 | CLIFF LORIMER FACTOR | Author keyword | 1 | 50% | 0% | 1 |
10 | CROSS SECTIONED SAMPLES | Author keyword | 1 | 50% | 0% | 1 |
Web of Science journal categories |
Author Key Words |
Key Words Plus |
Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | ANALYTICAL ELECTRON MICROSCOPE | 10 | 38% | 8% | 21 |
2 | QUANTITATIVE MICROANALYSIS | 1 | 33% | 1% | 3 |
3 | ABSORPTION CORRECTION | 1 | 11% | 3% | 7 |
4 | FOIL THICKNESS | 1 | 12% | 2% | 6 |
5 | DIFFUSION COUPLE INTERFACE | 1 | 25% | 1% | 2 |
6 | CLIFF LORIMER | 0 | 33% | 0% | 1 |
7 | COPPER BISMUTH ALLOYS | 0 | 13% | 1% | 2 |
8 | DISORDERED GAMMA | 0 | 20% | 0% | 1 |
9 | BASE SUPER ALLOYS | 0 | 17% | 0% | 1 |
10 | BEAM DIFFRACTION PATTERNS | 0 | 17% | 0% | 1 |
Journals |
Reviews |
Title | Publ. year | Cit. | Active references |
% act. ref. to same field |
---|---|---|---|---|
Microscopy Hacks: development of various techniques to assist quantitative nanoanalysis and advanced electron microscopy | 2013 | 3 | 35 | 29% |
Two-dimensional quantitative mapping of arsenic in nanometer-scale silicon devices using STEM EELS-EDX spectroscopy | 2009 | 5 | 13 | 15% |
ENERGY DISPERSIVE-X-RAY MICROANALYSIS IN THE ANALYTICAL ELECTRON-MICROSCOPE | 1989 | 11 | 12 | 50% |
Quantitative chemical analysis of ocular melanosomes in the TEM | 2006 | 11 | 13 | 15% |
ANALYTICAL ELECTRON-MICROSCOPY OF HETEROGENEOUS CATALYST PARTICLES | 1984 | 1 | 6 | 17% |
Address terms |
Rank | Address term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | ENGN 36 | 1 | 38% | 1.1% | 3 |
2 | WHITAKER 5 | 1 | 50% | 0.7% | 2 |
3 | HIGH VOLTAGE ELE ON MICROSCOPY | 1 | 12% | 2.2% | 6 |
4 | CSIC GRP | 1 | 50% | 0.4% | 1 |
5 | UNIDAD BERNARDO QUINTANA | 1 | 50% | 0.4% | 1 |
6 | MECH ENGN PROC TECHNOL | 0 | 14% | 0.7% | 2 |
7 | MECAN PHYS INTER ES | 0 | 25% | 0.4% | 1 |
8 | LEHRSTUHL NANOPARTIKEL PROZESSTECH | 0 | 20% | 0.4% | 1 |
9 | CNRSURA 1884 | 0 | 17% | 0.4% | 1 |
10 | COMBUST GAS DYNAM IVG | 0 | 17% | 0.4% | 1 |
Related classes at same level (level 1) |
Rank | Relatedness score | Related classes |
---|---|---|
1 | 0.0000272753 | EFTEM//ENERGY FILTERING TRANSMISSION ELECTRON MICROSCOPY EFTEM//SPECTRUM IMAGING |
2 | 0.0000184408 | CADMIUM YELLOW//ELECTRON BACKSCATTERING COEFFICIENT//EYE CATARACTS |
3 | 0.0000169432 | EMCD//ELECTRON MAGNETIC CIRCULAR DICHROISM//INELASTIC ELECTRON SCATTERING THEORY |
4 | 0.0000154496 | STANDARDLESS ANALYSIS//FU 160//TRITIUM ANALYSIS |
5 | 0.0000118027 | X RAY MICROANALYSIS//BIOLOGICAL X RAY MICROANALYSIS//DIFFUSIBLE IONS |
6 | 0.0000107572 | NON EQUILIBRIUM SEGREGATION//TEMPER EMBRITTLEMENT//REVERSE TEMPER EMBRITTLEMENT |
7 | 0.0000094007 | GRAIN BOUNDARY WETTING//LIQUID GROOVING//MAT INTER E |
8 | 0.0000089029 | ENGN PLICAT RADIOISOTOPES//MONTECUCCOLINO//PROV PL NUCL TECH GEOSCI |
9 | 0.0000087733 | KUPA RIVER DRAINAGE BASIN//ALUMINUM INTERFERENCE//RIVERS OF KOSOVO |
10 | 0.0000082786 | TETRATAENITE//ENGN 313//PHYS TECH DEVICES QUAL CONTROL |