Class information for:
Level 1: ELECTRICALLY DETECTED MAGNETIC RESONANCE//EDMR//BERLIN JOINT EPR

Basic class information
ID Publications Average number
of references		 Avg. shr. active
ref. in WoS
23924 276 25.2 55%


Bar chart of Publication_year

Last years might be incomplete

Classes in level above (level 2)


ID, lev.
above		 Publications Label for level above
3499 1019 ORGANIC SPINTRONICS//ORGANIC MAGNETORESISTANCE//ORGANIC SPIN VALVE

Terms with highest relevance score


Rank Term Type of term Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class
1 ELECTRICALLY DETECTED MAGNETIC RESONANCE Author keyword 15 67% 5% 14
2 EDMR Author keyword 4 36% 4% 10
3 BERLIN JOINT EPR Address 3 57% 1% 4
4 EDEPR Author keyword 2 67% 1% 2
5 ABT SILIZIUM PHOTOVOLTAIK Address 1 17% 3% 8
6 SPIN DEPENDENT RECOMBINATION Author keyword 1 25% 2% 5
7 SILIZIUM PHOTOVOLTA Address 1 10% 3% 8
8 CV CHARACTERISTIC Author keyword 1 50% 0% 1
9 ELECTRICALLY DETECTED MAGNETIC RESONANCE EDMR Author keyword 1 50% 0% 1
10 ENERGIEFOR PHOTOVOLTA Address 1 50% 0% 1

Web of Science journal categories

Author Key Words


Rank Web of Science journal category Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class		 LCSH search Wikipedia search
1 ELECTRICALLY DETECTED MAGNETIC RESONANCE 15 67% 5% 14 Search ELECTRICALLY+DETECTED+MAGNETIC+RESONANCE Search ELECTRICALLY+DETECTED+MAGNETIC+RESONANCE
2 EDMR 4 36% 4% 10 Search EDMR Search EDMR
3 EDEPR 2 67% 1% 2 Search EDEPR Search EDEPR
4 SPIN DEPENDENT RECOMBINATION 1 25% 2% 5 Search SPIN+DEPENDENT+RECOMBINATION Search SPIN+DEPENDENT+RECOMBINATION
5 CV CHARACTERISTIC 1 50% 0% 1 Search CV+CHARACTERISTIC Search CV+CHARACTERISTIC
6 ELECTRICALLY DETECTED MAGNETIC RESONANCE EDMR 1 50% 0% 1 Search ELECTRICALLY+DETECTED+MAGNETIC+RESONANCE+EDMR Search ELECTRICALLY+DETECTED+MAGNETIC+RESONANCE+EDMR
7 SILICON JUNCTION DIODES 1 50% 0% 1 Search SILICON+JUNCTION+DIODES Search SILICON+JUNCTION+DIODES
8 TRIPLET CENTERS 1 50% 0% 1 Search TRIPLET+CENTERS Search TRIPLET+CENTERS
9 A SIH TFTS 0 20% 0% 1 Search A+SIH+TFTS Search A+SIH+TFTS
10 IRON IN SILICON 0 20% 0% 1 Search IRON+IN+SILICON Search IRON+IN+SILICON

Key Words Plus


Rank Web of Science journal category Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class
1 SPIN DEPENDENT RECOMBINATION 32 49% 17% 48
2 DEPENDENT PHOTOCONDUCTIVITY 4 75% 1% 3
3 DEPENDENT RECOMBINATION 4 27% 4% 12
4 N JUNCTION DIODES 3 23% 4% 12
5 SPIN DEPENDENT PHOTOCONDUCTIVITY 3 40% 2% 6
6 TIME DOMAIN MEASUREMENT 1 33% 1% 3
7 INDUCED ESR CENTERS 1 50% 0% 1
8 LOCAL LATTICE STRAIN 1 50% 0% 1
9 P RELATED DEFECTS 1 50% 0% 1
10 NEUTRAL IMPURITY SCATTERING 1 25% 1% 2

Journals

Reviews


Title Publ. year Cit. Active
references		 % act. ref.
to same field
RECENT DEVELOPMENTS IN ELECTRON-SPIN-RESONANCE TECHNIQUES AND RESULTS FOR SEMICONDUCTOR SURFACE REGIONS 1984 8 11 27%
EPR OF SOLID-STATE SURFACE 1989 11 54 13%
CHARACTERIZATION OF IMPURITIES AND DEFECTS BY ELECTRON-PARAMAGNETIC RESONANCE AND RELATED TECHNIQUES 1983 1 38 18%

Address terms


Rank Address term Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ.
in class
1 BERLIN JOINT EPR 3 57% 1.4% 4
2 ABT SILIZIUM PHOTOVOLTAIK 1 17% 2.9% 8
3 SILIZIUM PHOTOVOLTA 1 10% 2.9% 8
4 ENERGIEFOR PHOTOVOLTA 1 50% 0.4% 1
5 ENERGIEFOR PHOTOVOLTAIK 1 50% 0.4% 1
6 OPTOELE ON MAT MOL 1 50% 0.4% 1
7 ABT SILIZIUM PHOTOVOLTA 0 15% 1.1% 3
8 ABT SILIZIUM PHOTOVALTAIK 0 33% 0.4% 1
9 ENERGIE KLIMAFOR PHOTOVOLTA 5 0 33% 0.4% 1
10 ABT HETEROGENE MAT SYST 0 20% 0.4% 1

Related classes at same level (level 1)


Rank Relatedness score Related classes
1 0.0000216581 ORGANIC SPINTRONICS//ORGANIC MAGNETORESISTANCE//ORGANIC SPIN VALVE
2 0.0000178394 OPTIMIZATION OF ANNEALING//ERBIUM RELATED CENTRES//SELF ASSEMBLED SILICON QUANTUM WELLS
3 0.0000156164 QUANTUM SPIN INFORMAT PROJECT//SPIN QUBIT//QUANTUM COMP TECHNOL
4 0.0000104877 OXIDE TRAPPED CHARGE//ELDRS//TOTAL IONIZING DOSE
5 0.0000078943 JOINT HIGH TECHNOL//STEADY STATE PHOTOCARRIER GRATING//JOINT HIGHTECHNOL
6 0.0000070661 CLUSTER OF DEFECTS//GROUP II ELEMENTS//SI CD
7 0.0000057177 MANUFACTURING MESSAGE SPECIFICATION MMS//VIRTUAL MANUFACTURING DEVICE VMD//MANUFACTURING MESSAGE SPECIFICATION
8 0.0000053634 POLYPHENYLENE VINYLENE AND DERIVATIVES//POLYP PHENYLENE VINYLENE//OEM GRP
9 0.0000052707 EPITAXIAL AL2O3//AL2O3 ON SI//DENVER AEROSP TECH OPERAT
10 0.0000052476 GETTERING//GETTERING EFFICIENCY//SI AU