Class information for: |
Basic class information |
| ID | Publications | Average number of references |
Avg. shr. active ref. in WoS |
|---|---|---|---|
| 23610 | 285 | 11.7 | 40% |
Classes in level above (level 2) |
| ID, lev. above |
Publications | Label for level above |
|---|---|---|
| 1597 | 6577 | ELLIPSOMETRY//MUELLER MATRIX//NANOOPT PROPERTY |
Terms with highest relevance score |
| Rank | Term | Type of term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
|---|---|---|---|---|---|---|
| 1 | ABSORBING SUBSTRATE | Author keyword | 3 | 50% | 1% | 4 |
| 2 | SINGLE LAYER COATING | Author keyword | 3 | 50% | 1% | 4 |
| 3 | ELLIPSOMETRY PLICAT S | Address | 2 | 67% | 1% | 2 |
| 4 | TERAHERTZ POLARIZER | Author keyword | 2 | 67% | 1% | 2 |
| 5 | PHASE RETARDERS | Author keyword | 2 | 33% | 1% | 4 |
| 6 | ACHROMATIC QUARTER WAVE RETARDER | Author keyword | 1 | 100% | 1% | 2 |
| 7 | BROAD AND WIDE ANGLE | Author keyword | 1 | 100% | 1% | 2 |
| 8 | INFRARED POLARIZATION OPTICS | Author keyword | 1 | 100% | 1% | 2 |
| 9 | REFLECTIVE POLARIZATION BEAM SPLITTER | Author keyword | 1 | 100% | 1% | 2 |
| 10 | SYMMETRICAL THIN FILM STRUCTURE | Author keyword | 1 | 100% | 1% | 2 |
Web of Science journal categories |
Author Key Words |
Key Words Plus |
| Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
|---|---|---|---|---|---|
| 1 | PHASE RETARDERS | 7 | 53% | 3% | 9 |
| 2 | TOTALLY REFLECTING PRISMS | 3 | 57% | 1% | 4 |
| 3 | COMPLEX EPSILON PLANE | 3 | 100% | 1% | 3 |
| 4 | PSEUDO BREWSTER ANGLE | 3 | 50% | 1% | 4 |
| 5 | BEAM DISPLACER | 2 | 67% | 1% | 2 |
| 6 | POLARIZED POLYCHROMATIC BEAM | 2 | 67% | 1% | 2 |
| 7 | ELLIPSOMETRIC FUNCTION | 1 | 40% | 1% | 2 |
| 8 | PERPENDICULAR POLARIZATIONS | 1 | 50% | 0% | 1 |
| 9 | OPTICALLY ACTIVE MEDIUM | 1 | 25% | 1% | 2 |
| 10 | WAVE RETARDER | 0 | 33% | 0% | 1 |
Journals |
Reviews |
| Title | Publ. year | Cit. | Active references |
% act. ref. to same field |
|---|---|---|---|---|
| Impedance model for quantum-mechanical barrier problems | 2007 | 7 | 6 | 17% |
Address terms |
| Rank | Address term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
|---|---|---|---|---|---|
| 1 | ELLIPSOMETRY PLICAT S | 2 | 67% | 0.7% | 2 |
| 2 | ELLIPSOMETRY PLICAT | 1 | 50% | 0.4% | 1 |
| 3 | PARTICLE TECHNOL ENVIRONM ENGN | 0 | 13% | 0.4% | 1 |
| 4 | ISFAHAN QUANTUM OPT GRP | 0 | 11% | 0.4% | 1 |
| 5 | IMPROVEMENT PROFESS SKILLS STAFF RETRAININ | 0 | 100% | 0.4% | 1 |
| 6 | OPT METEROL | 0 | 100% | 0.4% | 1 |
Related classes at same level (level 1) |
| Rank | Relatedness score | Related classes |
|---|---|---|
| 1 | 0.0000194452 | VISIBLE SPECTRAL REGION//INFRARED MULTILAYER//MECHATRON DEVICES 1 |
| 2 | 0.0000129386 | ALUMINUM DOPED ZINC OXIDE ZNOAL//ABELES EQUATIONS//OPTICAL CONDUCTIVITY MEASUREMENT |
| 3 | 0.0000108020 | MUELLER MATRIX//SHENZHEN MINIMAL INVAS MED TECHNOL//BIOPHYS BIOIMAGING |
| 4 | 0.0000105857 | IMAGING ELLIPSOMETRY//TOTAL INTERNAL REFLECTION ELLIPSOMETRY//ROTATING POLARIZER ANALYZER ELLIPSOMETER |
| 5 | 0.0000099206 | DISPERSION FREE OPERATION//MEASUREMENT OF DISPLACEMENTS//THIN FILM PROD GRP |
| 6 | 0.0000097656 | END HALL ION GUN//MWIR REGION//LENS ENGN DEV |
| 7 | 0.0000083454 | PHOTOELECT EQUIPMENT//SPACE RETROREFLECTOR//CUBE CORNER RETROREFLECTOR |
| 8 | 0.0000070815 | MFG LOGIST TECHNOL//NONNORMAL INCIDENCE//SIGNAL AVERAGING EFFECT |
| 9 | 0.0000068896 | GRP OPT INTER ES//CONICAL REFRACTION//INTERNAL CONICAL REFRACTION |
| 10 | 0.0000062050 | NANOOPT PROPERTY//PLASMA PHYS PLASMA SOURCES//NON UNIFORM THIN FILMS |