Class information for: |
Basic class information |
ID | Publications | Average number of references |
Avg. shr. active ref. in WoS |
---|---|---|---|
23152 | 301 | 13.9 | 34% |
Classes in level above (level 2) |
ID, lev. above |
Publications | Label for level above |
---|---|---|
1684 | 6200 | ADV SUBSUR E IMAGING//PHOTODETECTORS//PHOTODIODES |
Terms with highest relevance score |
Rank | Term | Type of term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|---|
1 | ADV SUBSUR E IMAGING | Address | 30 | 79% | 6% | 19 |
2 | TRANSITION DURATION | Author keyword | 10 | 73% | 3% | 8 |
3 | SAMPLING OSCILLOSCOPE | Author keyword | 5 | 45% | 3% | 9 |
4 | OSCILLOSCOPES | Author keyword | 5 | 35% | 4% | 12 |
5 | WAVEFORM METROLOGY | Author keyword | 4 | 67% | 1% | 4 |
6 | NOSE TO NOSE CALIBRATION | Author keyword | 4 | 75% | 1% | 3 |
7 | SAMPLER CALIBRATION | Author keyword | 3 | 60% | 1% | 3 |
8 | QUANTUM ELECT METROL | Address | 3 | 29% | 3% | 8 |
9 | SAMPLING OSCILLOSCOPES | Author keyword | 2 | 50% | 1% | 3 |
10 | DATA RECORDING TIME | Author keyword | 1 | 100% | 1% | 2 |
Web of Science journal categories |
Author Key Words |
Key Words Plus |
Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | SAMPLING OSCILLOSCOPES | 9 | 48% | 4% | 13 |
2 | OSCILLOSCOPES | 8 | 70% | 2% | 7 |
3 | TIME VARYING ERRORS | 8 | 100% | 2% | 5 |
4 | NETWORK ANALYZER MEASUREMENTS | 6 | 71% | 2% | 5 |
5 | BASE DISTORTION | 3 | 100% | 1% | 3 |
6 | TIME BASE DISTORTION | 3 | 100% | 1% | 3 |
7 | KICK OUT PULSES | 2 | 67% | 1% | 2 |
8 | STEP RESPONSE DATA | 2 | 67% | 1% | 2 |
9 | DATA ACQUISITION CHANNELS | 2 | 33% | 1% | 4 |
10 | NOSE CALIBRATION PROCEDURE | 1 | 40% | 1% | 2 |
Journals |
Reviews |
Title | Publ. year | Cit. | Active references |
% act. ref. to same field |
---|---|---|---|---|
50 years of RF and microwave sampling | 2003 | 36 | 62 | 48% |
Address terms |
Rank | Address term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | ADV SUBSUR E IMAGING | 30 | 79% | 6.3% | 19 |
2 | QUANTUM ELECT METROL | 3 | 29% | 2.7% | 8 |
3 | ELECT ELECT ENGN TECHNOL ADM | 1 | 50% | 0.7% | 2 |
4 | LAW ENFORCEMENT STAND OFF | 1 | 50% | 0.7% | 2 |
5 | MGE | 1 | 40% | 0.7% | 2 |
6 | ELECT MICROELECT DEMIC | 1 | 50% | 0.3% | 1 |
7 | ELECT TW | 1 | 50% | 0.3% | 1 |
8 | DEV 6 | 0 | 33% | 0.3% | 1 |
9 | MICROWAVE RUMENTS | 0 | 33% | 0.3% | 1 |
10 | OFF LAW ENFORCEMENT STAND | 0 | 15% | 0.7% | 2 |
Related classes at same level (level 1) |
Rank | Relatedness score | Related classes |
---|---|---|
1 | 0.0000248297 | GALNAS//SULFUR DOPED INP//LASER AND LASER APPLICATIONS |
2 | 0.0000177339 | LIDFT//ADC TESTING//INTERPOLATED DFT |
3 | 0.0000131304 | ROTATION MAGNETIZATION//ELECTRO OPTIC SAMPLING//ELECTROOPTIC PROBING |
4 | 0.0000131249 | INTELLIGENT CYCLIC A D CONVERTERS//CYCLIC A D CONVERTERS//MULTI FUNCTIONAL SENSING |
5 | 0.0000126248 | IN CIRCUIT MEASUREMENT//COMPUTER AIDED DESIGN CAD TECHNIQUES//HIGH POWER RF TRANSISTORS |
6 | 0.0000114769 | LARGE SIGNAL MODEL//NONLINEAR MEASUREMENTS//MESFETS |
7 | 0.0000099365 | GROUP DELAY COMPENSATION//MAGNETIC FLUX SENSOR//NONLINEAR MATRIX SECOND ORDER SYSTEMS |
8 | 0.0000094101 | IEC 60060 1//LIGHTNING IMPULSE WITHSTAND VOLTAGE TEST//LIGHTNING IMPULSE VOLTAGE TEST |
9 | 0.0000080550 | SUPERREGENERATIVE RECEIVER//PULSE GENERATOR//SUPER REGENERATIVE RECEIVER |
10 | 0.0000077092 | AC DC TRANSFER//THERMAL CONVERTERS//AC DC DIFFERENCE |