Class information for: |
Basic class information |
ID | Publications | Average number of references |
Avg. shr. active ref. in WoS |
---|---|---|---|
22914 | 308 | 21.4 | 32% |
Classes in level above (level 2) |
ID, lev. above |
Publications | Label for level above |
---|---|---|
2235 | 4296 | QUANTUM WELL STATES//IMAGE POTENTIAL STATES//MAT FIS SAILA |
Terms with highest relevance score |
Rank | Term | Type of term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|---|
1 | PHOTOFIELD EMISSION | Author keyword | 5 | 63% | 2% | 5 |
2 | ELECTRON PLASMON INTERACTION | Author keyword | 1 | 100% | 1% | 2 |
3 | PHOTOFIELD EMISSION CURRENT | Author keyword | 1 | 100% | 1% | 2 |
4 | SURFACE DENSITY OF STATES | Author keyword | 1 | 50% | 1% | 2 |
5 | SURFACE PHOTOEXCITATION | Author keyword | 1 | 100% | 1% | 2 |
6 | PACHHUNGA | Address | 1 | 50% | 0% | 1 |
7 | PHOTOFIELD | Author keyword | 1 | 50% | 0% | 1 |
8 | POTENTIAL WELL MODEL | Author keyword | 1 | 50% | 0% | 1 |
9 | SURFACE RESONANCES | Author keyword | 1 | 50% | 0% | 1 |
10 | INDUCTIVE ENERGY STORAGE IES | Author keyword | 0 | 33% | 0% | 1 |
Web of Science journal categories |
Author Key Words |
Key Words Plus |
Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | PHOTOFIELD EMISSION SPECTROSCOPY | 15 | 88% | 2% | 7 |
2 | IMAGE POTENTIALS | 11 | 100% | 2% | 6 |
3 | PHOTOFIELD EMISSION | 7 | 57% | 3% | 8 |
4 | CU ADSORPTION | 1 | 33% | 1% | 2 |
5 | SIZED METALLIC CLUSTERS | 1 | 33% | 1% | 2 |
6 | 2 LASER FIELDS | 1 | 50% | 0% | 1 |
7 | CHARGE INTERACTION | 1 | 50% | 0% | 1 |
8 | METAL SURFACE INTERACTION | 1 | 50% | 0% | 1 |
9 | THERMAL FIELD EMISSION | 1 | 50% | 0% | 1 |
10 | MODEL SEMICONDUCTOR | 0 | 33% | 0% | 1 |
Journals |
Reviews |
Title | Publ. year | Cit. | Active references |
% act. ref. to same field |
---|---|---|---|---|
Dynamical image forces near semiconductor-vacuum interfaces and in vacuum interlayers between semiconductors | 2001 | 2 | 75 | 37% |
Excess nonspecific Coulomb ion adsorption at the metal electrode/electrolyte solution interface: Role of the surface layer | 2006 | 7 | 76 | 17% |
Address terms |
Rank | Address term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | PACHHUNGA | 1 | 50% | 0.3% | 1 |
2 | FIS MAT CONDENSADA C12 | 0 | 100% | 0.3% | 1 |
3 | MAC DINH CHI 1 | 0 | 100% | 0.3% | 1 |
Related classes at same level (level 1) |
Rank | Relatedness score | Related classes |
---|---|---|
1 | 0.0000145705 | ACOUSTIC SURFACE PLASMON//SURFACE PLASMON DISPERSION//SURFACE PLASMON LIFETIME |
2 | 0.0000101484 | AUGER TRANSISTOR//SELF CONSISTENT QUANTUM WELLS//CE2CUGE6 |
3 | 0.0000098118 | VEELS//ELECTRON ENERGY FILTER//LOW VOLTAGE EELS |
4 | 0.0000092649 | CHEMISORPTION PROCESS//ANDERSON NEWNS MODEL//VAN HOVE SCENARIO |
5 | 0.0000074751 | LOCAL TUNNELING BARRIER HEIGHT//LOCAL TUNNELING BARRIER HEIGHT LBH//I S CHARACTERISTICS |
6 | 0.0000073910 | SECONDARY ELECTRON EMISSION SPECTRA//AA GALKIN DONETSK PHYS TECHNOL//CONJUGATED ORGANIC MOLECULES |
7 | 0.0000070788 | IMAGE POTENTIAL STATES//SHOCKLEY SURFACE STATE//UMR 8625 |
8 | 0.0000065251 | CHAIR QUANTUM RADIO PHYS//X RAY EXCITED CURRENT//SHERMAN FAIRCHILD SOLID STATE STUDIES |
9 | 0.0000061715 | HARTMAN EFFECT//SCUOLA SPECIALIZZAZ OTT//TUNNELING TIME |
10 | 0.0000059537 | SI111 2X1//CROSS SECTIONAL STM//IV PHYS |