Class information for: |
Basic class information |
ID | Publications | Average number of references |
Avg. shr. active ref. in WoS |
---|---|---|---|
22040 | 339 | 22.3 | 53% |
Classes in level above (level 2) |
ID, lev. above |
Publications | Label for level above |
---|---|---|
803 | 11388 | ULTRAMICROSCOPY//MICROSCOPY//ELECTRON HOLOGRAPHY |
Terms with highest relevance score |
Rank | Term | Type of term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|---|
1 | EMCD | Author keyword | 9 | 83% | 1% | 5 |
2 | ELECTRON MAGNETIC CIRCULAR DICHROISM | Author keyword | 4 | 75% | 1% | 3 |
3 | INELASTIC ELECTRON SCATTERING THEORY | Author keyword | 3 | 60% | 1% | 3 |
4 | DYNAMIC FORM FACTOR | Author keyword | 2 | 67% | 1% | 2 |
5 | INTERSECTING KIKUCHI LINE METHOD | Author keyword | 2 | 67% | 1% | 2 |
6 | ELECTRON ENERGY LOSS SPECTROMETRY | Author keyword | 2 | 26% | 2% | 7 |
7 | ALCHEMI | Author keyword | 2 | 22% | 2% | 8 |
8 | ENERGY LOSS SPECTROMETRY | Author keyword | 1 | 50% | 1% | 2 |
9 | LMSSMAT | Address | 1 | 20% | 1% | 5 |
10 | ELECTRON CHANNELING | Author keyword | 1 | 17% | 2% | 6 |
Web of Science journal categories |
Author Key Words |
Key Words Plus |
Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | ALCHEMI | 16 | 49% | 7% | 24 |
2 | EMCD EXPERIMENTS | 11 | 100% | 2% | 6 |
3 | DELOCALIZATION CORRECTIONS | 9 | 83% | 1% | 5 |
4 | ATOMIC SITE | 8 | 100% | 1% | 5 |
5 | ENHANCED MICROANALYSIS | 8 | 100% | 1% | 5 |
6 | CHANNELING ENHANCED MICROANALYSIS | 6 | 50% | 3% | 9 |
7 | ELECTRON CHANNELING ANALYSIS | 4 | 67% | 1% | 4 |
8 | ATOM LOCATION | 4 | 41% | 2% | 7 |
9 | DYNAMIC FORM FACTOR | 2 | 44% | 1% | 4 |
10 | TEMPERATURE DIFFUSE SCATTERING | 2 | 67% | 1% | 2 |
Journals |
Reviews |
Title | Publ. year | Cit. | Active references | % act. ref. to same field |
---|---|---|---|---|
The physical significance of the mixed dynamic form factor | 2000 | 29 | 28 | 71% |
Generation and absorption of characteristic X-rays under dynamical electron diffraction conditions | 1997 | 23 | 18 | 78% |
EMCD real space maps of Magnetospirillum magnetotacticum | 2011 | 6 | 18 | 50% |
Energy-loss magnetic chiral dichroism (EMCD): Magnetic chiral dichroism in the electron microscope | 2008 | 9 | 17 | 59% |
Transition probability functions for applications of inelastic electron scattering | 2012 | 2 | 10 | 70% |
Determining the locations of chemical species in ordered compounds: ALCHEMI | 2002 | 6 | 173 | 50% |
ELECTRON ENERGY-LOSS SPECTROSCOPY (EELS) AND ELECTRON CHANNELING (ALCHEMI) | 1992 | 6 | 27 | 52% |
THEORY OF IMAGE-FORMATION BY INELASTICALLY SCATTERED ELECTRONS IN THE ELECTRON-MICROSCOPE | 1985 | 169 | 24 | 17% |
THIN-FILM ELEMENTAL ANALYSES FOR PRECISE CHARACTERIZATION OF MINERALS | 1989 | 0 | 21 | 62% |
ELECTRON ENERGY-LOSS SPECTROSCOPY - FUNDAMENTALS AND APPLICATIONS IN THE CHARACTERIZATION OF MINERALS | 1989 | 0 | 25 | 36% |
Address terms |
Rank | Address term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | LMSSMAT | 1 | 20% | 1.5% | 5 |
2 | UNIV SERV TRANSMISS ELE ON MICROSCOPY | 1 | 13% | 2.1% | 7 |
3 | URA 850 | 1 | 20% | 1.2% | 4 |
4 | UNIV SERV ELE ON MICROSCOPY | 1 | 33% | 0.6% | 2 |
5 | CIME LSME | 1 | 50% | 0.3% | 1 |
6 | FESTKORPERPHYS F | 1 | 50% | 0.3% | 1 |
7 | SERV TEM | 1 | 50% | 0.3% | 1 |
8 | UMR UPMC FRANCE CNRS 7574 | 1 | 50% | 0.3% | 1 |
9 | UNIV TRANSMISS ELECT MICROSCOPY | 1 | 50% | 0.3% | 1 |
10 | SERV ELE ON MICROSCOPY | 1 | 25% | 0.6% | 2 |
Related classes at same level (level 1) |
Rank | Relatedness score | Related classes |
---|---|---|
1 | 0.0000256892 | ULTRAMICROSCOPY//ABERRATION CORRECTION//DEPTH SECTIONING |
2 | 0.0000253965 | EFTEM//ENERGY FILTERING TRANSMISSION ELECTRON MICROSCOPY EFTEM//SPECTRUM IMAGING |
3 | 0.0000219305 | CONVERGENT BEAM ELECTRON DIFFRACTION//PRECESSION ELECTRON DIFFRACTION//CBED |
4 | 0.0000169432 | ENGN 36//MINIMUM MASS FRACTION//QUANTITATIVE X RAY MAPPING |
5 | 0.0000124072 | APPLICATION SPECIFIC PROCESSOR ARRAYS//BEAM CONVERGENCE//INDEX TRANSFORMATIONS |
6 | 0.0000122447 | VEELS//ELECTRON ENERGY FILTER//LOW VOLTAGE EELS |
7 | 0.0000116633 | ELNES//CORE HOLE EFFECTS//ENERGY LOSS NEAR EDGE STRUCTURES |
8 | 0.0000103639 | REG PHYSICOCHEM ANAL//DOUBLE DIFFRACTION//TRANSMISSION REFLECTION AND SCANNING ELECTRON MICROSCOPY INCLUDING EBIC MECHANICAL PROPERTIES OF SOLIDS |
9 | 0.0000097472 | ELECTRON HOLOGRAPHY//OFF AXIS ELECTRON HOLOGRAPHY//TRIEBENBERG |
10 | 0.0000091534 | REFINED BEAM UNIT//SI111ROOT 3 X ROOT 3 AL//REFLECTION ELECTRON MICROSCOPY REM |