Class information for:
Level 1: CARL EMILY FUCHS MICROELECT//CEFIM//EUROPEAN QUAL

Basic class information
ID Publications Average number
of references		 Avg. shr. active
ref. in WoS
21883 345 16.6 46%


Bar chart of Publication_year

Last years might be incomplete

Classes in level above (level 2)


ID, lev.
above		 Publications Label for level above
138 22619 IEEE TRANSACTIONS ON ELECTRON DEVICES//IEEE ELECTRON DEVICE LETTERS//SOLID-STATE ELECTRONICS

Terms with highest relevance score


Rank Term Type of term Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class
1 CARL EMILY FUCHS MICROELECT Address 9 47% 4% 15
2 CEFIM Address 6 100% 1% 4
3 EUROPEAN QUAL Address 3 100% 1% 3
4 HOT CARRIER LUMINESCENCE Author keyword 3 50% 1% 4
5 PICOSECOND IMAGING CIRCUIT ANALYSIS PICA Author keyword 3 60% 1% 3
6 INRF Address 2 67% 1% 2
7 ENS BEN SOUDA Address 1 100% 1% 2
8 INNOVAT ELECT SYST Address 1 100% 1% 2
9 SI LIGHT EMITTING DEVICES Author keyword 1 100% 1% 2
10 REG INTER E Address 1 33% 1% 2

Web of Science journal categories

Author Key Words


Rank Web of Science journal category Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ.
in class		 LCSH search Wikipedia search
1 HOT CARRIER LUMINESCENCE 3 50% 1% 4 Search HOT+CARRIER+LUMINESCENCE Search HOT+CARRIER+LUMINESCENCE
2 PICOSECOND IMAGING CIRCUIT ANALYSIS PICA 3 60% 1% 3 Search PICOSECOND+IMAGING+CIRCUIT+ANALYSIS+PICA Search PICOSECOND+IMAGING+CIRCUIT+ANALYSIS+PICA
3 SI LIGHT EMITTING DEVICES 1 100% 1% 2 Search SI+LIGHT+EMITTING+DEVICES Search SI+LIGHT+EMITTING+DEVICES
4 6H 1 50% 0% 1 Search 6H Search 6H
5 AVALANCHE ELECTROLUMINESCENCE 1 50% 0% 1 Search AVALANCHE+ELECTROLUMINESCENCE Search AVALANCHE+ELECTROLUMINESCENCE
6 CMOS INTEGRATED CIRCUIT TECHNOLOGY 1 50% 0% 1 Search CMOS+INTEGRATED+CIRCUIT+TECHNOLOGY Search CMOS+INTEGRATED+CIRCUIT+TECHNOLOGY
7 DISPLAY ARRAY 1 50% 0% 1 Search DISPLAY+ARRAY Search DISPLAY+ARRAY
8 FAILURE ANALYSIS IN ICS 1 50% 0% 1 Search FAILURE+ANALYSIS+IN+ICS Search FAILURE+ANALYSIS+IN+ICS
9 INTEGRATED CIRCUIT ANALYSIS 1 50% 0% 1 Search INTEGRATED+CIRCUIT+ANALYSIS Search INTEGRATED+CIRCUIT+ANALYSIS
10 LDD TYPE 1 50% 0% 1 Search LDD+TYPE Search LDD+TYPE

Key Words Plus


Rank Web of Science journal category Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class
1 HOT CARRIER LUMINESCENCE 8 60% 3% 9
2 INDUSTRIAL CMOS TECHNOLOGY 4 75% 1% 3
3 AVALANCHE BREAKDOWN 2 12% 5% 17
4 N CHANNEL MOSFETS 2 16% 3% 10
5 INTEGRATED CIRCUITRY 1 50% 1% 2
6 SILICON LEDS 1 100% 1% 2
7 SILICON MOSFETS 1 18% 2% 6
8 EMITTING DEVICE 1 40% 1% 2
9 ALGAAS GAAS HEMTS 1 19% 1% 4
10 SPACE CHARGE DOMAINS 1 18% 1% 4

Journals

Reviews


Title Publ. year Cit. Active
references		 % act. ref.
to same field
QUANTITATIVE EMISSION MICROSCOPY 1992 38 13 77%
FUNDAMENTALS OF LIGHT-EMISSION FROM SILICON DEVICES 1994 11 29 59%
Cross-linking water-reducible coatings by direct esterification 1996 0 5 40%

Address terms


Rank Address term Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class
1 CARL EMILY FUCHS MICROELECT 9 47% 4.3% 15
2 CEFIM 6 100% 1.2% 4
3 EUROPEAN QUAL 3 100% 0.9% 3
4 INRF 2 67% 0.6% 2
5 ENS BEN SOUDA 1 100% 0.6% 2
6 INNOVAT ELECT SYST 1 100% 0.6% 2
7 REG INTER E 1 33% 0.6% 2
8 CREDENCE DIAGNOST GRP 1 50% 0.3% 1
9 DIAGNOST CHARACTERIZAT GRP 1 50% 0.3% 1
10 RBD TECH SUPPORT 1 50% 0.3% 1

Related classes at same level (level 1)


Rank Relatedness score Related classes
1 0.0000157989 SIPM//SILICON PHOTOMULTIPLIER//SINGLE PHOTON AVALANCHE DIODE SPAD
2 0.0000131748 MOS TUNNELING DIODE//ELECTRON HOLE PLASMA RECOMBINATION//LATERAL NONUNIFORMITY LNU
3 0.0000106912 SECT PROD PROC QUAL//MATURITY INDEX ON RELIABILITY MIR//FAST FIELD FEEDBACK
4 0.0000104208 HOT CARRIER//CHANNEL INITIATED SECONDARY ELECTRON CHISEL//HOT CARRIER DEGRADATION
5 0.0000085133 BANDLIKE STATES//DISLOCATION ENGINEERED//RECOMBINATION STRENGTH
6 0.0000080442 ELECTRON BEAM TESTING//SOREP//VOLTAGE CONTRAST
7 0.0000071726 ULTRAHIGH FREQUENCY SEMICOND ELECT//INALAS INGAAS//HIGH ELECTRON MOBILITY TRANSISTORS
8 0.0000063583 SIDEWALL OXIDATION//COMPUTAT ELECT//MEMORY DEVICE BUSINESS
9 0.0000062419 NANOELECT GIGASCALE SYST//ELECTROSTATIC DISCHARGE ESD//SILICON CONTROLLED RECTIFIER SCR
10 0.0000059506 A AMA MICROELECT SCI TECHNOL//SIGEHBT//SIGE HBT