Class information for: |
Basic class information |
| ID | Publications | Average number of references |
Avg. shr. active ref. in WoS |
|---|---|---|---|
| 21764 | 349 | 16.2 | 39% |
Classes in level above (level 2) |
| ID, lev. above |
Publications | Label for level above |
|---|---|---|
| 2996 | 2105 | EPITAXIAL AL2O3//METAL INSULATOR HETEROSTRUCTURE//ALKALI HALIDES |
Terms with highest relevance score |
| Rank | Term | Type of term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
|---|---|---|---|---|---|---|
| 1 | EPITAXIAL AL2O3 | Author keyword | 24 | 91% | 3% | 10 |
| 2 | AL2O3 ON SI | Author keyword | 4 | 75% | 1% | 3 |
| 3 | DENVER AEROSP TECH OPERAT | Address | 1 | 100% | 1% | 2 |
| 4 | SI ON AL2O3 | Author keyword | 1 | 100% | 1% | 2 |
| 5 | SILICON ON SAPPHIRE | Author keyword | 1 | 16% | 2% | 6 |
| 6 | 110 ORIENTED | Author keyword | 1 | 50% | 0% | 1 |
| 7 | CRYSTALLINE AL2O3 | Author keyword | 1 | 50% | 0% | 1 |
| 8 | INTELLIGENT HUMAN SENSING SYST | Address | 1 | 50% | 0% | 1 |
| 9 | OXIDE FIXED CHARGES | Author keyword | 1 | 50% | 0% | 1 |
| 10 | PUNCH THROUGH VOLTAGE | Author keyword | 1 | 50% | 0% | 1 |
Web of Science journal categories |
Author Key Words |
| Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
LCSH search | Wikipedia search |
|---|---|---|---|---|---|---|---|
| 1 | EPITAXIAL AL2O3 | 24 | 91% | 3% | 10 | Search EPITAXIAL+AL2O3 | Search EPITAXIAL+AL2O3 |
| 2 | AL2O3 ON SI | 4 | 75% | 1% | 3 | Search AL2O3+ON+SI | Search AL2O3+ON+SI |
| 3 | SI ON AL2O3 | 1 | 100% | 1% | 2 | Search SI+ON+AL2O3 | Search SI+ON+AL2O3 |
| 4 | SILICON ON SAPPHIRE | 1 | 16% | 2% | 6 | Search SILICON+ON+SAPPHIRE | Search SILICON+ON+SAPPHIRE |
| 5 | 110 ORIENTED | 1 | 50% | 0% | 1 | Search 110+ORIENTED | Search 110+ORIENTED |
| 6 | CRYSTALLINE AL2O3 | 1 | 50% | 0% | 1 | Search CRYSTALLINE+AL2O3 | Search CRYSTALLINE+AL2O3 |
| 7 | OXIDE FIXED CHARGES | 1 | 50% | 0% | 1 | Search OXIDE+FIXED+CHARGES | Search OXIDE+FIXED+CHARGES |
| 8 | PUNCH THROUGH VOLTAGE | 1 | 50% | 0% | 1 | Search PUNCH+THROUGH+VOLTAGE | Search PUNCH+THROUGH+VOLTAGE |
| 9 | SI EPILAYER | 1 | 50% | 0% | 1 | Search SI+EPILAYER | Search SI+EPILAYER |
| 10 | ULTRA LARGE SCALE INTEGRATED CIRCUIT | 1 | 50% | 0% | 1 | Search ULTRA+LARGE+SCALE+INTEGRATED+CIRCUIT | Search ULTRA+LARGE+SCALE+INTEGRATED+CIRCUIT |
Key Words Plus |
| Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
|---|---|---|---|---|---|
| 1 | SI AL2O3 SI STRUCTURES | 8 | 100% | 1% | 5 |
| 2 | SI AL2O3 SI | 6 | 80% | 1% | 4 |
| 3 | EPITAXIAL AL2O3 | 2 | 67% | 1% | 2 |
| 4 | SOS FILMS | 1 | 100% | 1% | 2 |
| 5 | SOI POWER MOSFETS | 1 | 50% | 0% | 1 |
| 6 | SILICON ON SAPPHIRE | 0 | 11% | 1% | 4 |
| 7 | MICROTWINS | 0 | 17% | 0% | 1 |
| 8 | 4 TERMINAL GAUGE | 0 | 11% | 0% | 1 |
| 9 | 11BAR02 | 0 | 100% | 0% | 1 |
| 10 | 2 PHASE PLATE | 0 | 100% | 0% | 1 |
Journals |
Reviews |
| Title | Publ. year | Cit. | Active references |
% act. ref. to same field |
|---|---|---|---|---|
| SILICON FILMS ON SAPPHIRE | 1987 | 27 | 64 | 59% |
| INTERFACIAL STRUCTURE IN HETEROEPITAXIAL SILICON ON SAPPHIRE | 1990 | 8 | 5 | 80% |
| SILICON ON SAPPHIRE IN FRANCE - A REVIEW OF THE PHYSICOCHEMICAL AND ELECTRICAL-PROPERTIES | 1984 | 0 | 23 | 65% |
| RECENT DEVELOPMENTS IN LATTICE IMAGING OF MATERIALS | 1981 | 2 | 1 | 100% |
Address terms |
| Rank | Address term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
|---|---|---|---|---|---|
| 1 | DENVER AEROSP TECH OPERAT | 1 | 100% | 0.6% | 2 |
| 2 | INTELLIGENT HUMAN SENSING SYST | 1 | 50% | 0.3% | 1 |
| 3 | UMR INPG CNRS | 1 | 50% | 0.3% | 1 |
| 4 | TEMPAKU CHO | 0 | 20% | 0.3% | 1 |
| 5 | SPAWARSYSCEN | 0 | 17% | 0.3% | 1 |
| 6 | HEAT SUR E TREATMENT | 0 | 100% | 0.3% | 1 |
| 7 | NOVEL SEMICONDUCTOR MAT | 0 | 100% | 0.3% | 1 |
| 8 | NOVL SEMICOND MAT | 0 | 100% | 0.3% | 1 |
| 9 | SEMICOND LSI | 0 | 100% | 0.3% | 1 |
| 10 | TENPAKU CHO | 0 | 100% | 0.3% | 1 |
Related classes at same level (level 1) |
| Rank | Relatedness score | Related classes |
|---|---|---|
| 1 | 0.0000130866 | ZONE MELTING RECRYSTALLIZATION//ARCHITECTURE TECH//LASER INDUCED TEMPERATURE RISE |
| 2 | 0.0000102333 | GEOSPATIAL DATA INFRASTRUCTURE//GREEN INITIATIVE//SUSTAINABLE FUNDING |
| 3 | 0.0000097970 | METAL INSULATOR HETEROSTRUCTURE//CAF2//SOLID STATE OPT |
| 4 | 0.0000087840 | SIMOX//BURIED OXIDE LAYER//CONTACTLESS I V METHOD |
| 5 | 0.0000069645 | EPITAXIAL OXIDES//S UNICAT//SI001 SUBSTRATES |
| 6 | 0.0000067520 | INDUCTIVELY COUPLED PLASMA ETCH//SIC C COMPOSITE//SIC C |
| 7 | 0.0000065511 | KAPPA AL2O3//ALUMINA COATINGS//COMBUSTION CHEMICAL VAPOR DEPOSITION |
| 8 | 0.0000063621 | CRYOGENIC CMOS//LOW TEMPERATURE ELECTRONICS//LOW TEMPERATURE CIRCUIT |
| 9 | 0.0000056061 | 4H SIC MESFET//MESFET//MESFETS |
| 10 | 0.0000052707 | ELECTRICALLY DETECTED MAGNETIC RESONANCE//EDMR//BERLIN JOINT EPR |