Class information for:
Level 1: SIGE SINGLE CRYSTAL//GERMANIUM SILICON ALLOYS//AXIAL HEAT PROCESSING

Basic class information
ID Publications Average number
of references		 Avg. shr. active
ref. in WoS
21551 357 15.8 57%


Bar chart of Publication_year

Last years might be incomplete

Classes in level above (level 2)


ID, lev.
above		 Publications Label for level above
1274 8321 THERMOCAPILLARY CONVECTION//CZOCHRALSKI METHOD//MARANGONI CONVECTION

Terms with highest relevance score


Rank Term Type of term Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class
1 SIGE SINGLE CRYSTAL Author keyword 8 100% 1% 5
2 GERMANIUM SILICON ALLOYS Author keyword 7 23% 7% 25
3 AXIAL HEAT PROCESSING Author keyword 6 100% 1% 4
4 SEMICONDUCTING SILICON ALLOYS Author keyword 6 100% 1% 4
5 TERNARY SUBSTRATE Author keyword 4 67% 1% 4
6 OFF SPACE FLIGHT OPERAT Address 3 57% 1% 4
7 MULTICOMPONENT ZONE MELTING METHOD Author keyword 3 100% 1% 3
8 MULTICRYSTALLINE SIGE Author keyword 3 100% 1% 3
9 ZONE GROWTH Author keyword 3 100% 1% 3
10 TRAVELING SOLVENT ZONE GROWTH Author keyword 2 32% 2% 6

Web of Science journal categories

Author Key Words


Rank Web of Science journal category Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class		 LCSH search Wikipedia search
1 SIGE SINGLE CRYSTAL 8 100% 1% 5 Search SIGE+SINGLE+CRYSTAL Search SIGE+SINGLE+CRYSTAL
2 GERMANIUM SILICON ALLOYS 7 23% 7% 25 Search GERMANIUM+SILICON+ALLOYS Search GERMANIUM+SILICON+ALLOYS
3 AXIAL HEAT PROCESSING 6 100% 1% 4 Search AXIAL+HEAT+PROCESSING Search AXIAL+HEAT+PROCESSING
4 SEMICONDUCTING SILICON ALLOYS 6 100% 1% 4 Search SEMICONDUCTING+SILICON+ALLOYS Search SEMICONDUCTING+SILICON+ALLOYS
5 TERNARY SUBSTRATE 4 67% 1% 4 Search TERNARY+SUBSTRATE Search TERNARY+SUBSTRATE
6 MULTICOMPONENT ZONE MELTING METHOD 3 100% 1% 3 Search MULTICOMPONENT+ZONE+MELTING+METHOD Search MULTICOMPONENT+ZONE+MELTING+METHOD
7 MULTICRYSTALLINE SIGE 3 100% 1% 3 Search MULTICRYSTALLINE+SIGE Search MULTICRYSTALLINE+SIGE
8 ZONE GROWTH 3 100% 1% 3 Search ZONE+GROWTH Search ZONE+GROWTH
9 TRAVELING SOLVENT ZONE GROWTH 2 32% 2% 6 Search TRAVELING+SOLVENT+ZONE+GROWTH Search TRAVELING+SOLVENT+ZONE+GROWTH
10 HETERO SEEDING 2 67% 1% 2 Search HETERO+SEEDING Search HETERO+SEEDING

Key Words Plus


Rank Web of Science journal category Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class
1 UNIFORM COMPOSITION 31 61% 9% 33
2 IN03GA07AS 20 67% 5% 18
3 SIXGE1 X SINGLE CRYSTALS 14 100% 2% 7
4 LIQUIDUS ZONE METHOD 13 71% 3% 10
5 INGAAS BULK CRYSTAL 12 86% 2% 6
6 TERNARY SUBSTRATE 11 100% 2% 6
7 SIGE SINGLE CRYSTALS 10 61% 3% 11
8 GE1 XSIX ALLOYS 8 60% 3% 9
9 FLOAT ZONE TECHNIQUE 8 100% 1% 5
10 VERTICAL BRIDGMAN 7 46% 3% 11

Journals

Reviews


Title Publ. year Cit. Active
references		 % act. ref.
to same field
Real X-ray optics - a challenge for crystal growers 1999 10 10 70%
X-ray optics - a tool for X-ray diagnostic and therapy 2007 1 6 50%
BULK GROWTH OF SILICON-GERMANIUM SOLID-SOLUTIONS - REVIEW 1995 38 38 26%

Address terms


Rank Address term Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ.
in class
1 OFF SPACE FLIGHT OPERAT 3 57% 1.1% 4
2 MAT INTERDISCIPLINARY SCI ENGN 2 50% 0.8% 3
3 THERMOPHYS THERMO 1 100% 0.6% 2
4 INFORMAT PROD SCI 1 23% 0.8% 3
5 NPO FIZIKA SOLNTSE 1 50% 0.3% 1
6 POWER SUPPLY SYST 1 50% 0.3% 1
7 QUANTUM ELE ON DEVICES 1 50% 0.3% 1
8 OPT RAIOS X RUMENTACAO 1 29% 0.6% 2
9 GEO ENVIRONM NAT SCI 0 33% 0.3% 1
10 PROBLEMS MICROELECT TECHNOL ULTRAHIGH PUR 0 33% 0.3% 1

Related classes at same level (level 1)


Rank Relatedness score Related classes
1 0.0000273672 ACCELERATED CRUCIBLE ROTATION TECHNIQUE//DETACHED SOLIDIFICATION//ACRT
2 0.0000194736 QUASI MOSAICITY//LAUE LENS//HARD X RAY POLARIMETRY
3 0.0000099584 STRAINED SI//SIGE//STRAINED SILICON
4 0.0000091248 MAGNETIC FIELD ASSISTED CZOCHRALSKI METHOD//CZOCHRALSKI METHOD//CZOCHRALSKI CRYSTAL GROWTH
5 0.0000084901 RADIOCRYSTALLOGRAPHY//SCI TECHNOL RUMENTAT ENGN//NANOSCALE DIFFUSION
6 0.0000073454 STRAINED SI1 XGEX SI QUANTUM WELLS//SI SIGE SUPERLATTICE//STRAINED SIGE SI
7 0.0000069030 SITE OCCUPATION PREFERENCES//ATOMIC LOCAL STRUCTURE//DAFNE L
8 0.0000064809 ELECT MAT DEVICES NANOSTRUCT//L DLTS//CNR IMM MATIS
9 0.0000060970 BI 209 NQR//LOCAL MAGNETIC FIELDS//35CL
10 0.0000047623 VACUUM PHOTOTRIODE//SCINTILLATION DETECTION//VACUUM PHOTOTRIODES