Class information for:
Level 1: LOW FREQUENCY NOISE//1 F NOISE//LOW FREQUENCY LF NOISE

Basic class information
ID Publications Average number
of references		 Avg. shr. active
ref. in WoS
2145 2274 19.1 53%


Bar chart of Publication_year

Last years might be incomplete

Classes in level above (level 2)


ID, lev.
above		 Publications Label for level above
2308 4091 LOW FREQUENCY NOISE//1 F NOISE//LOW FREQUENCY LF NOISE

Terms with highest relevance score


Rank Term Type of term Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class
1 LOW FREQUENCY NOISE Author keyword 57 26% 8% 185
2 1 F NOISE Author keyword 29 16% 7% 165
3 LOW FREQUENCY LF NOISE Author keyword 23 74% 1% 17
4 OXIDE TRAP DENSITY Author keyword 15 77% 0% 10
5 FLICKER NOISE Author keyword 10 16% 3% 58
6 RANDOM TELEGRAPH SIGNAL RTS NOISE Author keyword 8 52% 0% 11
7 GENERATION RECOMBINATION GR NOISE Author keyword 8 100% 0% 5
8 RADIOPHYS DEP Address 8 100% 0% 5
9 NUMBER FLUCTUATIONS Author keyword 7 64% 0% 7
10 RANDOM TELEGRAPH NOISE RTN Author keyword 6 26% 1% 20

Web of Science journal categories

Author Key Words


Rank Web of Science journal category Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class		 LCSH search Wikipedia search
1 LOW FREQUENCY NOISE 57 26% 8% 185 Search LOW+FREQUENCY+NOISE Search LOW+FREQUENCY+NOISE
2 1 F NOISE 29 16% 7% 165 Search 1+F+NOISE Search 1+F+NOISE
3 LOW FREQUENCY LF NOISE 23 74% 1% 17 Search LOW+FREQUENCY+LF+NOISE Search LOW+FREQUENCY+LF+NOISE
4 OXIDE TRAP DENSITY 15 77% 0% 10 Search OXIDE+TRAP+DENSITY Search OXIDE+TRAP+DENSITY
5 FLICKER NOISE 10 16% 3% 58 Search FLICKER+NOISE Search FLICKER+NOISE
6 RANDOM TELEGRAPH SIGNAL RTS NOISE 8 52% 0% 11 Search RANDOM+TELEGRAPH+SIGNAL+RTS+NOISE Search RANDOM+TELEGRAPH+SIGNAL+RTS+NOISE
7 GENERATION RECOMBINATION GR NOISE 8 100% 0% 5 Search GENERATION+RECOMBINATION+GR+NOISE Search GENERATION+RECOMBINATION+GR+NOISE
8 NUMBER FLUCTUATIONS 7 64% 0% 7 Search NUMBER+FLUCTUATIONS Search NUMBER+FLUCTUATIONS
9 RANDOM TELEGRAPH NOISE RTN 6 26% 1% 20 Search RANDOM+TELEGRAPH+NOISE+RTN Search RANDOM+TELEGRAPH+NOISE+RTN
10 RTS NOISE 6 31% 1% 16 Search RTS+NOISE Search RTS+NOISE

Key Words Plus


Rank Web of Science journal category Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class
1 1 F NOISE 136 21% 26% 587
2 LOW FREQUENCY NOISE 107 31% 12% 284
3 FLICKER NOISE 42 34% 4% 102
4 MOSTS 27 92% 0% 11
5 RTS NOISE 23 70% 1% 19
6 INDIVIDUAL DEFECTS 23 65% 1% 22
7 GENERATION RECOMBINATION NOISE 22 47% 1% 34
8 BULK 1 F NOISE 17 100% 0% 8
9 MOS TRANSISTORS 16 14% 5% 107
10 RANDOM TELEGRAPH SIGNALS 15 42% 1% 28

Journals

Reviews


Title Publ. year Cit. Active
references		 % act. ref.
to same field
NOISE IN SOLID-STATE MICROSTRUCTURES - A NEW PERSPECTIVE ON INDIVIDUAL DEFECTS, INTERFACE STATES AND LOW-FREQUENCY (1/F) NOISE 1989 741 47 55%
1/F NOISE AND OTHER SLOW, NONEXPONENTIAL KINETICS IN CONDENSED MATTER 1988 930 97 56%
Low-frequency noise in silicon-on-insulator devices and technologies 2007 21 90 70%
Traps centers impact on Silicon nanocrystal memories given by Random Telegraph Signal and low frequency noise 2011 5 12 83%
Measurement of 1/f noise and its application in materials science 2002 49 86 65%
UNIFIED PRESENTATION OF 1/F NOISE IN ELECTRONIC DEVICES - FUNDAMENTAL 1/F NOISE SOURCES 1988 191 29 100%
Review of low-frequency noise behaviour of polysilicon emitter bipolar junction transistors 2004 14 29 93%
Critical MOSFETs operation for low voltage low power IC's: Ideal characteristics, parameter extraction, electrical noise and RTS fluctuations 1997 51 80 49%
Electrical noise as a reliability indicator in electronic devices and components 2002 27 98 67%
Electrical characterization of semiconductor materials and devices - review 2006 27 33 42%

Address terms


Rank Address term Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class
1 RADIOPHYS DEP 8 100% 0.2% 5
2 GRMNT 4 75% 0.1% 3
3 CII 9017 2 67% 0.1% 2
4 MED TELECOMMUN ENGN 2 67% 0.1% 2
5 UMR 5507 2 11% 0.8% 19
6 EQUIPE COMPOSANTS ELECT 2 50% 0.1% 3
7 ELECT MICROOPTOELECT 2 33% 0.2% 5
8 PHYS COMPOSANTS SEMICOND 2 15% 0.4% 10
9 DFMTFA 2 26% 0.2% 5
10 DEV GRENOBLE 1 100% 0.1% 2

Related classes at same level (level 1)


Rank Relatedness score Related classes
1 0.0000075053 FLUCTUATION ENHANCED SENSING//ADSORPTION DESORPTION NOISE//NOISE BASED LOGIC
2 0.0000067401 EQUIPE MAT SUPRACONDUCTEURS HAUTE TEMP CRIT//URA 0002//BI SR CA CU O FILM
3 0.0000062799 CRYOGENIC CMOS//LOW TEMPERATURE ELECTRONICS//LOW TEMPERATURE CIRCUIT
4 0.0000051234 DEVICE MODELLING GRP//RANDOM DOPANT//DEVICE MODELING GRP
5 0.0000047689 THICK FILM RESISTORS//ELECTROCOMPONENT SCIENCE AND TECHNOLOGY//THICK FILM RESISTOR
6 0.0000047579 MEASUREMENT RUMENT//X AXIS INVERSION//SIGNALS DATA PROC
7 0.0000047293 NOISE PARAMETERS//HIGH FREQUENCY HF NOISE//KINK PHENOMENON
8 0.0000045007 A AMA MICROELECT SCI TECHNOL//SIGEHBT//SIGE HBT
9 0.0000040977 HOT CARRIER//CHANNEL INITIATED SECONDARY ELECTRON CHISEL//HOT CARRIER DEGRADATION
10 0.0000040671 DRAIN CURRENT TRANSIENT//FUNCT ELEMENTS CONTROL SYST//GATE LAG