Class information for: |
Basic class information |
ID | Publications | Average number of references |
Avg. shr. active ref. in WoS |
---|---|---|---|
21389 | 362 | 13.6 | 50% |
Classes in level above (level 2) |
ID, lev. above |
Publications | Label for level above |
---|---|---|
967 | 10249 | OPTICS AND LASERS IN ENGINEERING//DIGITAL IMAGE CORRELATION//FRINGE ANALYSIS |
Terms with highest relevance score |
Rank | Term | Type of term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|---|
1 | COLLIMATION TESTING | Author keyword | 10 | 63% | 3% | 10 |
2 | OPTICAL TESTING INSTRUMENTS | Author keyword | 3 | 100% | 1% | 3 |
3 | OPT LICADA | Address | 3 | 24% | 3% | 11 |
4 | LASER BEAM COLLIMATION | Author keyword | 3 | 60% | 1% | 3 |
5 | OPT LASER RUMENTAT | Address | 3 | 60% | 1% | 3 |
6 | PHASE VISUALIZATION | Author keyword | 3 | 42% | 1% | 5 |
7 | EFFECTIVE FOCAL LENGTH | Author keyword | 2 | 36% | 1% | 5 |
8 | BIDIRECTIONAL SHEARING INTERFEROMETER | Author keyword | 2 | 67% | 1% | 2 |
9 | GRATING SHEARING INTERFEROMETRY | Author keyword | 2 | 67% | 1% | 2 |
10 | TECNOL SAO PAULO | Address | 2 | 16% | 3% | 11 |
Web of Science journal categories |
Author Key Words |
Key Words Plus |
Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | TALBOT INTERFEROMETRY | 17 | 28% | 14% | 52 |
2 | LONG RADIUS | 15 | 88% | 2% | 7 |
3 | SHEARING INTERFEROMETER | 6 | 21% | 7% | 26 |
4 | FOCAL LENGTH MEASUREMENT | 4 | 75% | 1% | 3 |
5 | LAU PHASE INTERFEROMETRY | 4 | 75% | 1% | 3 |
6 | MOIRE TECHNIQUE | 4 | 56% | 1% | 5 |
7 | SPIRAL GRATINGS | 3 | 100% | 1% | 3 |
8 | BEAM COLLIMATION | 3 | 28% | 2% | 9 |
9 | ONE BEAM INTERFEROMETER | 3 | 60% | 1% | 3 |
10 | TWYMAN GREEN INTERFEROMETER | 3 | 42% | 1% | 5 |
Journals |
Reviews |
Title | Publ. year | Cit. | Active references |
% act. ref. to same field |
---|---|---|---|---|
Optical testing: a review and tutorial for optical engineers | 1999 | 18 | 41 | 20% |
DEVICES FOR DETERMINING THE LOCATION OF THE FOCAL PLANE OF OPTICAL-SYSTEMS | 1984 | 1 | 4 | 100% |
Address terms |
Rank | Address term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | OPT LICADA | 3 | 24% | 3.0% | 11 |
2 | OPT LASER RUMENTAT | 3 | 60% | 0.8% | 3 |
3 | TECNOL SAO PAULO | 2 | 16% | 3.0% | 11 |
4 | COHERENT OPT | 1 | 14% | 2.2% | 8 |
5 | BEIJING PRECIS OPTOELECT MEASUREMENT | 1 | 22% | 1.4% | 5 |
6 | ADV OPT RUMENT | 1 | 50% | 0.3% | 1 |
7 | NAZL OTT PLICATA | 1 | 50% | 0.3% | 1 |
8 | SAGAR | 1 | 19% | 0.8% | 3 |
9 | OPT THER EUT MED NANOPHOTON | 1 | 25% | 0.6% | 2 |
10 | OPTIMO | 1 | 10% | 1.4% | 5 |
Related classes at same level (level 1) |
Rank | Relatedness score | Related classes |
---|---|---|
1 | 0.0000293699 | TALBOT EFFECT//PL OPT COMPLUTENSE GRP//ARRAY ILLUMINATORS |
2 | 0.0000216250 | SPACE OPT//RADIAL SHEARING//SURFACE PROFILOMETER |
3 | 0.0000206261 | LASER DYE SOLVENTS//SUB WAVELENGTH DIFFRACTION GRATING//DISPERSION FORMULAS |
4 | 0.0000163023 | INFORMAT PHYS ENGN//MOIRE DEFLECTOMETRY//SANDWICH HOLOGRAPHY |
5 | 0.0000138959 | AMPLITUDE PHASE CHARACTERISTICS//BLOCKING OF REFRACTED RAYS//DUAL HOLOGRAM SHEARING INTERFEROMETRY |
6 | 0.0000131730 | FRINGE LOCALIZATION//HALF ANGLES//FRINGE CURVATURE |
7 | 0.0000104932 | PL COMP MECH//SPECKLE INTERFEROMETRY//SHEAROGRAPHY |
8 | 0.0000104263 | OPTOMETR SCI GRP//DIOPTRIC POWER MATRIX//RAY TRANSFERENCE |
9 | 0.0000080688 | ABSOLUTE LENGTH MEASUREMENT//GAUGE BLOCK//ULTRAFAST OPT ULTR RECIS GRP |
10 | 0.0000080251 | RAINBOW HOLOGRAPHY//TANK AUTOMOT DEV COMMAND//ANISOTROPIC GAIN |