Class information for: |
Basic class information |
| ID | Publications | Average number of references |
Avg. shr. active ref. in WoS |
|---|---|---|---|
| 21234 | 368 | 16.7 | 53% |
Classes in level above (level 2) |
| ID, lev. above |
Publications | Label for level above |
|---|---|---|
| 886 | 10744 | SURFACE AND INTERFACE ANALYSIS//AUGER PHOTOELECTRON COINCIDENCE SPECTROSCOPY APECS//IMFP |
Terms with highest relevance score |
| Rank | Term | Type of term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
|---|---|---|---|---|---|---|
| 1 | SUR E THIN FILM ANAL IFOS | Address | 13 | 80% | 2% | 8 |
| 2 | SNMS | Author keyword | 7 | 29% | 5% | 20 |
| 3 | POST IONIZATION | Author keyword | 4 | 46% | 2% | 6 |
| 4 | LASER POST IONIZATION | Author keyword | 2 | 67% | 1% | 2 |
| 5 | SECONDARY NEUTRAL MASS SPECTROMETRY | Author keyword | 2 | 36% | 1% | 4 |
| 6 | NONRESONANT MULTIPHOTON IONIZATION | Author keyword | 2 | 43% | 1% | 3 |
| 7 | SPUTTERED NEUTRAL MASS SPECTROMETRY | Author keyword | 2 | 43% | 1% | 3 |
| 8 | SPACE SAMPLES | Author keyword | 1 | 100% | 1% | 2 |
| 9 | SUPERPOSITION OF SIGNALS | Author keyword | 1 | 100% | 1% | 2 |
| 10 | TRAFFIC SOOT | Author keyword | 1 | 100% | 1% | 2 |
Web of Science journal categories |
Author Key Words |
| Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
LCSH search | Wikipedia search |
|---|---|---|---|---|---|---|---|
| 1 | SNMS | 7 | 29% | 5% | 20 | Search SNMS | Search SNMS |
| 2 | POST IONIZATION | 4 | 46% | 2% | 6 | Search POST+IONIZATION | Search POST+IONIZATION |
| 3 | LASER POST IONIZATION | 2 | 67% | 1% | 2 | Search LASER+POST+IONIZATION | Search LASER+POST+IONIZATION |
| 4 | SECONDARY NEUTRAL MASS SPECTROMETRY | 2 | 36% | 1% | 4 | Search SECONDARY+NEUTRAL+MASS+SPECTROMETRY | Search SECONDARY+NEUTRAL+MASS+SPECTROMETRY |
| 5 | NONRESONANT MULTIPHOTON IONIZATION | 2 | 43% | 1% | 3 | Search NONRESONANT+MULTIPHOTON+IONIZATION | Search NONRESONANT+MULTIPHOTON+IONIZATION |
| 6 | SPUTTERED NEUTRAL MASS SPECTROMETRY | 2 | 43% | 1% | 3 | Search SPUTTERED+NEUTRAL+MASS+SPECTROMETRY | Search SPUTTERED+NEUTRAL+MASS+SPECTROMETRY |
| 7 | SPACE SAMPLES | 1 | 100% | 1% | 2 | Search SPACE+SAMPLES | Search SPACE+SAMPLES |
| 8 | SUPERPOSITION OF SIGNALS | 1 | 100% | 1% | 2 | Search SUPERPOSITION+OF+SIGNALS | Search SUPERPOSITION+OF+SIGNALS |
| 9 | TRAFFIC SOOT | 1 | 100% | 1% | 2 | Search TRAFFIC+SOOT | Search TRAFFIC+SOOT |
| 10 | XHV | 1 | 30% | 1% | 3 | Search XHV | Search XHV |
Key Words Plus |
| Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
|---|---|---|---|---|---|
| 1 | NONRESONANT MULTIPHOTON IONIZATION | 30 | 60% | 9% | 32 |
| 2 | SPUTTERED NEUTRALS | 15 | 67% | 4% | 14 |
| 3 | NEUTRAL MASS SPECTROMETRY | 15 | 46% | 7% | 24 |
| 4 | SNMS | 11 | 43% | 5% | 20 |
| 5 | RESONANCE IONIZATION | 8 | 28% | 7% | 24 |
| 6 | MULTIPHOTON RESONANCE IONIZATION | 6 | 80% | 1% | 4 |
| 7 | BULK ANALYSIS | 5 | 37% | 3% | 10 |
| 8 | CHEMICAL SURFACE | 4 | 67% | 1% | 4 |
| 9 | POSTIONIZATION | 3 | 32% | 2% | 9 |
| 10 | LASER POSTIONIZATION | 1 | 38% | 1% | 3 |
Journals |
Reviews |
| Title | Publ. year | Cit. | Active references | % act. ref. to same field |
|---|---|---|---|---|
| Quantitative depth profiling by laser-ionization sputtered neutral mass spectrometry | 1999 | 6 | 14 | 79% |
| Surface analysis by laser ionization | 1996 | 1 | 16 | 75% |
| ANALYSIS OF INSULATOR SAMPLES BY SECONDARY NEUTRAL MASS-SPECTROMETRY | 1989 | 8 | 6 | 83% |
| SURFACE-ANALYSIS BY LASER IONIZATION APPLIED TO POLYMERIC MATERIAL | 1993 | 0 | 5 | 80% |
| DEPTH PROFILING USING INTENSE UNTUNED UV LASER IONIZATION OF SPUTTERED NEUTRALS | 1988 | 15 | 5 | 60% |
| MATERIALS ANALYSIS BY MASS-SPECTROMETRY OF SPUTTERED NEUTRALS | 1988 | 9 | 14 | 57% |
| Atomic mass spectrometry | 2000 | 9 | 255 | 4% |
Address terms |
| Rank | Address term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
|---|---|---|---|---|---|
| 1 | SUR E THIN FILM ANAL IFOS | 13 | 80% | 2.2% | 8 |
| 2 | SUR E THIN FILM ANAL | 1 | 17% | 1.4% | 5 |
| 3 | OBERFLACHEN ICHTANALYT | 0 | 11% | 1.1% | 4 |
| 4 | EMICIAN D MICHEV CENT SOLAR TERR INFLUENCES L | 0 | 33% | 0.3% | 1 |
| 5 | GENESIS PROJECT | 0 | 33% | 0.3% | 1 |
| 6 | CNRS UPR 292 | 0 | 20% | 0.3% | 1 |
| 7 | ISOTOPE IMAGING | 0 | 10% | 0.5% | 2 |
| 8 | MCPF | 0 | 14% | 0.3% | 1 |
| 9 | OBERFLACHEN ICHTANALYT IFOS | 0 | 13% | 0.3% | 1 |
| 10 | ART MUSEUM | 0 | 11% | 0.3% | 1 |
Related classes at same level (level 1) |
| Rank | Relatedness score | Related classes |
|---|---|---|
| 1 | 0.0000291844 | RESONANCE IONIZATION MASS SPECTROMETRY//RESONANT LASER ABLATION//KR 81 |
| 2 | 0.0000207749 | OXYGEN BOMBARDMENT//STORING MATTER TECHNIQUE//SCI ANAL MAT SAM |
| 3 | 0.0000190305 | KINETIC EXCITATION//ION PHOTON EMISSION//NON ADDITIVE SPUTTERING |
| 4 | 0.0000160226 | SUPERSONIC JET SPECTROMETRY//SINGLE PHOTON IONIZATION//ABT UMWELT PROZES EM |
| 5 | 0.0000123308 | CONICAL PROTRUSION//FINE PROTRUSION//STRIPE RIB |
| 6 | 0.0000081633 | MAT CHARACTERIZAT PREPARAT IL//ADV ENGN MAT IL//STATIC SECONDARY ION MASS SPECTROMETRY |
| 7 | 0.0000080875 | D CAMPHOR BETA SULFONIC ACID//P NITROPHENYLHYDRAZINE//HYDROGEN STORAGE INTERMETALLICS |
| 8 | 0.0000077061 | LOW Z PARTICLE ELECTRON PROBE X RAY MICROANALYSIS//INDIVIDUAL PARTICLE ANALYSIS//LOW Z PARTICLE EPMA |
| 9 | 0.0000068253 | GLOW DISCHARGE MASS SPECTROMETRY//GLOW DISCHARGE OPTICAL EMISSION SPECTROMETRY//RADIOFREQUENCY GLOW DISCHARGE |
| 10 | 0.0000062113 | KUPA RIVER DRAINAGE BASIN//ALUMINUM INTERFERENCE//RIVERS OF KOSOVO |