Class information for: |
Basic class information |
ID | Publications | Average number of references |
Avg. shr. active ref. in WoS |
---|---|---|---|
21073 | 374 | 16.0 | 67% |
Classes in level above (level 2) |
ID, lev. above |
Publications | Label for level above |
---|---|---|
2729 | 2746 | POLARIZATION INTERFERENCE IMAGING SPECTROMETER//CORRELATION CHROMATOGRAPHY//SPE AL IMAGING TECH |
Terms with highest relevance score |
Rank | Term | Type of term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|---|
1 | SEMICONDUCTOR DBR | Author keyword | 6 | 80% | 1% | 4 |
2 | MICROMACHINED FILTER | Author keyword | 3 | 57% | 1% | 4 |
3 | TUNABLE CIRCUITS DEVICES | Author keyword | 2 | 67% | 1% | 2 |
4 | TUNABLE OPTICAL FILTER | Author keyword | 2 | 16% | 3% | 10 |
5 | WAVELENGTH TRIMMING | Author keyword | 2 | 43% | 1% | 3 |
6 | MICROSTRUCT TECHNOL ANALYT | Address | 2 | 19% | 2% | 8 |
7 | PHOTON INTEGRAT SYST | Address | 2 | 16% | 2% | 9 |
8 | LEAME | Address | 2 | 23% | 2% | 6 |
9 | HGEBIET OPT NACHRICHTENTECH | Address | 1 | 100% | 1% | 2 |
10 | MICRO OPTO ELECTRO MECHANICAL SYSTEM | Author keyword | 1 | 50% | 1% | 2 |
Web of Science journal categories |
Author Key Words |
Key Words Plus |
Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | FABRY PEROT FILTER | 7 | 28% | 5% | 20 |
2 | HALF SYMMETRICAL CAVITY | 4 | 75% | 1% | 3 |
3 | TUNABLE VCSEL | 4 | 44% | 2% | 7 |
4 | FABRY PEROT FILTERS | 3 | 28% | 2% | 9 |
5 | FILM MULTILAYERS | 2 | 67% | 1% | 2 |
6 | VERTICAL CAVITY FILTER | 2 | 43% | 1% | 3 |
7 | MEMS VCSEL | 1 | 38% | 1% | 3 |
8 | MEMS TUNABLE VCSEL | 1 | 50% | 1% | 2 |
9 | MEMS VCSELS | 1 | 100% | 1% | 2 |
10 | VERTICAL CAVITY SOAS | 1 | 50% | 1% | 2 |
Journals |
Reviews |
Title | Publ. year | Cit. | Active references | % act. ref. to same field |
---|---|---|---|---|
MEMS-based microspectrometer technologies for NIR and MIR wavelengths | 2009 | 20 | 37 | 43% |
Modeling and control of tunable vertical cavity laser diode | 2012 | 1 | 8 | 50% |
Fabrication challenges for indium phosphide microsystems | 2015 | 0 | 94 | 34% |
Monolithic silicon-micromachined free-space optical interferometers onchip | 2015 | 0 | 113 | 16% |
Address terms |
Rank | Address term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | MICROSTRUCT TECHNOL ANALYT | 2 | 19% | 2.1% | 8 |
2 | PHOTON INTEGRAT SYST | 2 | 16% | 2.4% | 9 |
3 | LEAME | 2 | 23% | 1.6% | 6 |
4 | HGEBIET OPT NACHRICHTENTECH | 1 | 100% | 0.5% | 2 |
5 | MICROSTRUCT TECHNOL ANAL | 1 | 50% | 0.5% | 2 |
6 | MIKROWELLENTECH PHOTON | 1 | 30% | 0.8% | 3 |
7 | OPTO ELECT SYST CLUSTER | 1 | 33% | 0.5% | 2 |
8 | ELECT METROL RELIABIL EMPA | 1 | 50% | 0.3% | 1 |
9 | GAS ENGN MONTROUGE | 1 | 50% | 0.3% | 1 |
10 | GRP SEMICOND STUDIES | 1 | 50% | 0.3% | 1 |
Related classes at same level (level 1) |
Rank | Relatedness score | Related classes |
---|---|---|
1 | 0.0000265075 | MEASUREMENT SENSOR TECHNOL//ME EI//MICROELECT ELECT RUMENTAT |
2 | 0.0000255719 | MFG LOGIST TECHNOL//NONNORMAL INCIDENCE//SIGNAL AVERAGING EFFECT |
3 | 0.0000217270 | FIBER FABRY PEROT ETALON//LYOT OHMAN FILTER//STACKED DISPLAY |
4 | 0.0000158342 | VERTICAL CAVITY SURFACE EMITTING LASERS//VERTICAL CAVITY SURFACE EMITTING LASERS VCSELS//VERTICAL CAVITY SURFACE EMITTING LASER VCSEL |
5 | 0.0000150110 | CCD PHOTOMETRY//ASTROPHYSICAL INSTRUMENTATIONS//GALAXIES INDIVIDUAL NGC 4102 |
6 | 0.0000131078 | MICROMIRROR//VARIABLE OPTICAL ATTENUATOR VOA//VERTICAL COMBDRIVES |
7 | 0.0000087645 | MICROWAVE POWER SENSOR//POWER SENSOR//GAAS MMIC |
8 | 0.0000077185 | NANO SENSORS GRP//GUIDED MODE RESONANCE//GUIDED MODE RESONANCE GMR |
9 | 0.0000067410 | HIGH POWER PHOTODIODE//HIGH POWER PHOTODIODES//UNITRAVELING CARRIER PHOTODIODE UTC PD |
10 | 0.0000063332 | DISPERSION FREE OPERATION//MEASUREMENT OF DISPLACEMENTS//THIN FILM PROD GRP |