Class information for: |
Basic class information |
ID | Publications | Average number of references |
Avg. shr. active ref. in WoS |
---|---|---|---|
20732 | 387 | 20.9 | 52% |
Classes in level above (level 2) |
ID, lev. above |
Publications | Label for level above |
---|---|---|
1597 | 6577 | ELLIPSOMETRY//MUELLER MATRIX//NANOOPT PROPERTY |
Terms with highest relevance score |
Rank | Term | Type of term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|---|
1 | INFRARED ELLIPSOMETRY | Author keyword | 9 | 41% | 4% | 17 |
2 | MICROELECT OPT MAT | Address | 5 | 22% | 5% | 19 |
3 | BERLIN | Address | 3 | 12% | 6% | 24 |
4 | INFRARED SPECTROSCOPIC ELLIPSOMETRY | Author keyword | 2 | 24% | 2% | 9 |
5 | GENERALIZED ELLIPSOMETRY | Author keyword | 2 | 24% | 2% | 8 |
6 | BREWSTERS NULL REFLECTION | Author keyword | 2 | 67% | 1% | 2 |
7 | SNELLS TOTAL REFLECTION | Author keyword | 2 | 67% | 1% | 2 |
8 | SMALL ANGLE OBLIQUE INCIDENCE REFLECTION | Author keyword | 1 | 100% | 1% | 2 |
9 | NANOHYBRID FUNCT MAT | Address | 1 | 20% | 1% | 5 |
10 | UPR 258 CNRS | Address | 1 | 40% | 1% | 2 |
Web of Science journal categories |
Author Key Words |
Key Words Plus |
Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | IR ELLIPSOMETRY | 27 | 92% | 3% | 11 |
2 | INFRARED ELLIPSOMETRY | 3 | 24% | 3% | 12 |
3 | PHASE MODULATED ELLIPSOMETRY | 3 | 33% | 2% | 7 |
4 | FREE CARRIER | 3 | 20% | 3% | 12 |
5 | GENERALIZED ELLIPSOMETRY | 3 | 15% | 4% | 16 |
6 | INFRARED SPECTROSCOPIC ELLIPSOMETRY | 2 | 33% | 1% | 4 |
7 | DOMAIN SPECTROSCOPIC ELLIPSOMETRY | 1 | 100% | 1% | 2 |
8 | INFRARED MAGNETOOPTIC ELLIPSOMETRY | 1 | 100% | 1% | 2 |
9 | INVERSE RELATIONSHIPS | 1 | 100% | 1% | 2 |
10 | SILICON BOLOMETERS | 1 | 100% | 1% | 2 |
Journals |
Reviews |
Title | Publ. year | Cit. | Active references |
% act. ref. to same field |
---|---|---|---|---|
Analysis of organic films and interfacial layers by infrared spectroscopic ellipsometry | 2005 | 42 | 93 | 43% |
Polaritons in semiconductor layer structures | 2004 | 0 | 8 | 75% |
Infrared model dielectric functions | 2004 | 0 | 11 | 55% |
Anisotropic substrates | 2004 | 0 | 13 | 54% |
Infrared ellipsometry on semiconductor layer structures - Phonons, plasmons, and polaritons - Introduction | 2004 | 2 | 35 | 31% |
Wurtzite-structure materials (Group-III nitrides, ZnO) | 2004 | 0 | 37 | 35% |
Ellipsometry | 2004 | 0 | 29 | 34% |
Magneto-optic ellipsometry | 2004 | 0 | 6 | 33% |
Far-infrared Fourier Transform Spectroscopy | 1998 | 1 | 24 | 21% |
Address terms |
Rank | Address term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | MICROELECT OPT MAT | 5 | 22% | 4.9% | 19 |
2 | BERLIN | 3 | 12% | 6.2% | 24 |
3 | NANOHYBRID FUNCT MAT | 1 | 20% | 1.3% | 5 |
4 | UPR 258 CNRS | 1 | 40% | 0.5% | 2 |
5 | ABT SUPRALEITUNG MAGNET | 1 | 50% | 0.3% | 1 |
6 | ARBEITSGRP HALBLEITERPHYS | 1 | 50% | 0.3% | 1 |
7 | INTER E EXPERTISE | 1 | 50% | 0.3% | 1 |
8 | OLL SCI ENGN | 1 | 50% | 0.3% | 1 |
9 | THERMAL OPT SYST | 1 | 50% | 0.3% | 1 |
10 | UPR 0258 CNRS | 1 | 50% | 0.3% | 1 |
Related classes at same level (level 1) |
Rank | Relatedness score | Related classes |
---|---|---|
1 | 0.0000190754 | MAGNETO OPTICAL ELLIPSOMETRY//GOMEL ENGINEER//INCOHERENT EFFECTS |
2 | 0.0000178853 | IMAGING ELLIPSOMETRY//TOTAL INTERNAL REFLECTION ELLIPSOMETRY//ROTATING POLARIZER ANALYZER ELLIPSOMETER |
3 | 0.0000145951 | DIPOLE MOMENT DERIVATIVES//BERREMAN EFFECT//EIGENSPECTRA |
4 | 0.0000112766 | NANOOPT PROPERTY//PLASMA PHYS PLASMA SOURCES//NON UNIFORM THIN FILMS |
5 | 0.0000091297 | SEIRA//SURFACE ENHANCED INFRARED ABSORPTION//SURFACE ENHANCED INFRARED ABSORPTION SPECTROSCOPY |
6 | 0.0000080031 | MUELLER MATRIX//SHENZHEN MINIMAL INVAS MED TECHNOL//BIOPHYS BIOIMAGING |
7 | 0.0000066999 | EPITAXIAL SEMICOND GRP//EXP SOLID STATE PHYS 3//RECIPROCAL SPACE ANALYSIS |
8 | 0.0000062520 | OPTICAL PHONON MODES//TERNARY MIXED CRYSTAL//MECHANISM ELE ON |
9 | 0.0000060871 | ABSORBING SUBSTRATE//SINGLE LAYER COATING//ELLIPSOMETRY PLICAT S |
10 | 0.0000059556 | SCATTERING CORRECTIONS//FED SCI PROD//SPECTRAL MATCHING FACTOR |