Class information for:
Level 1: IMFP//ELASTIC PEAK ELECTRON SPECTROSCOPY//SURFACE EXCITATION

Basic class information
ID Publications Average number
of references		 Avg. shr. active
ref. in WoS
2049 2307 27.4 53%


Bar chart of Publication_year

Last years might be incomplete

Classes in level above (level 2)


ID, lev.
above		 Publications Label for level above
886 10744 SURFACE AND INTERFACE ANALYSIS//AUGER PHOTOELECTRON COINCIDENCE SPECTROSCOPY APECS//IMFP

Terms with highest relevance score


Rank Term Type of term Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class
1 IMFP Author keyword 102 100% 1% 30
2 ELASTIC PEAK ELECTRON SPECTROSCOPY Author keyword 70 89% 1% 32
3 SURFACE EXCITATION Author keyword 67 87% 1% 33
4 SURFACE EXCITATION PARAMETER Author keyword 56 100% 1% 19
5 EPES Author keyword 49 79% 1% 31
6 INELASTIC MEAN FREE PATH Author keyword 44 61% 2% 46
7 ELECTRON INELASTIC MEAN FREE PATH Author keyword 32 85% 1% 17
8 REELS Author keyword 22 49% 1% 33
9 ELECTRON SOLID INTERACTIONS Author keyword 21 31% 3% 58
10 QUANTITATIVE SURFACE ANALYSIS Author keyword 20 67% 1% 18

Web of Science journal categories

Author Key Words


Rank Web of Science journal category Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class		 LCSH search Wikipedia search
1 IMFP 102 100% 1% 30 Search IMFP Search IMFP
2 ELASTIC PEAK ELECTRON SPECTROSCOPY 70 89% 1% 32 Search ELASTIC+PEAK+ELECTRON+SPECTROSCOPY Search ELASTIC+PEAK+ELECTRON+SPECTROSCOPY
3 SURFACE EXCITATION 67 87% 1% 33 Search SURFACE+EXCITATION Search SURFACE+EXCITATION
4 SURFACE EXCITATION PARAMETER 56 100% 1% 19 Search SURFACE+EXCITATION+PARAMETER Search SURFACE+EXCITATION+PARAMETER
5 EPES 49 79% 1% 31 Search EPES Search EPES
6 INELASTIC MEAN FREE PATH 44 61% 2% 46 Search INELASTIC+MEAN+FREE+PATH Search INELASTIC+MEAN+FREE+PATH
7 ELECTRON INELASTIC MEAN FREE PATH 32 85% 1% 17 Search ELECTRON+INELASTIC+MEAN+FREE+PATH Search ELECTRON+INELASTIC+MEAN+FREE+PATH
8 REELS 22 49% 1% 33 Search REELS Search REELS
9 ELECTRON SOLID INTERACTIONS 21 31% 3% 58 Search ELECTRON+SOLID+INTERACTIONS Search ELECTRON+SOLID+INTERACTIONS
10 QUANTITATIVE SURFACE ANALYSIS 20 67% 1% 18 Search QUANTITATIVE+SURFACE+ANALYSIS Search QUANTITATIVE+SURFACE+ANALYSIS

Key Words Plus


Rank Web of Science journal category Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class
1 MEAN FREE PATHS 135 36% 13% 301
2 DEPTH DISTRIBUTION FUNCTION 87 94% 1% 31
3 50 2000 EV RANGE 78 56% 4% 95
4 ATTENUATION LENGTHS 73 66% 3% 67
5 QUANTITATIVE AES 73 82% 2% 42
6 REELS SPECTRA 59 90% 1% 26
7 IMFP 48 100% 1% 17
8 NONCRYSTALLINE SOLID SURFACES 45 94% 1% 16
9 AES 42 17% 10% 228
10 DEPENDENT XPS 38 86% 1% 19

Journals

Reviews


Title Publ. year Cit. Active references % act. ref.
to same field
Evaluation of calculated and measured electron inelastic mean free paths near solid surfaces 1999 248 105 81%
Electron transport in solids for quantitative surface analysis 2001 174 121 88%
Universality classes of inelastic electron scattering cross-sections 1997 121 43 95%
Comparison of electron elastic-scattering cross sections calculated from two commonly used atomic potentials 2004 98 79 63%
Elastic backscattering of electrons: determination of physical parameters of electron transport processes by elastic peak electron spectroscopy 2002 75 165 78%
An ARXPS primer 2009 19 13 92%
MONTE-CARLO MODELING OF ELECTRON-SOLID INTERACTIONS 1992 201 31 55%
Energy loss in XPS: Fundamental processes and applications for quantification, non-destructive depth profiling and 3D imaging 2010 27 105 85%
Electron transport processes in reflection electron energy loss spectroscopy (REELS) and X-ray photoelectron spectroscopy (XPS) 1999 63 37 84%
Application of surface chemical analysis tools for characterization of nanoparticles 2010 71 85 26%

Address terms


Rank Address term Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class
1 SUR E MICROANAL SCI 16 23% 2.6% 60
2 MAT MEASUREMENT TECHNOL 8 33% 0.9% 20
3 ALLGEMEINE PHYS 6 11% 2.1% 49
4 OPT ANALYT MEASUREMENT 4 47% 0.3% 7
5 MTA ATOMKI 4 36% 0.3% 8
6 SERV METROL NUCL CP 165 84 3 50% 0.2% 5
7 ATOM MOL PHYS S 3 15% 0.9% 20
8 SERV METROL NUCL 3 16% 0.8% 18
9 WHARFSIDE 2 67% 0.1% 2
10 ADV SUR E CHEM ANAL GRP 2 40% 0.2% 4

Related classes at same level (level 1)


Rank Relatedness score Related classes
1 0.0000258439 LINEAR LEAST SQUARES FITTING//LINEAR LEAST SQUARE FIT//LINEAR LEAST SQUARE METHOD
2 0.0000193760 INDIUM PHOSPHIDE100//INTERACTION IONS MATTER//SIMULATION METHOD TRIM
3 0.0000171273 MEAN PENETRATION DEPTH//CONTINUOUS SLOWING DOWN APPROXIMATION//DOPANT CONTRAST
4 0.0000169541 HISOR//SPANISH CRG BEAMLINE SPLINE BM25//HAXPES
5 0.0000120486 CONICAL PROTRUSION//FINE PROTRUSION//STRIPE RIB
6 0.0000119570 POSIDONIUS//PLINY THE ELDER//AU PT BIMETALLIC NANOCLUSTERS
7 0.0000110322 AUGER PARAMETER//DIFFERENTIAL CHARGING//CHARGE REFERENCING
8 0.0000077273 EELFS//TUNGSTEN 100 SURFACE//ATOMIC PAIR CORRELATION FUNCTION
9 0.0000076413 STANDARDLESS ANALYSIS//FU 160//TRITIUM ANALYSIS
10 0.0000072445 AUGER PHOTOELECTRON COINCIDENCE SPECTROSCOPY APECS//AUGER TRANSITION//AUGER PHOTOELECTRON COINCIDENCE SPECTROSCOPY