Class information for:
Level 1: IBM SYST TECHNOL GRP//390//SERVER GRP

Basic class information
ID Publications Average number
of references		 Avg. shr. active
ref. in WoS
20445 399 16.8 34%


Bar chart of Publication_year

Last years might be incomplete

Classes in level above (level 2)


ID, lev.
above		 Publications Label for level above
1040 9640 JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS//IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS//SINGLE EVENT UPSET SEU

Terms with highest relevance score


Rank Term Type of term Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class
1 IBM SYST TECHNOL GRP Address 49 66% 12% 46
2 390 Address 15 68% 3% 13
3 SERVER GRP Address 7 36% 4% 16
4 IBM SYST Address 6 100% 1% 4
5 SERV GRP Address 4 44% 2% 7
6 CIRCUIT DESIGN METHODOLOGY Author keyword 3 60% 1% 3
7 HIGH FREQUENCY CMOS DESIGN Author keyword 2 67% 1% 2
8 INTERCONNECT TEST Author keyword 1 21% 2% 6
9 CONNECTION CLASS Author keyword 1 100% 1% 2
10 COVERAGE DRIVEN VERIFICATION Author keyword 1 100% 1% 2

Web of Science journal categories

Author Key Words


Rank Web of Science journal category Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ.
in class		 LCSH search Wikipedia search
1 CIRCUIT DESIGN METHODOLOGY 3 60% 1% 3 Search CIRCUIT+DESIGN+METHODOLOGY Search CIRCUIT+DESIGN+METHODOLOGY
2 HIGH FREQUENCY CMOS DESIGN 2 67% 1% 2 Search HIGH+FREQUENCY+CMOS+DESIGN Search HIGH+FREQUENCY+CMOS+DESIGN
3 INTERCONNECT TEST 1 21% 2% 6 Search INTERCONNECT+TEST Search INTERCONNECT+TEST
4 CONNECTION CLASS 1 100% 1% 2 Search CONNECTION+CLASS Search CONNECTION+CLASS
5 COVERAGE DRIVEN VERIFICATION 1 100% 1% 2 Search COVERAGE+DRIVEN+VERIFICATION Search COVERAGE+DRIVEN+VERIFICATION
6 DATAPATH COVERAGE 1 100% 1% 2 Search DATAPATH+COVERAGE Search DATAPATH+COVERAGE
7 EXTRACTED CONTROL FLOW MACHINE 1 100% 1% 2 Search EXTRACTED+CONTROL+FLOW+MACHINE Search EXTRACTED+CONTROL+FLOW+MACHINE
8 RACK LEVEL DC POWER SUPPLY 1 100% 1% 2 Search RACK+LEVEL+DC+POWER+SUPPLY Search RACK+LEVEL+DC+POWER+SUPPLY
9 ZENTERPRISE 1 100% 1% 2 Search ZENTERPRISE Search ZENTERPRISE
10 CLOCK GRID 1 33% 1% 3 Search CLOCK+GRID Search CLOCK+GRID

Key Words Plus


Rank Web of Science journal category Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ.
in class
1 IBM ESERVER Z900 15 82% 2% 9
2 ESERVER Z900 8 100% 1% 5
3 S 390 6 71% 1% 5
4 Z900 6 100% 1% 4
5 DIRECTED TEST GENERATION 3 60% 1% 3
6 FUNCTIONAL VERIFICATION 3 35% 2% 6
7 G5 2 30% 2% 6
8 TEST PROGRAM GENERATION 2 29% 2% 6
9 CONNECTION ESCON ARCHITECTURE 1 100% 1% 2
10 COVERAGE ANALYSIS 1 50% 1% 2

Journals

Reviews


Title Publ. year Cit. Active
references		 % act. ref.
to same field
EDA in IBM: Past, present, and future 2000 22 32 34%
An industrial view of electronic design automation 2000 18 12 8%

Address terms


Rank Address term Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class
1 IBM SYST TECHNOL GRP 49 66% 12% 46
2 390 15 68% 3.3% 13
3 SERVER GRP 7 36% 4.0% 16
4 IBM SYST 6 100% 1.0% 4
5 SERV GRP 4 44% 1.8% 7
6 ENTERPRISE SERV GRP 1 100% 0.5% 2
7 IBM SERVER GRP 1 100% 0.5% 2
8 LINUX TECHNOL 1 40% 0.5% 2
9 FPGA SOFTWARE CORE GRP 1 33% 0.5% 2
10 ADV CAD GRP 1 50% 0.3% 1

Related classes at same level (level 1)


Rank Relatedness score Related classes
1 0.0000224251 TRACE SIGNAL SELECTION//SILICON DEBUG//REAL TIME TRACE
2 0.0000181624 CO OPERATIVE INFORMATION SYSTEMS//MULTI FACE HIGH SPEED MACHINING//INFORMATION REPOSITORY
3 0.0000127954 THERMAL ENGN TECHNOL//J AN MARINE SCI TECHNOL//INP WAFERS
4 0.0000098566 ENGN TECHNOL SERV//MEDICAL INFERENCE//SIMD COMPUTER ARCHITECTURE
5 0.0000080143 READ ONCE BRANCHING PROGRAMS//ORDERED BINARY DECISION DIAGRAMS//INFORMAT LS2
6 0.0000078769 DESIGN ERROR DIAGNOSIS//PASS FAIL INFORMATION//WITT POLYNOMIAL
7 0.0000077308 CLOCK TREE//CLOCK SKEW//CLOCK DISTRIBUTION
8 0.0000070684 OPTICAL CONNECTOR//SPLIT ALIGNMENT SLEEVE//MU CONNECTOR
9 0.0000064958 TRANSITION FAULTS//FUNCTIONAL BROADSIDE TESTS//JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS
10 0.0000059673 PLATED THROUGH HOLE//ENDICOTT ELECT PACKAGING//THREE DIMENSIONAL 3 D CHIP STACKING