Class information for: |
Basic class information |
ID | Publications | Average number of references |
Avg. shr. active ref. in WoS |
---|---|---|---|
20291 | 404 | 15.2 | 34% |
Classes in level above (level 2) |
ID, lev. above |
Publications | Label for level above |
---|---|---|
2051 | 4868 | SCANNING//LAMACOP//BACKSCATTERED ELECTRONS |
Terms with highest relevance score |
Rank | Term | Type of term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|---|
1 | ELECTRON BEAM TESTING | Author keyword | 3 | 37% | 2% | 7 |
2 | SOREP | Address | 2 | 67% | 0% | 2 |
3 | VOLTAGE CONTRAST | Author keyword | 2 | 16% | 3% | 11 |
4 | ELECTRON BEAM TESTER | Author keyword | 1 | 50% | 0% | 2 |
5 | E BEAM TESTING | Author keyword | 1 | 40% | 0% | 2 |
6 | DESCRAMBLING | Author keyword | 1 | 50% | 0% | 1 |
7 | DIAGNOST CHARACTERIZAT GRP | Address | 1 | 50% | 0% | 1 |
8 | E BEAM TESTER | Author keyword | 1 | 50% | 0% | 1 |
9 | ELECTRON BEAM TEST | Author keyword | 1 | 50% | 0% | 1 |
10 | INTEGRATED CIRCUIT ADV PROC ENGN | Address | 1 | 50% | 0% | 1 |
Web of Science journal categories |
Author Key Words |
Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
LCSH search | Wikipedia search |
---|---|---|---|---|---|---|---|
1 | ELECTRON BEAM TESTING | 3 | 37% | 2% | 7 | Search ELECTRON+BEAM+TESTING | Search ELECTRON+BEAM+TESTING |
2 | VOLTAGE CONTRAST | 2 | 16% | 3% | 11 | Search VOLTAGE+CONTRAST | Search VOLTAGE+CONTRAST |
3 | ELECTRON BEAM TESTER | 1 | 50% | 0% | 2 | Search ELECTRON+BEAM+TESTER | Search ELECTRON+BEAM+TESTER |
4 | E BEAM TESTING | 1 | 40% | 0% | 2 | Search E+BEAM+TESTING | Search E+BEAM+TESTING |
5 | DESCRAMBLING | 1 | 50% | 0% | 1 | Search DESCRAMBLING | Search DESCRAMBLING |
6 | E BEAM TESTER | 1 | 50% | 0% | 1 | Search E+BEAM+TESTER | Search E+BEAM+TESTER |
7 | ELECTRON BEAM TEST | 1 | 50% | 0% | 1 | Search ELECTRON+BEAM+TEST | Search ELECTRON+BEAM+TEST |
8 | MISSING SPACER | 1 | 50% | 0% | 1 | Search MISSING+SPACER | Search MISSING+SPACER |
9 | PHOTO IONISATION DETECTOR | 1 | 50% | 0% | 1 | Search PHOTO+IONISATION+DETECTOR | Search PHOTO+IONISATION+DETECTOR |
10 | TESTING PADS | 1 | 50% | 0% | 1 | Search TESTING+PADS | Search TESTING+PADS |
Key Words Plus |
Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | VOLTAGE CONTRAST | 2 | 23% | 2% | 7 |
2 | MICROFIELDS | 1 | 30% | 1% | 3 |
3 | BEAM INSPECTION SYSTEM | 1 | 50% | 0% | 1 |
4 | HIGH SPEED DEVICES | 0 | 25% | 0% | 1 |
5 | FIELD ENERGY ANALYZER | 0 | 20% | 0% | 1 |
6 | MATERIAL DISPERSION | 0 | 20% | 0% | 1 |
7 | LVSEM | 0 | 14% | 0% | 1 |
8 | ADDRESS ERROR | 0 | 100% | 0% | 1 |
9 | BEAM CHOPPING SYSTEM | 0 | 100% | 0% | 1 |
10 | CHARGE MODULATION | 0 | 100% | 0% | 1 |
Journals |
Reviews |
Title | Publ. year | Cit. | Active references |
% act. ref. to same field |
---|---|---|---|---|
PICOSECOND NONINVASIVE OPTICAL-DETECTION OF INTERNAL ELECTRICAL SIGNALS IN FLIP-CHIP-MOUNTED SILICON INTEGRATED-CIRCUITS | 1990 | 21 | 18 | 50% |
ELECTRON-BEAM TESTING OF PASSIVATED DEVICES VIA CAPACITIVE COUPLING VOLTAGE CONTRAST | 1988 | 9 | 3 | 100% |
ELECTRON-BEAM TESTING | 1989 | 11 | 32 | 53% |
FUNDAMENTALS OF ELECTRON-BEAM TESTING OF INTEGRATED-CIRCUITS | 1983 | 84 | 7 | 71% |
DEVELOPMENTS IN VOLTAGE CONTRAST | 1988 | 6 | 11 | 82% |
PICOSECOND PHOTOEMISSION PROBING OF INTEGRATED-CIRCUITS - CAPABILITIES, LIMITATIONS, AND APPLICATIONS | 1990 | 2 | 16 | 88% |
ELECTRON-BEAM TESTING - METHODS AND APPLICATIONS | 1983 | 45 | 2 | 100% |
SECONDARY-ELECTRON DETECTION SYSTEMS FOR QUANTITATIVE VOLTAGE MEASUREMENTS | 1983 | 40 | 3 | 100% |
DETECTORS FOR QUANTITATIVE ELECTRON-BEAM VOLTAGE MEASUREMENTS | 1988 | 3 | 12 | 100% |
VOLTAGE MEASUREMENT IN THE SCANNING ELECTRON-MICROSCOPE | 1987 | 3 | 15 | 93% |
Address terms |
Rank | Address term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | SOREP | 2 | 67% | 0.5% | 2 |
2 | DIAGNOST CHARACTERIZAT GRP | 1 | 50% | 0.2% | 1 |
3 | INTEGRATED CIRCUIT ADV PROC ENGN | 1 | 50% | 0.2% | 1 |
4 | TECNOPOLIS CSATA | 1 | 50% | 0.2% | 1 |
5 | ELECT QUAL RELIABIL | 0 | 33% | 0.2% | 1 |
6 | ADV PROC DEVICE DEV GRP | 0 | 100% | 0.2% | 1 |
7 | E BEAM INSPECT | 0 | 100% | 0.2% | 1 |
8 | FG HLB PVCOMB | 0 | 100% | 0.2% | 1 |
9 | NEW TECHNOL PROTOTYPING | 0 | 100% | 0.2% | 1 |
10 | SEMICOND DEVICE FAILURE ANALYSIS GRP | 0 | 100% | 0.2% | 1 |
Related classes at same level (level 1) |
Rank | Relatedness score | Related classes |
---|---|---|
1 | 0.0000192797 | MICROCOLUMN//SCHOTTKY EMITTER//PROD DESIGN TECHNOL |
2 | 0.0000166932 | SCANNING//SECONDARY EMISSION NOISE//INTEGRATED CIRCUIT ADV PROC TECHNOL |
3 | 0.0000161239 | LAMACOP//SECONDARY ELECTRON EMISSION//ALUMINA INSULATOR |
4 | 0.0000144373 | ROTATION MAGNETIZATION//ELECTRO OPTIC SAMPLING//ELECTROOPTIC PROBING |
5 | 0.0000090491 | CANONICAL ABERRATION THEORY//OPT PHYS ELECT ENGN//ACCURACY OF COMPUTATION |
6 | 0.0000080442 | CARL EMILY FUCHS MICROELECT//CEFIM//EUROPEAN QUAL |
7 | 0.0000067133 | MEAN PENETRATION DEPTH//CONTINUOUS SLOWING DOWN APPROXIMATION//DOPANT CONTRAST |
8 | 0.0000062723 | CATHODE LENS//SPECTROMICROSCOPY//PHOTOEMISSION MICROSCOPY |
9 | 0.0000054101 | DESIGN ERROR DIAGNOSIS//PASS FAIL INFORMATION//WITT POLYNOMIAL |
10 | 0.0000044226 | BETA TIN STRUCTURE//CATHODOLUMINESENCE//ELECTRICAL HARDNESS |