Class information for: |
Basic class information |
ID | Publications | Average number of references |
Avg. shr. active ref. in WoS |
---|---|---|---|
20150 | 411 | 13.0 | 39% |
Classes in level above (level 2) |
ID, lev. above |
Publications | Label for level above |
---|---|---|
97 | 24964 | IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES//IEEE MICROWAVE AND WIRELESS COMPONENTS LETTERS//MICROWAVE AND OPTICAL TECHNOLOGY LETTERS |
Terms with highest relevance score |
Rank | Term | Type of term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|---|
1 | SCATTERING PARAMETER MEASUREMENT | Author keyword | 9 | 45% | 4% | 15 |
2 | SCATTERING MATRIX MEASUREMENT | Author keyword | 8 | 100% | 1% | 5 |
3 | MICROWAVE NETWORK ANALYZER | Author keyword | 7 | 64% | 2% | 7 |
4 | 16 TERM ERROR MODEL | Author keyword | 6 | 80% | 1% | 4 |
5 | VNA CALIBRATION | Author keyword | 6 | 71% | 1% | 5 |
6 | MULTIPORT NETWORK | Author keyword | 6 | 50% | 2% | 9 |
7 | VECTOR NETWORK ANALYZER VNA | Author keyword | 6 | 28% | 4% | 18 |
8 | TWO TIER CALIBRATION | Author keyword | 4 | 75% | 1% | 3 |
9 | CIRCUIT THEORY GRP | Address | 3 | 100% | 1% | 3 |
10 | DIFFERENTIAL INTERCONNECT | Author keyword | 3 | 100% | 1% | 3 |
Web of Science journal categories |
Author Key Words |
Key Words Plus |
Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | NETWORK ANALYZER CALIBRATION | 33 | 67% | 7% | 30 |
2 | NETWORK ANALYZER | 12 | 23% | 11% | 45 |
3 | ANALYZER SELF CALIBRATION | 6 | 80% | 1% | 4 |
4 | TRL CALIBRATION | 6 | 100% | 1% | 4 |
5 | 2 PORT NETWORK ANALYZER | 5 | 54% | 2% | 7 |
6 | UNTERMINATING MICROWAVE FIXTURES | 4 | 75% | 1% | 3 |
7 | RIGOROUS TECHNIQUE | 4 | 56% | 1% | 5 |
8 | LEAKAGE ERRORS | 3 | 100% | 1% | 3 |
9 | 16 TERM ERROR MODEL | 3 | 60% | 1% | 3 |
10 | PORT NETWORK | 2 | 44% | 1% | 4 |
Journals |
Reviews |
Address terms |
Rank | Address term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | CIRCUIT THEORY GRP | 3 | 100% | 0.7% | 3 |
2 | SMART RADIOS WIRELESS SMARAD | 1 | 50% | 0.5% | 2 |
3 | RADIOFREQUENCY MICROWAVE ENGN | 1 | 27% | 0.7% | 3 |
4 | ADV PACKAGING INTERCONNECT TECHNOL GRP | 1 | 50% | 0.2% | 1 |
5 | HFE | 1 | 50% | 0.2% | 1 |
6 | HOCHFREQUENZTECHN FUNKSYST | 1 | 50% | 0.2% | 1 |
7 | MICROWAVE MEASUREMENTS | 1 | 50% | 0.2% | 1 |
8 | RPG PL | 1 | 50% | 0.2% | 1 |
9 | SYST PACKAGE DEVICES GRP | 1 | 50% | 0.2% | 1 |
10 | TECNOL TELECOMUNICAC CATALUNYA | 1 | 50% | 0.2% | 1 |
Related classes at same level (level 1) |
Rank | Relatedness score | Related classes |
---|---|---|
1 | 0.0000222545 | SIX PORT//SIX PORT REFLECTOMETER//SIX PORT CALIBRATION |
2 | 0.0000200229 | NOISE PARAMETERS//HIGH FREQUENCY HF NOISE//KINK PHENOMENON |
3 | 0.0000164067 | IN CIRCUIT MEASUREMENT//COMPUTER AIDED DESIGN CAD TECHNIQUES//HIGH POWER RF TRANSISTORS |
4 | 0.0000110461 | RADIAL STUB RESONATOR//RADIAL STUBS//SPECIAL PURPOSE PROC DEV GRP |
5 | 0.0000090295 | SYNTHESIS FORMULAS//CYLINDRICAL MICROSTRIP LINE//CAD ORIENTED FORMULAS |
6 | 0.0000088892 | GROUP DELAY ENGINEERING//ALL PASS NETWORKS//TERAHERZTS ELECT |
7 | 0.0000088510 | SIMULTANEOUS SWITCHING NOISE//SIMULTANEOUS SWITCHING NOISE SSN//GROUND BOUNCE NOISE GBN |
8 | 0.0000085037 | PERMITTIVITY MEASUREMENT//PL MICROWAVE NONDESTRUCT TESTING//CAVITY PERTURBATION METHOD |
9 | 0.0000080785 | INTERCONNECT MODELING//MOMENT MATCHING TECHNIQUES//HIGH SPEED INTERCONNECTS |
10 | 0.0000074665 | SPIRAL INDUCTOR//MASTERSLICE//INDUCTOR MODEL |