Class information for:
Level 1: TRANSITION FAULTS//FUNCTIONAL BROADSIDE TESTS//JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS

Basic class information
ID Publications Average number
of references		 Avg. shr. active
ref. in WoS
2015 2322 20.9 29%


Bar chart of Publication_year

Last years might be incomplete

Classes in level above (level 2)


ID, lev.
above		 Publications Label for level above
1040 9640 JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS//IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS//SINGLE EVENT UPSET SEU

Terms with highest relevance score


Rank Term Type of term Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class
1 TRANSITION FAULTS Author keyword 106 81% 3% 64
2 FUNCTIONAL BROADSIDE TESTS Author keyword 81 96% 1% 25
3 JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS Journal 78 26% 11% 259
4 TEST DATA COMPRESSION Author keyword 78 60% 4% 85
5 IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS Journal 64 11% 23% 528
6 PATH DELAY FAULTS Author keyword 60 80% 2% 37
7 DELAY TESTING Author keyword 58 63% 3% 59
8 TEST RESPONSE COMPACTION Author keyword 40 82% 1% 23
9 BROADSIDE TESTS Author keyword 39 80% 1% 24
10 DESIGN FOR TESTABILITY Author keyword 37 29% 5% 109

Web of Science journal categories

Author Key Words


Rank Web of Science journal category Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class		 LCSH search Wikipedia search
1 TRANSITION FAULTS 106 81% 3% 64 Search TRANSITION+FAULTS Search TRANSITION+FAULTS
2 FUNCTIONAL BROADSIDE TESTS 81 96% 1% 25 Search FUNCTIONAL+BROADSIDE+TESTS Search FUNCTIONAL+BROADSIDE+TESTS
3 TEST DATA COMPRESSION 78 60% 4% 85 Search TEST+DATA+COMPRESSION Search TEST+DATA+COMPRESSION
4 PATH DELAY FAULTS 60 80% 2% 37 Search PATH+DELAY+FAULTS Search PATH+DELAY+FAULTS
5 DELAY TESTING 58 63% 3% 59 Search DELAY+TESTING Search DELAY+TESTING
6 TEST RESPONSE COMPACTION 40 82% 1% 23 Search TEST+RESPONSE+COMPACTION Search TEST+RESPONSE+COMPACTION
7 BROADSIDE TESTS 39 80% 1% 24 Search BROADSIDE+TESTS Search BROADSIDE+TESTS
8 DESIGN FOR TESTABILITY 37 29% 5% 109 Search DESIGN+FOR+TESTABILITY Search DESIGN+FOR+TESTABILITY
9 SCAN BASED TESTING 35 89% 1% 16 Search SCAN+BASED+TESTING Search SCAN+BASED+TESTING
10 TEST GENERATION 34 25% 5% 117 Search TEST+GENERATION Search TEST+GENERATION

Key Words Plus


Rank Web of Science journal category Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class
1 SEQUENTIAL CIRCUITS 33 44% 2% 57
2 TEST DATA COMPRESSION 28 62% 1% 29
3 TRANSITION FAULTS 27 92% 0% 11
4 TEST PATTERN GENERATION 26 46% 2% 43
5 A CHIP TEST 24 61% 1% 25
6 ATPG 20 45% 1% 34
7 TEST GENERATION 20 21% 4% 82
8 IN SELF TEST 17 29% 2% 50
9 COMBINATIONAL CIRCUITS 17 34% 2% 40
10 BIST 16 24% 3% 60

Journals


Rank Web of Science journal category Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class
1 JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS 78 26% 11% 259
2 IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS 64 11% 23% 528
3 IEEE DESIGN & TEST OF COMPUTERS 24 15% 6% 148
4 IET COMPUTERS AND DIGITAL TECHNIQUES 8 14% 2% 54

Reviews


Title Publ. year Cit. Active
references		 % act. ref.
to same field
Resource-constrained system-on-a-chip test: a survey 2005 25 27 96%
Testing and built-in self-test - A survey 2000 27 22 68%
Integrated circuit testing for quality assurance in manufacturing: History, current status, and future trends 1997 25 16 63%
DESIGN FOR TESTABILITY - A SURVEY 1982 96 1 100%
DESIGN FOR TESTABILITY - A SURVEY 1983 111 3 100%
TESTABILITY MEASURES - A REVIEW 1988 0 3 100%
REVIEW OF BUILT-IN TEST METHODOLOGIES FOR GATE ARRAYS 1985 0 9 100%

Address terms


Rank Address term Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class
1 COMP AIDED DESIGN TEST GRP 33 100% 0.6% 13
2 ELECT SYST DESIGN GRP 4 31% 0.5% 12
3 COMP DESIGN TEST 4 75% 0.1% 3
4 RELIABLE HIGH PERFORMANCE COMP 4 22% 0.6% 14
5 FAULT TOLERANT COMP GRP 3 50% 0.2% 5
6 IC DESIGN DIGITAL DESIGN TEST 3 57% 0.2% 4
7 ELECT DESIGN COMMUN COMP 3 100% 0.1% 3
8 BIONANOELECT GRP 2 67% 0.1% 2
9 CUHK RELIABLE COMP 2 67% 0.1% 2
10 CUHK RELIABLE COMP CURE 2 67% 0.1% 2

Related classes at same level (level 1)


Rank Relatedness score Related classes
1 0.0000216181 DESIGN ERROR DIAGNOSIS//PASS FAIL INFORMATION//WITT POLYNOMIAL
2 0.0000213440 ITERATIVE LOGIC ARRAYS//C TESTABILITY//CELL FAULT MODEL
3 0.0000100800 STATE ASSIGNMENT//FSM SYNTHESIS//LOGIC SYNTHESIS
4 0.0000091168 TRACE SIGNAL SELECTION//SILICON DEBUG//REAL TIME TRACE
5 0.0000085271 BUILT IN REDUNDANCY ANALYSIS BIRA//CATASTROPHIC FAULT PATTERNS//CRITICAL AREA
6 0.0000073961 UNIDIRECTIONAL ERRORS//SELF CHECKING CIRCUITS//BALANCED CODES
7 0.0000071541 SYST LEVEL INTEGRAT GRP//DYNAMIC PARTIAL RECONFIGURATION DPR//DYNAMICALLY PROGRAMMABLE GATE ARRAY
8 0.0000064958 IBM SYST TECHNOL GRP//390//SERVER GRP
9 0.0000063877 JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS//ANALOG FAULT DIAGNOSIS//LOOPBACK TEST
10 0.0000062897 HIGH LEVEL SYNTHESIS//BEHAVIORAL SYNTHESIS//MODULE SELECTION