Class information for:
Level 1: VIBRATING CAPACITOR//SEMICOND EQUIPMENT OPERAT//SURFACE VOLTAGE

Basic class information
ID Publications Average number
of references		 Avg. shr. active
ref. in WoS
20131 411 10.5 38%


Bar chart of Publication_year

Last years might be incomplete

Classes in level above (level 2)


ID, lev.
above		 Publications Label for level above
3206 1558 12CAO CENTER DOT 7AL2O3//C12A7//POTASSIUM ANIONS

Terms with highest relevance score


Rank Term Type of term Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ.
in class
1 VIBRATING CAPACITOR Author keyword 5 54% 2% 7
2 SEMICOND EQUIPMENT OPERAT Address 2 40% 1% 4
3 SURFACE VOLTAGE Author keyword 2 31% 1% 5
4 CHARGE PCD Author keyword 1 50% 0% 1
5 METAL OXIDE SERNICONDUCTOR Author keyword 1 50% 0% 1
6 MOS CAPACITOR BREAKDOWN Author keyword 1 50% 0% 1
7 SIO2 SI STRUCTURES Author keyword 1 50% 0% 1
8 STRUCTURE PARAMETER OPTIMIZATION Author keyword 1 50% 0% 1
9 DEUTERIUM PASSIVATION Author keyword 0 33% 0% 1
10 INTERFACE TRAP LEVEL DENSITY Author keyword 0 33% 0% 1

Web of Science journal categories

Author Key Words


Rank Web of Science journal category Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ.
in class		 LCSH search Wikipedia search
1 VIBRATING CAPACITOR 5 54% 2% 7 Search VIBRATING+CAPACITOR Search VIBRATING+CAPACITOR
2 SURFACE VOLTAGE 2 31% 1% 5 Search SURFACE+VOLTAGE Search SURFACE+VOLTAGE
3 CHARGE PCD 1 50% 0% 1 Search CHARGE+PCD Search CHARGE+PCD
4 METAL OXIDE SERNICONDUCTOR 1 50% 0% 1 Search METAL+OXIDE+SERNICONDUCTOR Search METAL+OXIDE+SERNICONDUCTOR
5 MOS CAPACITOR BREAKDOWN 1 50% 0% 1 Search MOS+CAPACITOR+BREAKDOWN Search MOS+CAPACITOR+BREAKDOWN
6 SIO2 SI STRUCTURES 1 50% 0% 1 Search SIO2+SI+STRUCTURES Search SIO2+SI+STRUCTURES
7 STRUCTURE PARAMETER OPTIMIZATION 1 50% 0% 1 Search STRUCTURE+PARAMETER+OPTIMIZATION Search STRUCTURE+PARAMETER+OPTIMIZATION
8 DEUTERIUM PASSIVATION 0 33% 0% 1 Search DEUTERIUM+PASSIVATION Search DEUTERIUM+PASSIVATION
9 INTERFACE TRAP LEVEL DENSITY 0 33% 0% 1 Search INTERFACE+TRAP+LEVEL+DENSITY Search INTERFACE+TRAP+LEVEL+DENSITY
10 TUNNEL CURRENT 0 11% 1% 3 Search TUNNEL+CURRENT Search TUNNEL+CURRENT

Key Words Plus


Rank Web of Science journal category Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ.
in class
1 VIBRATING CAPACITOR 2 40% 1% 4
2 IMPLANTERS 2 43% 1% 3
3 BF2 IMPLANTATION 1 40% 0% 2
4 CURRENT IMPLANTERS 1 50% 0% 1
5 ENERGY CONTAMINATION 1 50% 0% 1
6 ELECTRON BEAM ENHANCEMENT 1 29% 0% 2
7 DOSING ACCURACY 0 11% 0% 2
8 SCAN PATTERN 0 100% 0% 1
9 VARIAN 180XP 0 100% 0% 1

Journals

Reviews


Title Publ. year Cit. Active
references		 % act. ref.
to same field
REVIEW OF SECONDARY-ION MASS-SPECTROMETRY CHARACTERIZATION OF CONTAMINATION ASSOCIATED WITH ION-IMPLANTATION 1994 16 42 38%
CANAL RAYS TO ION-IMPLANTATION - 1886-1986 1987 0 3 67%

Address terms


Rank Address term Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ.
in class
1 SEMICOND EQUIPMENT OPERAT 2 40% 1.0% 4
2 SIBERIAN BRANCH RUSSIAN 0 33% 0.2% 1
3 ELE OPHYS IL 0 25% 0.2% 1
4 MEMORY MFG OPERAT 0 25% 0.2% 1
5 MOS4YOU 0 20% 0.2% 1
6 SUNGKYUNKWAN ADV NANO TECHNOL 0 10% 0.2% 1
7 CHAIR ELECT IL 0 100% 0.2% 1
8 CHEM TECHNOL RARE ELEMENTS MINERAL SOURC 0 100% 0.2% 1
9 SEMICOND EQUIPMENT OPEAT 0 100% 0.2% 1

Related classes at same level (level 1)


Rank Relatedness score Related classes
1 0.0000123144 RANGE PARAMETERS//SOFT ERROR MAPPING//HIGH ENERGY ION IMPLANTATION
2 0.0000116537 ATOMIC LAYER ETCHING//GATE CHARGING//NEUTRAL BEAM ETCHING
3 0.0000107399 NEGATIVE ION IMPLANTATION//DELTA LAYERED NANOPARTICLES//AB INITIO MOLECULAR ORBITAL METHODS
4 0.0000059072 MODERN FLUID PHYS//KINETIC MODEL EQUATION//PROP DIRECTORATE AFRL RZSA
5 0.0000052400 ECR PLASMA//UNIFORM PLASMA//MAGNETIC MULTIPOLE FIELD
6 0.0000052085 RFQ ACCELERATOR//RFQ//SFRFQ
7 0.0000051906 PHASE SCAN//MICRO TELECOMMUNICATIONS COMPUTING ARCHITECTURE//IQ DETECTION
8 0.0000051692 SIMOX//BURIED OXIDE LAYER//CONTACTLESS I V METHOD
9 0.0000044184 PHOTOCARRIER RADIOMETRY//CADIFT//PHOTOTHERMAL OPTOELECT DIAGNOST S
10 0.0000037843 TRANSIENT ENHANCED DIFFUSION//SWAMP//PAIR DIFFUSION MODEL