Class information for: |
Basic class information |
ID | Publications | Average number of references |
Avg. shr. active ref. in WoS |
---|---|---|---|
20124 | 412 | 26.0 | 64% |
Classes in level above (level 2) |
ID, lev. above |
Publications | Label for level above |
---|---|---|
588 | 13481 | TEXTURES AND MICROSTRUCTURES//SECONDARY RECRYSTALLIZATION//RECRYSTALLIZATION |
Terms with highest relevance score |
Rank | Term | Type of term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|---|
1 | THREE DIMENSIONAL X RAY DIFFRACTION | Author keyword | 15 | 88% | 2% | 7 |
2 | 3DXRD | Author keyword | 12 | 50% | 4% | 18 |
3 | DIFFRACTION CONTRAST TOMOGRAPHY | Author keyword | 11 | 69% | 2% | 9 |
4 | FUNDAMENTAL MET STRUCT DIMENS 4 | Address | 9 | 29% | 6% | 26 |
5 | MICRO BEAM LAUE DIFFRACTION | Author keyword | 6 | 80% | 1% | 4 |
6 | HIGH ENERGY X RAY DIFFRACTION MICROSCOPY | Author keyword | 4 | 75% | 1% | 3 |
7 | POLYCHROMATIC X RAY MICRODIFFRACTION | Author keyword | 4 | 75% | 1% | 3 |
8 | LAUE MICRODIFFRACTION | Author keyword | 3 | 57% | 1% | 4 |
9 | 3D X RAY DIFFRACTION | Author keyword | 3 | 100% | 1% | 3 |
10 | HIGH ENERGY SYNCHROTRON RADIATION | Author keyword | 3 | 33% | 2% | 8 |
Web of Science journal categories |
Author Key Words |
Key Words Plus |
Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | INDIVIDUAL GRAINS | 33 | 67% | 7% | 30 |
2 | STRUCTURAL MICROSCOPY | 17 | 72% | 3% | 13 |
3 | FAST METHODOLOGY | 11 | 100% | 1% | 6 |
4 | INDIVIDUAL BULK GRAINS | 8 | 40% | 4% | 16 |
5 | WHITE BEAM | 7 | 57% | 2% | 8 |
6 | DIFFRACTION CONTRAST TOMOGRAPHY | 6 | 48% | 2% | 10 |
7 | CONTRAST TOMOGRAPHY | 6 | 36% | 3% | 14 |
8 | BULK GRAINS | 6 | 43% | 2% | 10 |
9 | MICROBEAM DIFFRACTION | 5 | 60% | 1% | 6 |
10 | ENERGY SYNCHROTRON RADIATION | 5 | 23% | 5% | 19 |
Journals |
Reviews |
Title | Publ. year | Cit. | Active references | % act. ref. to same field |
---|---|---|---|---|
New opportunities for quantitative tracking of polycrystal responses in three dimensions | 2015 | 1 | 31 | 42% |
Quantitative X-ray tomography | 2014 | 34 | 362 | 11% |
X-ray microscopy in four dimensions | 2006 | 40 | 49 | 47% |
The three dimensional X-ray diffraction technique | 2012 | 6 | 24 | 50% |
Tutorial on x-ray microLaue diffraction | 2009 | 16 | 33 | 36% |
Microstructural characterization of polycrystalline materials by synchrotron X-rays | 2013 | 3 | 63 | 40% |
Polychromatic microdiffraction characterization of defect gradients in severely deformed materials | 2009 | 12 | 29 | 38% |
GRAINDEX and related analysis | 2004 | 0 | 18 | 83% |
Orientation mapping | 2004 | 0 | 10 | 50% |
Alternative approaches | 2004 | 0 | 18 | 50% |
Address terms |
Rank | Address term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | FUNDAMENTAL MET STRUCT DIMENS 4 | 9 | 29% | 6.3% | 26 |
2 | FUNDAMENTAL MET STRUCT 4 DIMENS | 3 | 40% | 1.5% | 6 |
3 | FUNDAMENTAL METAL STRUCT DIMENS 4 | 2 | 67% | 0.5% | 2 |
4 | GEMPPM MATEIS | 2 | 67% | 0.5% | 2 |
5 | XSD ADV PHOTON SOURCE | 2 | 67% | 0.5% | 2 |
6 | FUNDAMENTAL MET STRUCT FOUR DIMENS | 2 | 25% | 1.5% | 6 |
7 | FUNDAMENTAL GLASS TIME | 1 | 100% | 0.5% | 2 |
8 | PHYS PHYS TECHN | 1 | 100% | 0.5% | 2 |
9 | UMR SPRAM CNRS CEA UJF | 1 | 100% | 0.5% | 2 |
10 | BP INT ADV MAT | 1 | 50% | 0.2% | 1 |
Related classes at same level (level 1) |
Rank | Relatedness score | Related classes |
---|---|---|
1 | 0.0000281553 | 111 ROTATION MECHANISM//ALUMINUM SINGLE CRYSTAL//RECRYSTALLIZED GRAIN |
2 | 0.0000216780 | KIKUCHI LINES//ELECTRON CHANNELING CONTRAST IMAGING ECCI//ACOM |
3 | 0.0000167618 | REUSS MODEL//RESIDUAL STRESS ANALYSIS//X RAY STRESS MEASUREMENT |
4 | 0.0000152306 | TEXTURES AND MICROSTRUCTURES//WIMV METHOD//TEXTURE GONIOMETRY |
5 | 0.0000138779 | LINE PROFILE ANALYSIS//X RAY PEAK PROFILE ANALYSIS//WHOLE POWDER PATTERN MODELLING |
6 | 0.0000135599 | CRYSTAL PLASTICITY//DISLOCATION BOUNDARIES//STRAIN PATH CHANGE |
7 | 0.0000106418 | DISLOCATION DYNAMICS//DISCRETE DISLOCATION DYNAMICS//DISLOCATION STARVATION |
8 | 0.0000090663 | X RAY MICROSCOPY//FRESNEL ZONE PLATES//RONTGENPHYS |
9 | 0.0000084490 | SOLUTE DRAG//FERRITE GROWTH//MIXED MODE KINETICS |
10 | 0.0000081954 | IN SITU HEATING EXPERIMENT//TEMPERATURE GRADIENT ZONE MELTING//MUSHY ZONE DYNAMICS |