Class information for:
Level 1: INTERCONNECT MODELING//MOMENT MATCHING TECHNIQUES//HIGH SPEED INTERCONNECTS

Basic class information
ID Publications Average number
of references		 Avg. shr. active
ref. in WoS
2007 2324 18.9 44%


Bar chart of Publication_year

Last years might be incomplete

Classes in level above (level 2)


ID, lev.
above		 Publications Label for level above
1406 7566 IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY//SIGNAL INTEGRITY//REVERBERATION CHAMBER RC

Terms with highest relevance score


Rank Term Type of term Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class
1 INTERCONNECT MODELING Author keyword 37 63% 2% 37
2 MOMENT MATCHING TECHNIQUES Author keyword 20 100% 0% 9
3 HIGH SPEED INTERCONNECTS Author keyword 19 40% 2% 37
4 MULTICONDUCTOR TRANSMISSION LINES Author keyword 19 33% 2% 46
5 CAPACITANCE EXTRACTION Author keyword 18 46% 1% 29
6 MODEL ORDER REDUCTION Author keyword 17 17% 4% 92
7 SIGNAL INTEGRITY Author keyword 17 16% 4% 95
8 WIRE SIZING Author keyword 16 56% 1% 20
9 NONUNIFORM TRANSMISSION LINES Author keyword 15 49% 1% 23
10 INCIDENT FIELDS Author keyword 15 82% 0% 9

Web of Science journal categories

Author Key Words


Rank Web of Science journal category Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class		 LCSH search Wikipedia search
1 INTERCONNECT MODELING 37 63% 2% 37 Search INTERCONNECT+MODELING Search INTERCONNECT+MODELING
2 MOMENT MATCHING TECHNIQUES 20 100% 0% 9 Search MOMENT+MATCHING+TECHNIQUES Search MOMENT+MATCHING+TECHNIQUES
3 HIGH SPEED INTERCONNECTS 19 40% 2% 37 Search HIGH+SPEED+INTERCONNECTS Search HIGH+SPEED+INTERCONNECTS
4 MULTICONDUCTOR TRANSMISSION LINES 19 33% 2% 46 Search MULTICONDUCTOR+TRANSMISSION+LINES Search MULTICONDUCTOR+TRANSMISSION+LINES
5 CAPACITANCE EXTRACTION 18 46% 1% 29 Search CAPACITANCE+EXTRACTION Search CAPACITANCE+EXTRACTION
6 MODEL ORDER REDUCTION 17 17% 4% 92 Search MODEL+ORDER+REDUCTION Search MODEL+ORDER+REDUCTION
7 SIGNAL INTEGRITY 17 16% 4% 95 Search SIGNAL+INTEGRITY Search SIGNAL+INTEGRITY
8 WIRE SIZING 16 56% 1% 20 Search WIRE+SIZING Search WIRE+SIZING
9 NONUNIFORM TRANSMISSION LINES 15 49% 1% 23 Search NONUNIFORM+TRANSMISSION+LINES Search NONUNIFORM+TRANSMISSION+LINES
10 INCIDENT FIELDS 15 82% 0% 9 Search INCIDENT+FIELDS Search INCIDENT+FIELDS

Key Words Plus


Rank Web of Science journal category Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class
1 MULTICONDUCTOR TRANSMISSION LINES 61 54% 3% 78
2 FREQUENCY DEPENDENT PARAMETERS 58 86% 1% 30
3 WAVE FORM EVALUATION 57 49% 4% 85
4 REPEATER INSERTION 26 69% 1% 22
5 HIGH SPEED INTERCONNECTS 20 47% 1% 32
6 FORM RELAXATION ANALYSIS 18 89% 0% 8
7 COUPLED TRANSMISSION LINES 17 62% 1% 18
8 ELMORE DELAY 16 56% 1% 20
9 MULTILAYERED DIELECTRIC MEDIA 16 65% 1% 15
10 LANCZOS PROCESS 16 51% 1% 22

Journals

Reviews


Title Publ. year Cit. Active
references		 % act. ref.
to same field
Simulation of high-speed interconnects 2001 286 59 83%
Digital circuit optimization via geometric programming 2005 54 92 27%
Progress in the methodologies for the electrical modeling of interconnects and electronic packages 2001 68 60 48%
Performance optimization of VLSI interconnect layout 1996 120 34 21%
Design and verification of high-speed VLSI physical design 2005 0 58 64%
A Survey on FDTD-Based Interconnect Modeling 2015 0 70 31%
An efficient technique for solving the arbitrarily multilayered electrostatic problems with singularity arising from a degenerate boundary 2004 2 11 27%
SILICON MULTICHIP MODULES - EVOLVING A HIGH-PERFORMANCE TECHNOLOGY FROM LOW-END APPLICATIONS 1995 0 8 50%

Address terms


Rank Address term Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class
1 UAQ EMC 5 25% 0.7% 16
2 IRSEEM ELECT EMBEDDED SYST 4 67% 0.2% 4
3 ISRAEL DEV 4 56% 0.2% 5
4 ADV VLSI 2 44% 0.2% 4
5 DIP SISTEMI ELETTR AUTOMAZ 2 67% 0.1% 2
6 MICRO CUSTOM LSI 2 67% 0.1% 2
7 AUTOMAT CONTROL ELECT INFORMAT 2 50% 0.1% 3
8 ESAT TELEMIC 2 12% 0.7% 16
9 ESAT TELEM 2 36% 0.2% 4
10 CADENCE DESIGN SYST 1 38% 0.1% 3

Related classes at same level (level 1)


Rank Relatedness score Related classes
1 0.0000189987 SHORT CIRCUIT POWER DISSIPATION//TRANSISTOR SIZING//GATE SIZING
2 0.0000153890 IN CIRCUIT MEASUREMENT//COMPUTER AIDED DESIGN CAD TECHNIQUES//HIGH POWER RF TRANSISTORS
3 0.0000151262 DIELECTRIC CAPACITOR//ROUGHNESS ACCESSIBILITY//CONDUCTOR AND DIELECTRIC LOSSES
4 0.0000148430 PASSIVITY ENFORCEMENT//LINEAR MACROMODELING//VECTOR FITTING
5 0.0000135190 OMNIPOTENT SMITH CHART//CONJUGATELY CHARACTERISTIC IMPEDANCE TRANSMISSION LINE//NONNEGATIVE CHARACTERISTIC RESISTANCE
6 0.0000129662 PARTIAL ELEMENT EQUIVALENT CIRCUIT PEEC//ON CHIP CIRCUITS//PARTIAL ELEMENT EQUIVALENT CIRCUIT
7 0.0000122183 SUBSTRATE NOISE//SUBSTRATE COUPLING//POWER SUPPLY NOISE
8 0.0000117695 WIRE FAULT LOCATION//CABLE BUNDLE//FIABILISAT SYST EMBARQUES
9 0.0000111714 CLOCK TREE//CLOCK SKEW//CLOCK DISTRIBUTION
10 0.0000110621 SYNTHESIS FORMULAS//CYLINDRICAL MICROSTRIP LINE//CAD ORIENTED FORMULAS