Class information for: |
Basic class information |
ID | Publications | Average number of references |
Avg. shr. active ref. in WoS |
---|---|---|---|
19711 | 429 | 13.3 | 38% |
Classes in level above (level 2) |
ID, lev. above |
Publications | Label for level above |
---|---|---|
1406 | 7566 | IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY//SIGNAL INTEGRITY//REVERBERATION CHAMBER RC |
Terms with highest relevance score |
Rank | Term | Type of term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|---|
1 | ELECTROSTATIC DISCHARGE | Author keyword | 8 | 15% | 12% | 50 |
2 | ELECTROSTATICALLY INDUCED VOLTAGE | Author keyword | 6 | 100% | 1% | 4 |
3 | KKU SEAGATE COOPERAT | Address | 6 | 50% | 2% | 8 |
4 | ESD GUN | Author keyword | 5 | 63% | 1% | 5 |
5 | ELECTROSTATIC DISCHARGE ESD GENERATOR | Author keyword | 4 | 75% | 1% | 3 |
6 | PELLEGRINI TARGET | Author keyword | 4 | 75% | 1% | 3 |
7 | ELECTROSTATIC DISCHARGE GENERATORS | Author keyword | 3 | 100% | 1% | 3 |
8 | GENERATED ELECTROMAGNETIC FIELD | Author keyword | 3 | 100% | 1% | 3 |
9 | MOVING CHARGED BODY | Author keyword | 3 | 100% | 1% | 3 |
10 | MOVING ELECTRODE | Author keyword | 3 | 100% | 1% | 3 |
Web of Science journal categories |
Author Key Words |
Key Words Plus |
Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | MR HEADS | 8 | 56% | 2% | 10 |
2 | ESD | 8 | 21% | 8% | 34 |
3 | ELECTROSTATIC DISCHARGE | 6 | 26% | 4% | 19 |
4 | TRANSIENT FIELDS | 5 | 37% | 2% | 10 |
5 | FAILURE LEVELS | 4 | 47% | 2% | 7 |
6 | ELECTRICAL RELIABILITY | 3 | 100% | 1% | 3 |
7 | MAGNETORESISTIVE RECORDING HEADS | 3 | 100% | 1% | 3 |
8 | REFERENCE DISCHARGE EVENT | 2 | 44% | 1% | 4 |
9 | ELECTRIC POTENTIAL SENSORS | 2 | 67% | 0% | 2 |
10 | GENERATOR PARAMETERS | 2 | 36% | 1% | 4 |
Journals |
Reviews |
Address terms |
Rank | Address term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | KKU SEAGATE COOPERAT | 6 | 50% | 1.9% | 8 |
2 | PL ELE OSTAT | 2 | 20% | 1.9% | 8 |
3 | BIOMAGNET BML | 2 | 29% | 1.2% | 5 |
4 | GRP HIGH VOLTAGE ENGN EQUIPMENT | 1 | 50% | 0.5% | 2 |
5 | HDD RD | 1 | 50% | 0.5% | 2 |
6 | STATE MECHATRON ENGN CONTROL | 1 | 100% | 0.5% | 2 |
7 | BML | 1 | 22% | 0.9% | 4 |
8 | ANAL SYST ARCHITECTURE | 1 | 50% | 0.2% | 1 |
9 | ELECT ENGN PL INFORMAT | 1 | 50% | 0.2% | 1 |
10 | ELECT MEASUREMENTS MAT ENGN | 1 | 50% | 0.2% | 1 |
Related classes at same level (level 1) |
Rank | Relatedness score | Related classes |
---|---|---|
1 | 0.0000124754 | AFDELING ESAT MICAS//ELECT ENGN MEASUREMENT SCI//INTENTIONAL ELECTROMAGNETIC INTERFERENCE IEMI |
2 | 0.0000104329 | ANTENNA FACTOR//RADIO SCI SECT//CALCULABLE DIPOLE |
3 | 0.0000103011 | MULTIPROCESSOR COMPUTER ARCHITECTURES//SLEEPING BAG//UPWINDING SCHEME |
4 | 0.0000095311 | FLOW ELECTRIFICATION//JOURNAL OF ELECTROSTATICS//STREAMING ELECTRIFICATION |
5 | 0.0000071810 | NANOELECT GIGASCALE SYST//ELECTROSTATIC DISCHARGE ESD//SILICON CONTROLLED RECTIFIER SCR |
6 | 0.0000060478 | METALLIC ENCLOSURES//SHIELDING EFFECTIVENESS//SHIELDING EFFECTIVENESS SE |
7 | 0.0000059198 | PATH FUNCTIONAL//FLOATING RANDOM WALK//EXODUS METHOD |
8 | 0.0000057990 | MAGNETIC RECORDING READING HEADS//OFF TRACK CAPABILITY//INFORMAT STORAGE TECHNOL |
9 | 0.0000057202 | SPIN VALVE SENSOR//CONDUCTANCE CONTROL//ANALOG ISOLATOR |
10 | 0.0000056654 | CURRENT SCREEN LAYER//CPP GMR//CURRENT PERPENDICULAR TO PLANE |