Class information for:
Level 1: ELLIPSOIDAL TECHNIQUE//DESIGN CENTERING//PARAMETRIC YIELD

Basic class information
ID Publications Average number
of references		 Avg. shr. active
ref. in WoS
19674 430 18.7 32%


Bar chart of Publication_year

Last years might be incomplete

Classes in level above (level 2)


ID, lev.
above		 Publications Label for level above
138 22619 IEEE TRANSACTIONS ON ELECTRON DEVICES//IEEE ELECTRON DEVICE LETTERS//SOLID-STATE ELECTRONICS

Terms with highest relevance score


Rank Term Type of term Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class
1 ELLIPSOIDAL TECHNIQUE Author keyword 4 67% 1% 4
2 DESIGN CENTERING Author keyword 3 24% 2% 10
3 PARAMETRIC YIELD Author keyword 3 24% 2% 10
4 ACCEPTABILITY REGION Author keyword 2 67% 0% 2
5 ACTIVE ELECTRICAL METROLOGY Author keyword 2 67% 0% 2
6 GAUSSIAN ADAPTATION Author keyword 2 67% 0% 2
7 PROCESS FLUCTUATION Author keyword 2 43% 1% 3
8 PROCESS SENSITIVITY Author keyword 1 38% 1% 3
9 BACKWARD PROPAGATION OF VARIANCE Author keyword 1 100% 0% 2
10 BACKWARD PROPAGATION OF VARIANCE BPV Author keyword 1 100% 0% 2

Web of Science journal categories

Author Key Words


Rank Web of Science journal category Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class		 LCSH search Wikipedia search
1 ELLIPSOIDAL TECHNIQUE 4 67% 1% 4 Search ELLIPSOIDAL+TECHNIQUE Search ELLIPSOIDAL+TECHNIQUE
2 DESIGN CENTERING 3 24% 2% 10 Search DESIGN+CENTERING Search DESIGN+CENTERING
3 PARAMETRIC YIELD 3 24% 2% 10 Search PARAMETRIC+YIELD Search PARAMETRIC+YIELD
4 ACCEPTABILITY REGION 2 67% 0% 2 Search ACCEPTABILITY+REGION Search ACCEPTABILITY+REGION
5 ACTIVE ELECTRICAL METROLOGY 2 67% 0% 2 Search ACTIVE+ELECTRICAL+METROLOGY Search ACTIVE+ELECTRICAL+METROLOGY
6 GAUSSIAN ADAPTATION 2 67% 0% 2 Search GAUSSIAN+ADAPTATION Search GAUSSIAN+ADAPTATION
7 PROCESS FLUCTUATION 2 43% 1% 3 Search PROCESS+FLUCTUATION Search PROCESS+FLUCTUATION
8 PROCESS SENSITIVITY 1 38% 1% 3 Search PROCESS+SENSITIVITY Search PROCESS+SENSITIVITY
9 BACKWARD PROPAGATION OF VARIANCE 1 100% 0% 2 Search BACKWARD+PROPAGATION+OF+VARIANCE Search BACKWARD+PROPAGATION+OF+VARIANCE
10 BACKWARD PROPAGATION OF VARIANCE BPV 1 100% 0% 2 Search BACKWARD+PROPAGATION+OF+VARIANCE+BPV Search BACKWARD+PROPAGATION+OF+VARIANCE+BPV

Key Words Plus


Rank Web of Science journal category Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class
1 PROFILE INTERCHANGE FORMAT 11 100% 1% 6
2 YIELD OPTIMIZATION 7 44% 3% 12
3 IC FABRICATION PROCESSES 6 100% 1% 4
4 PARAMETRIC YIELD ESTIMATION 5 63% 1% 5
5 VLSI DEVICE DESIGN 5 63% 1% 5
6 PARAMETRIC YIELD 2 44% 1% 4
7 DIAGNOSIS METHODOLOGY 2 67% 0% 2
8 INTEGRATED CIRCUIT DESIGN 2 50% 1% 3
9 RESPONSE SURFACE METHODS 2 33% 1% 4
10 ARBITRARY STATISTICAL DISTRIBUTIONS 1 100% 0% 2

Journals

Reviews


Title Publ. year Cit. Active
references		 % act. ref.
to same field
INTEGRATED PHYSICS-ORIENTED STATISTICAL MODELING, SIMULATION AND OPTIMIZATION 1992 23 79 30%
ACTIVITIES ON NETWORK THEORY AND CIRCUIT-DESIGN IN EUROPE 1984 0 25 24%

Address terms


Rank Address term Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ.
in class
1 PL COMPUTAT ENGN 1 40% 0.5% 2
2 ROBUST DESIGN 1 33% 0.5% 2
3 CAE TECHNOL 1 50% 0.2% 1
4 MATSUSHITA 0 33% 0.2% 1
5 SYST SCI CONTROL ENGN 0 17% 0.5% 2
6 HIGH PERFORMANCE ANALOG GRP 0 25% 0.2% 1
7 INNOVAT LUCENT TECHNOL 0 25% 0.2% 1
8 PROC DEVICE CHARACTERIZAT 0 25% 0.2% 1
9 UNIV VISVESVARAYA ENGN 0 25% 0.2% 1
10 ELE OMAGNET THEORY MICROELECT ITEM 0 14% 0.2% 1

Related classes at same level (level 1)


Rank Relatedness score Related classes
1 0.0000258085 NONQUASI STATIC NQS EFFECT//QUCS//RSCE
2 0.0000245716 ANALOG CIRCUIT SYNTHESIS//CIRCUIT SIZING//ANALOG DESIGN AUTOMATION
3 0.0000209660 DEVICE MODELLING GRP//RANDOM DOPANT//DEVICE MODELING GRP
4 0.0000156872 SIMULAT OPTIMIZAT SYST//ENGN OPTIMIZAT MODELING//SPACE MAPPING
5 0.0000091051 BUILT IN REDUNDANCY ANALYSIS BIRA//CATASTROPHIC FAULT PATTERNS//CRITICAL AREA
6 0.0000089197 FILM EDGE//SHAPE ENGINEERING//SILICON TECHNOLOGIES
7 0.0000081504 JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS//ANALOG FAULT DIAGNOSIS//LOOPBACK TEST
8 0.0000073044 RUN TO RUN CONTROL//IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING//AUTOMATIC VIRTUAL METROLOGY AVM
9 0.0000072394 LARGE SIGNAL MODEL//NONLINEAR MEASUREMENTS//MESFETS
10 0.0000069225 SRAM//PROCESS VARIATION//POWER GATING