Class information for: |
Basic class information |
ID | Publications | Average number of references |
Avg. shr. active ref. in WoS |
---|---|---|---|
19665 | 430 | 17.4 | 38% |
Classes in level above (level 2) |
ID, lev. above |
Publications | Label for level above |
---|---|---|
923 | 10486 | IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS//IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS//HIGH LEVEL SYNTHESIS |
Terms with highest relevance score |
Rank | Term | Type of term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|---|
1 | SHORT CIRCUIT POWER DISSIPATION | Author keyword | 9 | 83% | 1% | 5 |
2 | TRANSISTOR SIZING | Author keyword | 9 | 34% | 5% | 21 |
3 | GATE SIZING | Author keyword | 8 | 29% | 5% | 22 |
4 | COLUMN DECODER | Author keyword | 4 | 75% | 1% | 3 |
5 | POST LAYOUT OPTIMIZATION | Author keyword | 4 | 75% | 1% | 3 |
6 | CMOS BUFFER | Author keyword | 4 | 56% | 1% | 5 |
7 | DISCRETE GATE SIZING | Author keyword | 3 | 100% | 1% | 3 |
8 | CMOS GATES | Author keyword | 3 | 40% | 1% | 6 |
9 | ALPHA POWER LAW | Author keyword | 2 | 67% | 0% | 2 |
10 | SENSITIZABLE PATH | Author keyword | 2 | 67% | 0% | 2 |
Web of Science journal categories |
Author Key Words |
Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
LCSH search | Wikipedia search |
---|---|---|---|---|---|---|---|
1 | SHORT CIRCUIT POWER DISSIPATION | 9 | 83% | 1% | 5 | Search SHORT+CIRCUIT+POWER+DISSIPATION | Search SHORT+CIRCUIT+POWER+DISSIPATION |
2 | TRANSISTOR SIZING | 9 | 34% | 5% | 21 | Search TRANSISTOR+SIZING | Search TRANSISTOR+SIZING |
3 | GATE SIZING | 8 | 29% | 5% | 22 | Search GATE+SIZING | Search GATE+SIZING |
4 | COLUMN DECODER | 4 | 75% | 1% | 3 | Search COLUMN+DECODER | Search COLUMN+DECODER |
5 | POST LAYOUT OPTIMIZATION | 4 | 75% | 1% | 3 | Search POST+LAYOUT+OPTIMIZATION | Search POST+LAYOUT+OPTIMIZATION |
6 | CMOS BUFFER | 4 | 56% | 1% | 5 | Search CMOS+BUFFER | Search CMOS+BUFFER |
7 | DISCRETE GATE SIZING | 3 | 100% | 1% | 3 | Search DISCRETE+GATE+SIZING | Search DISCRETE+GATE+SIZING |
8 | CMOS GATES | 3 | 40% | 1% | 6 | Search CMOS+GATES | Search CMOS+GATES |
9 | ALPHA POWER LAW | 2 | 67% | 0% | 2 | Search ALPHA+POWER+LAW | Search ALPHA+POWER+LAW |
10 | SENSITIZABLE PATH | 2 | 67% | 0% | 2 | Search SENSITIZABLE+PATH | Search SENSITIZABLE+PATH |
Key Words Plus |
Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | INVERTER DELAY | 19 | 76% | 3% | 13 |
2 | CMOS INVERTER DELAY | 8 | 56% | 2% | 10 |
3 | PROPAGATION DELAY | 2 | 20% | 2% | 10 |
4 | EFFORT MODEL | 2 | 67% | 0% | 2 |
5 | SIMULTANEOUS GATE | 2 | 43% | 1% | 3 |
6 | TAPERED BUFFER | 2 | 43% | 1% | 3 |
7 | MOSFET MODEL | 2 | 12% | 3% | 12 |
8 | DELAY EVALUATION | 1 | 33% | 1% | 3 |
9 | TRANSISTOR SIZING PROBLEM | 1 | 40% | 0% | 2 |
10 | SUBMICRON CMOS | 1 | 16% | 1% | 5 |
Journals |
Reviews |
Address terms |
Rank | Address term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | NANOMETER DESIGN | 1 | 100% | 0.5% | 2 |
2 | ADV TOOLS | 1 | 50% | 0.2% | 1 |
3 | CIRCUIT SIMULAT GRP | 1 | 50% | 0.2% | 1 |
4 | DESIGN ENABLEMENT SERV | 1 | 50% | 0.2% | 1 |
5 | DIGITAL VIDEO TECHNOL | 1 | 50% | 0.2% | 1 |
6 | WIRELESS INFRASTRUCT BRANCH | 1 | 50% | 0.2% | 1 |
7 | INFORMAT PPGC PGMICRO | 0 | 33% | 0.2% | 1 |
8 | EDIFICIO CICA | 0 | 18% | 0.5% | 2 |
9 | INTEGRATED SYST DESIGN | 0 | 25% | 0.2% | 1 |
10 | LIRMM UMR 5506 | 0 | 25% | 0.2% | 1 |
Related classes at same level (level 1) |
Rank | Relatedness score | Related classes |
---|---|---|
1 | 0.0000225662 | SRAM//PROCESS VARIATION//POWER GATING |
2 | 0.0000189987 | INTERCONNECT MODELING//MOMENT MATCHING TECHNIQUES//HIGH SPEED INTERCONNECTS |
3 | 0.0000181370 | CLOCK TREE//CLOCK SKEW//CLOCK DISTRIBUTION |
4 | 0.0000162703 | ITERATIVE LOGIC ARRAYS//C TESTABILITY//CELL FAULT MODEL |
5 | 0.0000159682 | POWER ESTIMATION//SWITCHING ACTIVITY//BUS ENCODING |
6 | 0.0000139644 | PASS TRANSISTOR LOGIC//DIGITAL ARITHMETIC//FIXED WIDTH MULTIPLIER |
7 | 0.0000111235 | SUBSTRATE NOISE//SUBSTRATE COUPLING//POWER SUPPLY NOISE |
8 | 0.0000102803 | NONQUASI STATIC NQS EFFECT//QUCS//RSCE |
9 | 0.0000096182 | PASSIVATED CONTACT//POLYSILICON EMITTER//CLOCK ACCESS TIME |
10 | 0.0000089364 | BALLISTIC MOBILITY//HIGH ELECTRIC FIELD TRANSPORT//TRANSIT TIME DELAY |