Class information for:
Level 1: MEAN PENETRATION DEPTH//CONTINUOUS SLOWING DOWN APPROXIMATION//DOPANT CONTRAST

Basic class information
ID Publications Average number
of references		 Avg. shr. active
ref. in WoS
19558 435 21.2 49%


Bar chart of Publication_year

Last years might be incomplete

Classes in level above (level 2)


ID, lev.
above		 Publications Label for level above
2051 4868 SCANNING//LAMACOP//BACKSCATTERED ELECTRONS

Terms with highest relevance score


Rank Term Type of term Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ.
in class
1 MEAN PENETRATION DEPTH Author keyword 12 86% 1% 6
2 CONTINUOUS SLOWING DOWN APPROXIMATION Author keyword 9 83% 1% 5
3 DOPANT CONTRAST Author keyword 9 67% 2% 8
4 VICANEK AND URBASSEK THEORY Author keyword 6 100% 1% 4
5 SECONDARY ELECTRON POTENTIAL CONTRAST SEPC Author keyword 4 75% 1% 3
6 APPLICATIONS OF MONTE CARLO METHODS Author keyword 3 50% 1% 4
7 MAT SYST ELECT Address 2 38% 1% 5
8 DIFFERENTIAL ELASTIC SCATTERING CROSS SECTION Author keyword 2 67% 0% 2
9 DOPING CONTRAST Author keyword 2 67% 0% 2
10 UFA SETIF Address 2 67% 0% 2

Web of Science journal categories

Author Key Words


Rank Web of Science journal category Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ.
in class		 LCSH search Wikipedia search
1 MEAN PENETRATION DEPTH 12 86% 1% 6 Search MEAN+PENETRATION+DEPTH Search MEAN+PENETRATION+DEPTH
2 CONTINUOUS SLOWING DOWN APPROXIMATION 9 83% 1% 5 Search CONTINUOUS+SLOWING+DOWN+APPROXIMATION Search CONTINUOUS+SLOWING+DOWN+APPROXIMATION
3 DOPANT CONTRAST 9 67% 2% 8 Search DOPANT+CONTRAST Search DOPANT+CONTRAST
4 VICANEK AND URBASSEK THEORY 6 100% 1% 4 Search VICANEK+AND+URBASSEK+THEORY Search VICANEK+AND+URBASSEK+THEORY
5 SECONDARY ELECTRON POTENTIAL CONTRAST SEPC 4 75% 1% 3 Search SECONDARY+ELECTRON+POTENTIAL+CONTRAST+SEPC Search SECONDARY+ELECTRON+POTENTIAL+CONTRAST+SEPC
6 APPLICATIONS OF MONTE CARLO METHODS 3 50% 1% 4 Search APPLICATIONS+OF+MONTE+CARLO+METHODS Search APPLICATIONS+OF+MONTE+CARLO+METHODS
7 DIFFERENTIAL ELASTIC SCATTERING CROSS SECTION 2 67% 0% 2 Search DIFFERENTIAL+ELASTIC+SCATTERING+CROSS+SECTION Search DIFFERENTIAL+ELASTIC+SCATTERING+CROSS+SECTION
8 DOPING CONTRAST 2 67% 0% 2 Search DOPING+CONTRAST Search DOPING+CONTRAST
9 CHANNELING CONTRAST 2 50% 1% 3 Search CHANNELING+CONTRAST Search CHANNELING+CONTRAST
10 DOPANT MAPPING 2 50% 1% 3 Search DOPANT+MAPPING Search DOPANT+MAPPING

Key Words Plus


Rank Web of Science journal category Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ.
in class
1 DIELECTRIC SOLIDS 9 67% 2% 8
2 POSITRON BACKSCATTERING 8 75% 1% 6
3 DOPANT CONTRAST 8 62% 2% 8
4 IMPLANTATION PROFILES 6 50% 2% 8
5 POTENTIAL CONTRAST 4 75% 1% 3
6 DOPED REGIONS 3 57% 1% 4
7 KILOVOLT ELECTRON 3 57% 1% 4
8 BACKSCATTERING PROBABILITIES 3 100% 1% 3
9 KEV ELECTRON 3 26% 2% 9
10 MOTT CROSS SECTIONS 3 42% 1% 5

Journals

Reviews


Title Publ. year Cit. Active
references		 % act. ref.
to same field
Electron-beam interactions with solids 2003 48 5 80%
From the physics of secondary electron emission to image contrasts in scanning electron microscopy 2012 9 42 26%
Toward Quantitative Scanning Electron Microscopy 2014 2 42 19%
A new type of scanning electron microscope using the coaxial backscattered electrons 2002 2 2 100%
Electrons impinging on solid targets 2003 0 2 100%
A comparative study between slow electrons and positrons transport in solid thin films 2009 0 24 63%
Monte Carlo simulations 2003 0 11 73%
On the spatial resolution and nanoscale feature visibility in scanning electron microscopy 2002 2 18 61%
Inelastic scattering 2003 1 5 60%
Elastic scattering 2003 0 3 33%

Address terms


Rank Address term Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ.
in class
1 MAT SYST ELECT 2 38% 1.1% 5
2 UFA SETIF 2 67% 0.5% 2
3 MAT ELECT SYST LMSE 1 100% 0.5% 2
4 QUAL MANAGEMENT FAILURE ANAL 1 100% 0.5% 2
5 FRONT END PROC GRP 1 50% 0.2% 1
6 ICPMBCNRSFR 2843 1 50% 0.2% 1
7 PHYS MOL ISICPMBFR 2843 1 50% 0.2% 1
8 QD 1 50% 0.2% 1
9 ALIS BUSINESS UNIT 1 29% 0.5% 2
10 MAT BIOFIS MED 0 33% 0.2% 1

Related classes at same level (level 1)


Rank Relatedness score Related classes
1 0.0000251375 SCANNING//SECONDARY EMISSION NOISE//INTEGRATED CIRCUIT ADV PROC TECHNOL
2 0.0000222257 STANDARDLESS ANALYSIS//FU 160//TRITIUM ANALYSIS
3 0.0000171273 IMFP//ELASTIC PEAK ELECTRON SPECTROSCOPY//SURFACE EXCITATION
4 0.0000160257 SURFACE EMISSION RATE//ALPHA BETA COUNTING//EXTRAPOLATED RANGE
5 0.0000156196 LAMACOP//SECONDARY ELECTRON EMISSION//ALUMINA INSULATOR
6 0.0000151819 EMISSION STATISTICS//PARTICLE INDUCED ELECTRON EMISSION//KINETIC ELECTRON EMISSION
7 0.0000151617 ADV SPACE STUDIES//NANODOSIMETRY//GEANT4 DNA
8 0.0000118234 POSITRON BEAM//SLOW POSITRON BEAM//POSITRON MICROSCOPE
9 0.0000111150 SECOND ORDER FOCUSING//SPACE PLASMA INSTRUMENT//SPHERICAL CONDENSER
10 0.0000086921 CATHODE LENS//SPECTROMICROSCOPY//PHOTOEMISSION MICROSCOPY