Class information for: |
Basic class information |
| ID | Publications | Average number of references |
Avg. shr. active ref. in WoS |
|---|---|---|---|
| 19410 | 442 | 16.2 | 39% |
Classes in level above (level 2) |
| ID, lev. above |
Publications | Label for level above |
|---|---|---|
| 913 | 10550 | EL2//NONIONIZING ENERGY LOSS NIEL//DX CENTERS |
Terms with highest relevance score |
| Rank | Term | Type of term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
|---|---|---|---|---|---|---|
| 1 | EMISSION RATE SPECTRUM | Author keyword | 2 | 50% | 1% | 3 |
| 2 | CAPACITANCE TRANSIENTS | Author keyword | 1 | 38% | 1% | 3 |
| 3 | DLTS RESOLUTION | Author keyword | 1 | 100% | 0% | 2 |
| 4 | EA2654IUT | Address | 1 | 100% | 0% | 2 |
| 5 | CAPACITANCE FREQUENCY SPECTROSCOPY | Author keyword | 1 | 50% | 0% | 1 |
| 6 | ELECT ENGN MICROELE | Address | 1 | 50% | 0% | 1 |
| 7 | FCFT | Address | 1 | 50% | 0% | 1 |
| 8 | INHOMOGENEOUS CARRIER DISTRIBUTION | Author keyword | 1 | 50% | 0% | 1 |
| 9 | MULTI RESOLUTION TECHNIQUE | Author keyword | 1 | 50% | 0% | 1 |
| 10 | MULTIEXPONENTIAL TRANSIENTS | Author keyword | 1 | 50% | 0% | 1 |
Web of Science journal categories |
Author Key Words |
Key Words Plus |
| Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
|---|---|---|---|---|---|
| 1 | SADLTS | 13 | 69% | 2% | 11 |
| 2 | DLTS SYSTEM | 6 | 100% | 1% | 4 |
| 3 | EXPONENTIALLY WEIGHTED AVERAGE | 3 | 100% | 1% | 3 |
| 4 | DLTS | 3 | 14% | 5% | 20 |
| 5 | INTERFACE STATE PARAMETERS | 2 | 67% | 0% | 2 |
| 6 | BULK TRAPS | 2 | 33% | 1% | 4 |
| 7 | CONSTANT CAPACITANCE DLTS | 1 | 100% | 0% | 2 |
| 8 | FEEDBACK CHARGE METHOD | 1 | 50% | 0% | 2 |
| 9 | NON EXPONENTIAL TRANSIENTS | 1 | 30% | 1% | 3 |
| 10 | MULTIPHONON EMISSION | 1 | 16% | 1% | 5 |
Journals |
Reviews |
| Title | Publ. year | Cit. | Active references | % act. ref. to same field |
|---|---|---|---|---|
| Exponential analysis in physical phenomena | 1999 | 257 | 153 | 29% |
| EXPERIMENTAL METHODS OF CAPACITIVE SPECTROSCOPY OF IMPURITIES WITH DEEP LEVELS IN SEMICONDUCTORS - (REVIEW) | 1985 | 0 | 7 | 71% |
Address terms |
| Rank | Address term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
|---|---|---|---|---|---|
| 1 | EA2654IUT | 1 | 100% | 0.5% | 2 |
| 2 | ELECT ENGN MICROELE | 1 | 50% | 0.2% | 1 |
| 3 | FCFT | 1 | 50% | 0.2% | 1 |
| 4 | ELE ON MICROTECHNOL RUMENTAT | 0 | 25% | 0.2% | 1 |
| 5 | ASSOC MAT SENSORS | 0 | 100% | 0.2% | 1 |
| 6 | EA2654 | 0 | 100% | 0.2% | 1 |
| 7 | ELE OENGN MICROELE | 0 | 100% | 0.2% | 1 |
| 8 | SCI TECHNOL ELECT MAT | 0 | 100% | 0.2% | 1 |
| 9 | UPREA EA2654 | 0 | 100% | 0.2% | 1 |
Related classes at same level (level 1) |
| Rank | Relatedness score | Related classes |
|---|---|---|
| 1 | 0.0000190618 | DX CENTERS//DX CENTER//DX CENTRE |
| 2 | 0.0000147427 | IRRADIATED P N JUNCTION LEAKAGE//JUNCTION SHAPE//P N JUNCTION LEAKAGE |
| 3 | 0.0000138724 | HITACHI ADM//SOLAR CELL METALLIZATION// |
| 4 | 0.0000104698 | GETTERING//GETTERING EFFICIENCY//SI AU |
| 5 | 0.0000101928 | SEMICOND INTEGRATED CIRCUIT//SCI TECH FES SAIS//HIGFET |
| 6 | 0.0000092624 | BITUMEN STRUCTURE//PROTON AFFINITY DISTRIBUTIONS//ITERATIVE ELIMINATION |
| 7 | 0.0000089933 | LIFETIME CONTROL//SEMI INSULATING MATERIALS//POWER DIODES |
| 8 | 0.0000083977 | SURFACE PHOTO CHARGE EFFECT//ACOUSTIC DLTS//TRANSVERSE ACOUSTOELECTRIC EFFECT |
| 9 | 0.0000083358 | STATE SCI EXPT TECH INFORMAT PROTECT PRO//CN PPP//WIDE GAP NANOCRYSTALS |
| 10 | 0.0000069493 | SLOWLY CONVERGENT SERIES//WEEKS METHOD//INVERSION OF LAPLACE TRANSFORM |