Class information for:
Level 1: X RAY MULTIPLE DIFFRACTION//THREE BEAM X RAY DIFFRACTION//RENNINGER SCAN

Basic class information
ID Publications Average number
of references		 Avg. shr. active
ref. in WoS
19175 452 17.6 45%


Bar chart of Publication_year

Last years might be incomplete

Classes in level above (level 2)


ID, lev.
above		 Publications Label for level above
687 12408 JOURNAL OF SYNCHROTRON RADIATION//DIFFRACTION ENHANCED IMAGING//PHASE RETRIEVAL

Terms with highest relevance score


Rank Term Type of term Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ.
in class
1 X RAY MULTIPLE DIFFRACTION Author keyword 13 80% 2% 8
2 THREE BEAM X RAY DIFFRACTION Author keyword 4 75% 1% 3
3 RENNINGER SCAN Author keyword 3 100% 1% 3
4 UMWEGANREGUNG Author keyword 2 67% 0% 2
5 CCSST Address 2 26% 1% 6
6 NANOENGN BUNKYO KU Address 1 100% 0% 2
7 PROGRAMA POS CIENCIAS MAT PGCIMAT Address 1 100% 0% 2
8 ANAMORPHIC MIRRORS Author keyword 1 50% 0% 1
9 CHIROMODINE Author keyword 1 50% 0% 1
10 ENANTIOMER DETERMINATION Author keyword 1 50% 0% 1

Web of Science journal categories

Author Key Words


Rank Web of Science journal category Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ.
in class		 LCSH search Wikipedia search
1 X RAY MULTIPLE DIFFRACTION 13 80% 2% 8 Search X+RAY+MULTIPLE+DIFFRACTION Search X+RAY+MULTIPLE+DIFFRACTION
2 THREE BEAM X RAY DIFFRACTION 4 75% 1% 3 Search THREE+BEAM+X+RAY+DIFFRACTION Search THREE+BEAM+X+RAY+DIFFRACTION
3 RENNINGER SCAN 3 100% 1% 3 Search RENNINGER+SCAN Search RENNINGER+SCAN
4 UMWEGANREGUNG 2 67% 0% 2 Search UMWEGANREGUNG Search UMWEGANREGUNG
5 ANAMORPHIC MIRRORS 1 50% 0% 1 Search ANAMORPHIC+MIRRORS Search ANAMORPHIC+MIRRORS
6 CHIROMODINE 1 50% 0% 1 Search CHIROMODINE Search CHIROMODINE
7 ENANTIOMER DETERMINATION 1 50% 0% 1 Search ENANTIOMER+DETERMINATION Search ENANTIOMER+DETERMINATION
8 FOUR CIRCLE DIFFRACTOMETER 1 50% 0% 1 Search FOUR+CIRCLE+DIFFRACTOMETER Search FOUR+CIRCLE+DIFFRACTOMETER
9 MULTIPLE X RAY DIFFRACTION 1 50% 0% 1 Search MULTIPLE+X+RAY+DIFFRACTION Search MULTIPLE+X+RAY+DIFFRACTION
10 PHASE INVARIANTS 1 50% 0% 1 Search PHASE+INVARIANTS Search PHASE+INVARIANTS

Key Words Plus


Rank Web of Science journal category Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class
1 3 BEAM DIFFRACTION 99 93% 8% 38
2 REFLECTION PHASES 77 89% 8% 34
3 MULTIPLE DIFFRACTION 60 80% 8% 37
4 TRIPLET PHASES 58 83% 7% 33
5 2 BEAM BRAGG INTENSITY 37 100% 3% 14
6 NON CENTROSYMMETRIC STRUCTURES 27 76% 4% 19
7 ENANTIOMORPHS 25 77% 4% 17
8 FINITE PERFECT CRYSTALS 18 89% 2% 8
9 UMWEGANREGUNG 11 100% 1% 6
10 RAY MULTIPLE DIFFRACTION 11 78% 2% 7

Journals

Reviews


Title Publ. year Cit. Active
references		 % act. ref.
to same field
On the influence of the diffraction geometry on three-beam interference profiles 1998 8 36 78%
Phase problem and reference-beam diffraction 2005 1 59 68%

Address terms


Rank Address term Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ.
in class
1 CCSST 2 26% 1.3% 6
2 NANOENGN BUNKYO KU 1 100% 0.4% 2
3 PROGRAMA POS CIENCIAS MAT PGCIMAT 1 100% 0.4% 2
4 THIN FILMS NANOSTRUCT GRP 1 50% 0.2% 1
5 FIS GLEB WATAGHIN IFGW 0 33% 0.2% 1
6 CORNELL HIGH ENERGY SYNCHROTRON SOURCE CHESS 0 17% 0.2% 1
7 ENGN CONTROLE AUTOMACAO 0 17% 0.2% 1
8 CIENCIA TECNOL ICT 0 14% 0.2% 1
9 MOL BIOL BIOTECH 0 14% 0.2% 1
10 FIS CCET 0 13% 0.2% 1

Related classes at same level (level 1)


Rank Relatedness score Related classes
1 0.0000152209 GERMANIUM PHOTODIODES//INTEGRAL BREADTH METHOD//PERTURBATION CRYSTALLOGRAPHY
2 0.0000130513 TOTAL EXTERNAL REFLECTION//X RAY STANDING WAVES//LAYERED SYNTHETIC MICROSTRUCTURES
3 0.0000127225 X RAY CTR//GLANCING ANGLE INCIDENCE//X RAY CRYSTAL TRUNCATION ROD
4 0.0000125389 RESONANT BRAGG DIFFRACTION//GAFEO3//MAGNETO ELECTRIC MULTIPOLES
5 0.0000102061 ELECTRON BEAM DOPING//KEK PF//BRAGG LAUE DIFFRACTION
6 0.0000094650 X RAY SURFACE DIFFRACTION//MHATT//BM25 SPLINE
7 0.0000079860 DOUBLY CURVED CRYSTALS//BRAGG SPECTROMETER//CRYSTAL ANALYSER
8 0.0000070276 KOSSEL TECHNIQUE//LATTICE SOURCE INTERFERENCES//DETERMINATION OF LATTICE PARAMETERS
9 0.0000068040 ANALYTICAL ABSORPTION CORRECTION//HIERARCHICAL MODEL DEVELOPMENT//MATH SCI CHEM ENGN
10 0.0000067914 CONVERGENT BEAM ELECTRON DIFFRACTION//PRECESSION ELECTRON DIFFRACTION//CBED