Class information for:
Level 1: ENVIRONMENTAL SCANNING ELECTRON MICROSCOPE//ENVIRONMENTAL SEM//VARIABLE PRESSURE SCANNING ELECTRON MICROSCOPE

Basic class information
ID Publications Average number
of references		 Avg. shr. active
ref. in WoS
19163 453 21.3 52%


Bar chart of Publication_year

Last years might be incomplete

Classes in level above (level 2)


ID, lev.
above		 Publications Label for level above
2051 4868 SCANNING//LAMACOP//BACKSCATTERED ELECTRONS

Terms with highest relevance score


Rank Term Type of term Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class
1 ENVIRONMENTAL SCANNING ELECTRON MICROSCOPE Author keyword 17 42% 7% 32
2 ENVIRONMENTAL SEM Author keyword 17 55% 5% 21
3 VARIABLE PRESSURE SCANNING ELECTRON MICROSCOPE Author keyword 15 82% 2% 9
4 ESEM Author keyword 15 20% 15% 68
5 POLYMERS OIDS GRP Address 14 38% 7% 30
6 ENVIRONMENTAL SCANNING ELECTRON MICROSCOPY Author keyword 13 24% 10% 46
7 CHARGE CONTRAST IMAGING Author keyword 10 73% 2% 8
8 LOW VACUUM SEM Author keyword 8 50% 3% 12
9 VARIABLE PRESSURE SCANNING ELECTRON MICROSCOPY Author keyword 7 57% 2% 8
10 PRESSURE LIMITING APERTURE Author keyword 6 100% 1% 4

Web of Science journal categories

Author Key Words


Rank Web of Science journal category Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class		 LCSH search Wikipedia search
1 ENVIRONMENTAL SCANNING ELECTRON MICROSCOPE 17 42% 7% 32 Search ENVIRONMENTAL+SCANNING+ELECTRON+MICROSCOPE Search ENVIRONMENTAL+SCANNING+ELECTRON+MICROSCOPE
2 ENVIRONMENTAL SEM 17 55% 5% 21 Search ENVIRONMENTAL+SEM Search ENVIRONMENTAL+SEM
3 VARIABLE PRESSURE SCANNING ELECTRON MICROSCOPE 15 82% 2% 9 Search VARIABLE+PRESSURE+SCANNING+ELECTRON+MICROSCOPE Search VARIABLE+PRESSURE+SCANNING+ELECTRON+MICROSCOPE
4 ESEM 15 20% 15% 68 Search ESEM Search ESEM
5 ENVIRONMENTAL SCANNING ELECTRON MICROSCOPY 13 24% 10% 46 Search ENVIRONMENTAL+SCANNING+ELECTRON+MICROSCOPY Search ENVIRONMENTAL+SCANNING+ELECTRON+MICROSCOPY
6 CHARGE CONTRAST IMAGING 10 73% 2% 8 Search CHARGE+CONTRAST+IMAGING Search CHARGE+CONTRAST+IMAGING
7 LOW VACUUM SEM 8 50% 3% 12 Search LOW+VACUUM+SEM Search LOW+VACUUM+SEM
8 VARIABLE PRESSURE SCANNING ELECTRON MICROSCOPY 7 57% 2% 8 Search VARIABLE+PRESSURE+SCANNING+ELECTRON+MICROSCOPY Search VARIABLE+PRESSURE+SCANNING+ELECTRON+MICROSCOPY
9 PRESSURE LIMITING APERTURE 6 100% 1% 4 Search PRESSURE+LIMITING+APERTURE Search PRESSURE+LIMITING+APERTURE
10 SECONDARY ELECTRON CONTRAST 6 100% 1% 4 Search SECONDARY+ELECTRON+CONTRAST Search SECONDARY+ELECTRON+CONTRAST

Key Words Plus


Rank Web of Science journal category Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class
1 ENVIRONMENTAL SEM 34 59% 8% 38
2 ESEM 33 55% 9% 41
3 BEAM TRANSFER 8 100% 1% 5
4 LOW VACUUM 8 62% 2% 8
5 IN SITU ESEM 6 100% 1% 4
6 LOW VACUUM SEM 6 100% 1% 4
7 DITHIOTHREITOL SEPARATION 3 100% 1% 3
8 WET STEM 2 27% 1% 6
9 ESEM EVALUATION 1 100% 0% 2
10 ALUMINA GLASS COMPOSITE 1 50% 0% 1

Journals

Reviews


Title Publ. year Cit. Active
references		 % act. ref.
to same field
A history of scanning electron microscopy developments: Towards "wet-STEM" imaging 2007 78 14 57%
Implications of the figure of merit in environmental SEM 2013 2 12 100%
A critical overview of ESEM applications in the biological field 2005 77 27 52%
Application of environmental scanning electron microscopy to determine biological surface structure 2009 35 43 63%
Electron scattering cross-section measurements in ESEM 2013 2 18 89%
Velocity and ejector-jet assisted differential pumping: Novel design stages for environmental SEM 2012 2 9 100%
Electron scattering cross section measurements in a variable pressure scanning electron microscope 2012 2 18 94%
Pressure and scattering regime influence on the EDS profile resolution at a composite interface in environmental SEM 2011 7 15 80%
Secondary electron contrast in low-vacuum/environmental scanning electron microscopy of dielectrics 2005 36 76 50%
Skirting effects in the variable pressure scanning electron microscope: Limitations and improvements 2013 1 20 70%

Address terms


Rank Address term Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class
1 POLYMERS OIDS GRP 14 38% 6.6% 30
2 WESTERN AUSTRALIAN MICROSCOPY 3 100% 0.7% 3
3 ECOLE MINES DOUAI 3 35% 1.5% 7
4 ANAESTHESOL SURG EMERGENCY SCI 2 67% 0.4% 2
5 GEN SURG PL BIOTECHNOL 9 1 38% 0.7% 3
6 TECNOL PROF J SABATO 1 38% 0.7% 3
7 CALCUT MODELISAT LENS 1 100% 0.4% 2
8 MICROSCOPIE MICROANAL MAT SPECT MOL 1 50% 0.4% 2
9 SCI ENGN IL 232 1 100% 0.4% 2
10 UA MAT 1 20% 1.1% 5

Related classes at same level (level 1)


Rank Relatedness score Related classes
1 0.0000156807 SCANNING//SECONDARY EMISSION NOISE//INTEGRATED CIRCUIT ADV PROC TECHNOL
2 0.0000136891 ENVIRONMENTAL TEM//ATMOSPHER SCI GLOBAL CLIMATE CHANGE//LIQUID CELL TEM
3 0.0000106957 GENIE PROCEDES ALIMENTAI BIOTECHNOL//GENIE PROC ALIMENTAI BIOTECHNOL//RUBBER SPHERE
4 0.0000106711 LAMACOP//SECONDARY ELECTRON EMISSION//ALUMINA INSULATOR
5 0.0000097900 CHITON//CHITON RADULA//EASY MAGNETIZATION DIRECTION
6 0.0000078177 DAGUERREOTYPES//DISCIPLINE DESCRIPT GEOMETRY ENGN GR H//AET
7 0.0000070075 MEAN PENETRATION DEPTH//CONTINUOUS SLOWING DOWN APPROXIMATION//DOPANT CONTRAST
8 0.0000067913 LOW TEMPERATURE SEM//CYTOPLASMIC MATRIX//DOUBLE LAYER COATING
9 0.0000057261 BETA TIN STRUCTURE//CATHODOLUMINESENCE//ELECTRICAL HARDNESS
10 0.0000056318 ELECTRON BEAM INDUCED DEPOSITION//FOCUSED ELECTRON BEAM INDUCED DEPOSITION//FOCUSED ION BEAM CHEMICAL VAPOR DEPOSITION FIB CVD