Class information for: |
Basic class information |
ID | Publications | Average number of references |
Avg. shr. active ref. in WoS |
---|---|---|---|
19100 | 455 | 25.6 | 78% |
Classes in level above (level 2) |
ID, lev. above |
Publications | Label for level above |
---|---|---|
115 | 23797 | PHYSICAL REVIEW A//BOSE EINSTEIN CONDENSATION//BOSE EINSTEIN CONDENSATES |
Terms with highest relevance score |
Rank | Term | Type of term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|---|
1 | ATOM LITHOGRAPHY | Author keyword | 25 | 60% | 6% | 28 |
2 | 2D ATOM LOCALIZATION | Author keyword | 15 | 88% | 2% | 7 |
3 | ATOM LOCALIZATION | Author keyword | 7 | 64% | 2% | 7 |
4 | LASER FOCUSED ATOMIC DEPOSITION | Author keyword | 6 | 71% | 1% | 5 |
5 | TWO STEP PHOTOIONIZATION | Author keyword | 4 | 67% | 1% | 4 |
6 | ATOM DEFLECTION | Author keyword | 4 | 75% | 1% | 3 |
7 | ATOM LASER PHYS GRP | Address | 4 | 75% | 1% | 3 |
8 | LASER STANDING WAVE FIELD | Author keyword | 4 | 75% | 1% | 3 |
9 | PROBE ABSORPTION | Author keyword | 3 | 43% | 1% | 6 |
10 | ATOMIC NANOFABRICATION | Author keyword | 3 | 100% | 1% | 3 |
Web of Science journal categories |
Author Key Words |
Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
LCSH search | Wikipedia search |
---|---|---|---|---|---|---|---|
1 | ATOM LITHOGRAPHY | 25 | 60% | 6% | 28 | Search ATOM+LITHOGRAPHY | Search ATOM+LITHOGRAPHY |
2 | 2D ATOM LOCALIZATION | 15 | 88% | 2% | 7 | Search 2D+ATOM+LOCALIZATION | Search 2D+ATOM+LOCALIZATION |
3 | ATOM LOCALIZATION | 7 | 64% | 2% | 7 | Search ATOM+LOCALIZATION | Search ATOM+LOCALIZATION |
4 | LASER FOCUSED ATOMIC DEPOSITION | 6 | 71% | 1% | 5 | Search LASER+FOCUSED+ATOMIC+DEPOSITION | Search LASER+FOCUSED+ATOMIC+DEPOSITION |
5 | TWO STEP PHOTOIONIZATION | 4 | 67% | 1% | 4 | Search TWO+STEP+PHOTOIONIZATION | Search TWO+STEP+PHOTOIONIZATION |
6 | ATOM DEFLECTION | 4 | 75% | 1% | 3 | Search ATOM+DEFLECTION | Search ATOM+DEFLECTION |
7 | LASER STANDING WAVE FIELD | 4 | 75% | 1% | 3 | Search LASER+STANDING+WAVE+FIELD | Search LASER+STANDING+WAVE+FIELD |
8 | PROBE ABSORPTION | 3 | 43% | 1% | 6 | Search PROBE+ABSORPTION | Search PROBE+ABSORPTION |
9 | ATOMIC NANOFABRICATION | 3 | 100% | 1% | 3 | Search ATOMIC+NANOFABRICATION | Search ATOMIC+NANOFABRICATION |
10 | LASER STANDING WAVE | 2 | 44% | 1% | 4 | Search LASER+STANDING+WAVE | Search LASER+STANDING+WAVE |
Key Words Plus |
Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | AUTLER TOWNES MICROSCOPY | 138 | 96% | 10% | 44 |
2 | POSITION MEASUREMENT | 54 | 64% | 12% | 54 |
3 | CONTROLLED SPONTANEOUS EMISSION | 42 | 94% | 3% | 15 |
4 | TRIPOD SYSTEM | 35 | 89% | 4% | 16 |
5 | MOVING ATOMS | 33 | 83% | 4% | 19 |
6 | DOUBLE DARK RESONANCES | 21 | 90% | 2% | 9 |
7 | LIGHT FORCES | 19 | 74% | 3% | 14 |
8 | OPTICAL FIELDS | 15 | 30% | 9% | 43 |
9 | FOCUSED ATOMIC DEPOSITION | 15 | 71% | 3% | 12 |
10 | PRECISION POSITION MEASUREMENT | 13 | 80% | 2% | 8 |
Journals |
Reviews |
Title | Publ. year | Cit. | Active references | % act. ref. to same field |
---|---|---|---|---|
One-, two- and three-dimensional nanostructures with atom lithography | 2003 | 49 | 34 | 79% |
Atomic nanofabrication: atomic deposition and lithography by laser and magnetic forces | 2003 | 68 | 95 | 53% |
Resource Letter AON-1: Atom optics, a tool for nanofabrication | 2007 | 6 | 230 | 71% |
Subwavelength Atom Localization | 2013 | 0 | 112 | 60% |
Atom holography | 2000 | 5 | 22 | 45% |
PRECISION POSITION MEASUREMENT OF MOVING ATOMS | 1995 | 69 | 60 | 28% |
MEASURING THE POSITION OF MOVING ATOMS WITH UNCERTAINTY-PRINCIPLE-LIMITED PRECISION | 1994 | 4 | 19 | 47% |
Application of nanotechnology in cancers prevention, early detection and treatment | 2014 | 0 | 57 | 2% |
Address terms |
Rank | Address term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | ATOM LASER PHYS GRP | 4 | 75% | 0.7% | 3 |
2 | OPT ZENTRUM | 2 | 67% | 0.4% | 2 |
3 | ELE ON PHYS GRP | 2 | 17% | 1.8% | 8 |
4 | MEASUREMENT TESTING EAST CHINA | 1 | 30% | 0.7% | 3 |
5 | LASER ATOM PHYS | 1 | 21% | 0.7% | 3 |
6 | FIS SEZ MESSINA | 1 | 50% | 0.2% | 1 |
7 | IRSAMCLCAR | 1 | 50% | 0.2% | 1 |
8 | SHANGHAI MEASUREMENT TESTING TECHNOL | 1 | 20% | 0.7% | 3 |
9 | OPT ZENTRUM KONSTANZ | 0 | 12% | 0.4% | 2 |
10 | METROL LENGTH PRECIS ENGN | 0 | 17% | 0.2% | 1 |
Related classes at same level (level 1) |
Rank | Relatedness score | Related classes |
---|---|---|
1 | 0.0000264984 | ATOM INTERFEROMETER//ATOM INTERFEROMETRY//VCQ |
2 | 0.0000261236 | MAGNETO OPTICAL TRAP//OPTICAL MOLASSES//ZEEMAN SLOWER |
3 | 0.0000163591 | ATOM CHIP//ATOM CHIPS//ATOM GUIDING |
4 | 0.0000086791 | ELECTROMAGNETICALLY INDUCED TRANSPARENCY//SPONTANEOUSLY GENERATED COHERENCE//SHAANXI INFORMAT PHOTON TECH |
5 | 0.0000064893 | NONLINEAR OPTIC CRYSTAL//ENHANCEMENT CAVITY//EXTERNAL ENHANCEMENT CAVITY |
6 | 0.0000058526 | INFORMAT OPTIC TECHNOL//LOW ENERGY SINGLE CRYSTAL SURFACES//MATH THEORET SCI |
7 | 0.0000058227 | NONLINEAR DYNAM SYST//NONLINEAR DYNAM SCI//COMMUTING OBSERVABLES |
8 | 0.0000046011 | OPTICAL NEAR FIELD//PHOTON NETWORK//OHTSU LOCALIZED PHOTON PROJECT |
9 | 0.0000044674 | PENNING IONIZATION ELECTRON SPECTROSCOPY//PARTIAL IONIZATION CROSS SECTION//ROVIBRATIONAL DISTRIBUTION |
10 | 0.0000040412 | SATURATED ABSORPTION SPECTROSCOPY//UMR 7538//DF CCEN |