Class information for: |
Basic class information |
ID | Publications | Average number of references |
Avg. shr. active ref. in WoS |
---|---|---|---|
19073 | 457 | 18.3 | 45% |
Classes in level above (level 2) |
ID, lev. above |
Publications | Label for level above |
---|---|---|
1980 | 5095 | CIRCULAR BRAGG PHENOMENON//GLANCING ANGLE DEPOSITION//ANTIREFLECTION |
Terms with highest relevance score |
Rank | Term | Type of term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|---|
1 | END HALL ION GUN | Author keyword | 3 | 100% | 1% | 3 |
2 | MWIR REGION | Author keyword | 3 | 100% | 1% | 3 |
3 | LENS ENGN DEV | Address | 2 | 50% | 1% | 3 |
4 | CHOPPED | Author keyword | 1 | 50% | 0% | 2 |
5 | DUAL CHANNEL THERMAL IMAGER | Author keyword | 1 | 100% | 0% | 2 |
6 | ECR ION BEAM PROCESSING | Author keyword | 1 | 100% | 0% | 2 |
7 | ERF3 FILMS | Author keyword | 1 | 100% | 0% | 2 |
8 | ION BEAM SPUTTERING METHOD | Author keyword | 1 | 50% | 0% | 2 |
9 | LORENTZ OSCILLATOR MODEL | Author keyword | 1 | 50% | 0% | 2 |
10 | MULTISPECTRAL ASSEMBLY | Author keyword | 1 | 100% | 0% | 2 |
Web of Science journal categories |
Author Key Words |
Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
LCSH search | Wikipedia search |
---|---|---|---|---|---|---|---|
1 | END HALL ION GUN | 3 | 100% | 1% | 3 | Search END+HALL+ION+GUN | Search END+HALL+ION+GUN |
2 | MWIR REGION | 3 | 100% | 1% | 3 | Search MWIR+REGION | Search MWIR+REGION |
3 | CHOPPED | 1 | 50% | 0% | 2 | Search CHOPPED | Search CHOPPED |
4 | DUAL CHANNEL THERMAL IMAGER | 1 | 100% | 0% | 2 | Search DUAL+CHANNEL+THERMAL+IMAGER | Search DUAL+CHANNEL+THERMAL+IMAGER |
5 | ECR ION BEAM PROCESSING | 1 | 100% | 0% | 2 | Search ECR+ION+BEAM+PROCESSING | Search ECR+ION+BEAM+PROCESSING |
6 | ERF3 FILMS | 1 | 100% | 0% | 2 | Search ERF3+FILMS | Search ERF3+FILMS |
7 | ION BEAM SPUTTERING METHOD | 1 | 50% | 0% | 2 | Search ION+BEAM+SPUTTERING+METHOD | Search ION+BEAM+SPUTTERING+METHOD |
8 | LORENTZ OSCILLATOR MODEL | 1 | 50% | 0% | 2 | Search LORENTZ+OSCILLATOR+MODEL | Search LORENTZ+OSCILLATOR+MODEL |
9 | MULTISPECTRAL ASSEMBLY | 1 | 100% | 0% | 2 | Search MULTISPECTRAL+ASSEMBLY | Search MULTISPECTRAL+ASSEMBLY |
10 | NON CHOPPED | 1 | 100% | 0% | 2 | Search NON+CHOPPED | Search NON+CHOPPED |
Key Words Plus |
Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | MGF2 | 7 | 17% | 8% | 38 |
2 | ALD PROCESS | 3 | 50% | 1% | 5 |
3 | FLUORIDE FILMS | 2 | 17% | 2% | 8 |
4 | OPTICAL FILMS | 2 | 26% | 1% | 5 |
5 | ALF3 THIN FILMS | 1 | 50% | 0% | 2 |
6 | FLUORIDE ANTIREFLECTION COATINGS | 1 | 100% | 0% | 2 |
7 | MGF2 THIN FILMS | 1 | 40% | 0% | 2 |
8 | LASER INTERACTION | 1 | 27% | 1% | 3 |
9 | DIELECTRIC COATINGS | 1 | 17% | 1% | 4 |
10 | ELECTROSTATIC EINZEL LENSES | 1 | 50% | 0% | 1 |
Journals |
Reviews |
Title | Publ. year | Cit. | Active references |
% act. ref. to same field |
---|---|---|---|---|
Fluorides of some s-, p-, d-, and f-metals as prospective materials for interference optics: Present status and development | 2010 | 2 | 7 | 57% |
A REVIEW OF ION-BEAM-ASSISTED DEPOSITION OF OPTICAL THIN-FILMS | 1995 | 34 | 47 | 28% |
BIBLIOGRAPHY ON CLEAN GLASS - SUPPLEMENT-1 | 1986 | 2 | 5 | 60% |
PHYSICAL AND CHEMICAL ASPECTS IN THE APPLICATION OF THIN-FILMS ON OPTICAL-ELEMENTS | 1984 | 44 | 68 | 40% |
PHYSICAL AND CHEMICAL ASPECTS IN THE APPLICATION OF THIN-FILMS ON OPTICAL-ELEMENTS | 1983 | 3 | 39 | 36% |
THIN-FILM OPTICAL COATINGS | 1983 | 0 | 23 | 35% |
Address terms |
Rank | Address term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | LENS ENGN DEV | 2 | 50% | 0.7% | 3 |
2 | VACUUM TECH THIN FILM | 1 | 20% | 0.9% | 4 |
3 | CEA G DOPT | 1 | 50% | 0.2% | 1 |
4 | CNRS 6079 | 1 | 50% | 0.2% | 1 |
5 | ELE OOPT SYST LEOS | 1 | 50% | 0.2% | 1 |
6 | FFL | 1 | 50% | 0.2% | 1 |
7 | OPT FILMS MAT | 1 | 50% | 0.2% | 1 |
8 | VACCUM TECH THIN FILM | 1 | 50% | 0.2% | 1 |
9 | OPT COATINGS MAT | 0 | 33% | 0.2% | 1 |
10 | URA CNRS 781 | 0 | 33% | 0.2% | 1 |
Related classes at same level (level 1) |
Rank | Relatedness score | Related classes |
---|---|---|
1 | 0.0000238699 | ADV COATINGS EXPT//REACTIVE ION ASSISTED COEVAPORATION//TETRAGONAL AND MONOCLINIC PHASES |
2 | 0.0000206224 | RD OPT THIN FILM COATINGS//TIO2 SIO2 HIGH REFLECTORS//LASER INDUCED DAMAGE |
3 | 0.0000205182 | VISIBLE SPECTRAL REGION//INFRARED MULTILAYER//MECHATRON DEVICES 1 |
4 | 0.0000144224 | PEROVSKITE RELATED OXIDE//LAF3//NONSTOICHIOMETRIC FLUORIDE |
5 | 0.0000140180 | AL PT//AMORPHOUS AL2PT//SELF ORGANISED STRUCTURE FORMATION |
6 | 0.0000132068 | ISOTROPY DEGREE//BULK INHOMOGENEITY//DEV OPT IL |
7 | 0.0000097656 | ABSORBING SUBSTRATE//SINGLE LAYER COATING//ELLIPSOMETRY PLICAT S |
8 | 0.0000087640 | AMERG//PHYS PROCEDES VIDE//INTRINSIC STRESS |
9 | 0.0000072134 | ALUMINUM DOPED ZINC OXIDE ZNOAL//ABELES EQUATIONS//OPTICAL CONDUCTIVITY MEASUREMENT |
10 | 0.0000069422 | LOMO//OFF AXIS ASPHERICAL MIRROR//HYDROGEN PROFILING |